Impact Test
forceful strike to UUT determining strength and durability or detection of loose particles.
See Also: Drop Testers, Pendulum Impact, Impact Hammers, Crush, Hardness Testers, Rupture
-
Product
Hammer Impact Testing
-
EDM Modal Hammer Impact Testing provides the necessary features for a single-operator experimental modal test. The Hammer Impact GUI features an intuitive step-by-step process, allowing a user to easily go through the setup and then the testing.
-
Product
IEC60068-2-75 Spring Hammer Test
CX-T03
-
Shenzhen Chuangxin Instruments Co., Ltd.
*Impact hammers are used to check the durability of enclosures for electrical appliances of other electronic products.If damage occurs from the Impact Hammer test .Accessibility probes can be used to measure the extent or severity of the damage.The Impact Hammer simulates the mechanical impact to which electrical equipment may be subjected. *This hammer is mainly used to test household and similar electrical appliances shell, lever, handle, knobs, lights and other shell to withstand mechanical shocks.* The impact tester made of stainless steel or alloy.
-
Product
Air Jet Erosion Tester
AJ-1000
-
The Rtec Instruments Air Jet Erosion Tester (AJ-1000) is a state-of-the-art solution for accurate air jet erosion testing of materials and coatings. Designed to perform repeated impact tests, the AJ-1000 directs a high-velocity jet of gas carrying abrasive particles onto the sample surface to precisely measure erosion rates. This advanced tester offers closed-loop temperature control up to 1000°C, enabling erosion studies under extreme environmental conditions. With the ability to vary abrasive particle type, shape, size, temperature, and impact velocity, the AJ-1000 provides a reliable way to rank and compare the erosion resistance of diverse materials and protective coatings.
-
Product
Impact Testing Machines
-
Infinity Machine International Inc.
