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Silicon
atomic number 14 tetravalent metalloid chemical element.
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Silicon Resistivity, PN type & Alarm Tester
HS-PSRT
It use Four Probe to test the resistivity and P/N type of wafers、ingots and all type of silicon materials.It can be used by Solar and Semiconductor industry.
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BSE Detection
SLIM
SLIM™ is an innovative design for under-the-column BSE detection.SLIM™ puts El-Mul’s ScintiFast™ together with a segmented, shaped light guide and Silicon Photomultipliers (SiPM) to create a fast, sensitive, segmented and compact BSE detector for e-beam tools.
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NanoModeScan M² Measuring System
This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
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Step Recovery Diodes
SemiGen’s SSR series of Step Recovery Diodes are epitaxial silicon varactors which provide high output power and efficiencies in harmonic generator applications. Using custom epitaxial wafers, our process ensures high reproducibility. The silicon dioxide passivation process assures greater stability and low leakage currents over temperature. Uniform capacitance ensures repeatability from device to device. These diodes are available in chip or packaged form.
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Pressure Sensors
ESCP-MIS1 Sensor
ES Systems has developed a series of medium isolated pressure sensors suitable for applications with harsh environmental conditions where resistance to corrosive fluids or gases is required. Each sensor integrates a MEMS capacitive pressure sensor die, and a CMOS ASIC for the signal conditioning. The MEMS pressure sensor dies are underpinned by ES’s innovative microfabrication process for silicon capacitive sensors.
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Buffers
Silicon Labs' clock buffers provide ultra-low additive jitter, low skew clock distribution. In addition to differential and LVCMOS buffers, Silicon Labs offers universal clock buffers that support any-in/out signal format and integrate clock muxing and division to further simplify clock tree design.
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MICROWAVE VARIABLE-CAPACITANCE DIODES FROM 1 to 40 GHz
Insight Product Company offers Microwave Variable-Capacitance Diodes with capacity coverage ratio over 10 times and operating in frequency range from 1 to 40 GHz. The p+ -n1 - n2 -n+ silicon variable-capacitance diodes are designed to electrically tune frequences and phases of microwave oscillators - parts of hybrid microcircuits that provide capsulation and protection against ambient action.
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Citadel CTD-ES
Teledyne Marine RD Instruments
The CITADEL CTD-ES incorporates proven inductively coupled conductivity sensor technology with a platinum resistance thermometer and micromachined silicon pressure sensor to provide highly accurate and stable readings.
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40 Gigabit Ethernet AdvancedTCA® Fabric Interface Switch Blade
aTCA-3710
The aTCA-3710 is a high performance, high bandwidth, 40G Fabric switch blade for AdvancedTCA® platforms. This product is ideal for bandwidth intensive telecom applications such as wireless access controller, DPI/security network, IPTV, IP multimedia subsystem, RNC/BSC, broadband access/bearer network, data center, and LTE/4G network applications. The aTCA-3710 provides 40GbE hub-to-node connectivity and integrated switch silicon that supports load balancing, priority queues, packet classification, and flow control to enable strict bandwidth management for implemented applications.
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Microscopic Four-Point Probes
M4PP
CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
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Switches-SP5T
Macom Technology Solutions Holdings Inc.
At MACOM we offer an extensive collection of switches covering multiple commercial and aerospace and defense markets. Our product portfolio has a broad frequency spectrum from DC to 70 GHz. Our silicon Heterolithic Microwave Integrated Circuit (HMIC) PIN diode process is ideal for high power and broadband switches operating from 50 MHz to 26 GHz. Our AlGaAs PIN diode process can extend the upper frequency range of our switch die beyond 70 GHz and is ideal for instrumentation and radar applications. Our GaAs pHEMT and MESFET technology is ideal for fast switching and low control voltage switches optimized for both narrow band and broadband applications. Our 75 Ohm absorptive switches are designed specifically for demanding CATV, FTTx and DBS Infrastructure and CPE applications.
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AC Hysteresis Graph Test System
DX-2012SA
Under continuous frequency of 1 kHz to 500 kHz, automatic measurement of magnetic hysteresis loop of the soft magnetic materials such as silicon steel, precision alloy, non-crystal and ferrite, accurate measurement on the dynamic magnetic characteristic parameters such as amplitude permeability µa, loss angle d, loss iron Pc, remanence Br and coercivity Hc.
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High Collector To Emitter Voltage
High collector-to-emitter voltage photocouplers (optocouplers) are optically coupled isolators containing a GaAs infrared light emitting diode and an NPN silicon Darlington connected phototransistor. The isolation voltage during input and output and the voltage between the collector and the emitter of the transistor are both high.
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Detectors & Sensors
Excelitas offers Photonic Detection Solutions ranging from Silicon and InGaAS PINs and Avalanche Photodiodes, Hybrid Receivers, and Photon Counting Modules to address high-performance, high-volume applications across a wide range of markets. Excelitas Thermal IR Sensors represent a broad range of Pyroelectric Detectors, Thermopile Detectors and IR Sensor Modules used for motion detection, presence monitoring, temperature measurement and gas detection.
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Solar Radiation Sensors
Ingenieurbüro Mencke & Tegtmeyer Gm
The silicon solar radiation sensor (Si) sensor provides an inexpensive but yet robust and reliable solution for measuring the solar irradiance specifically for the monitoring of photovoltaic (PV) systems. Due to the structure of the sensor element, which corresponds to a PV module, these sensors are ideally suited as a reference for the monitoring of PV systems to determine the solar radiation.
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Digital Solutions
Digital ST120 Dual Thermopile (Preliminary)
A two channel silicon- based thermopile in a TO-5 package that includes integrated electronics which incorporate an industry standard digital SMBus interface. Each small active area size is 1.2mm x 1.2mm.
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Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228B
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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PCI Bus Analyzer / Exerciser
PCI650
Silicon Control introduces an economical analyzer and exerciser for PCI systems. This 3rd generation PCI analyzer combines high performance hardware with a sophisticated and intuitive software interface. The result is a powerful diagnostic tool for bus analysis all on a single plug-in card.
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Flying Probe Test Programming & Testing Services
Zero Defects International LLC
ZDI utilizes a Seica flying probe tester in order to provide test program development and testing services to customers in Silicon Valley and throughout North America. This is a very cost-effective solution for printed circuit assembly manufacturers who do not have in-house equipment of their own but have customers who require test services.
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Conductivity Type (P/N) Checker By Contact Thermo-electromotive Force Method (seebek Effect)
PN-12α
*Thermo electrode and cold electrode is mounted detecting part of measuring probes*Possible to check most figure of sample such as single crystalline silicon wafer, bulk, ingot and so on*Please select from 2 types;1) 2 probe ver.(Hot probe, Cold probe),2) 1 probe ver.(Hot & Cold probe)
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Pyrgeometer Low Temperature dependence of sensitivity
CGR 4
CGR 4 pyrgeometer is an instrument for the highest quality scientific measurements. The specially designed meniscus dome provides a 180 field of view with negligible directional response error. A hard-carbon coating on the outside of the dome smoothes the spectral response and provides extra protection to the silicon surface.
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Barometric Pressure Transmitter
Comptus Barometric pressure sensors utilize an integrated silicon, absolute pressure sensor with internal temperature compensation. The sensor is mounted to the signal conditioner board. A 3/16 inch diameter tube may be attached to the sensor to provide remote pressure sensing. The output of the sensor is scaled to provide the desired output signal.
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Electron Microscope Analyzer
QUANTAX FlatQUAD
QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Emulation Adapters
With some of the more advanced 32-bit microcontrollers and SoCs, the full program and data trace capabilities of the device are not made available on production silicon. Instead, semiconductor vendors provide special 'emulation devices'. These typically feature more pins than the production device, thereby providing the interface to the trace interface.
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Camera Interface Boards and Adapters
Active Silicon offers camera interface boards for autofocus-zoom block cameras and adapters for host-end acquisition and video format conversion. The camera interface converter boards for Tamron AF-zoom cameras, Sony FCB block cameras, Harrier AF-zoom cameras and others, take data from the proprietary block camera interface and convert into industry standard formats such as 3G-SDI / HD-SDI, USB 3.0, HDMI and IP.
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Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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AC Hysteresis Graph Test System
DX-2012M
Automatic measurement of the dynamic magnetic hysteresis loop of oriented and non-oriented silicon steel under the condition of 50 Hz, 60 Hz, 400 Hz and 1 kHz, accurate measurement of the static magnetic characteristic parameters such as amplitude permeability μa, loss angle δ, specific total loss Ps, remanence Br and coercivity Hc. With special testing fixture, it can directly measure the iron core and stator core of the transformer.
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Avalanche Photodiodes
Excelitas offers Avalanche Photodiodes (APDs) on both Silicon (Si) and InGaAs materials. Si APDs cover the spectral range of 400 nm to 1100 nm and the InGaAs APDs cover 950 nm to 1550 nm. An Avalanche Photodiode (APD) provides higher sensitivity than a standard photodiode and is for extreme low-level light (LLL) detection and photon counting.
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Surface & Volume Low Resistivity Meter for Conductive Materials
Loresta GP
The Loresta GX Meter is an intelligent, multi purpose low resistivity meter equipped with software that calculates resistivity correction factors. A variety of 4 pin probes are available for use with the Loresta GX. The instrument is typically used in Product Engineering, R&D, and Quality Control. Applications include measurement of conductive paint, conductive plastics, conductive rubber, conductive film, silicon wafers, antistatic materials, EMI shield materials, conductive fiber, conductive ceramics, etc.
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FAST SDD and C2 Window
EDS (SEM) Applications
Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
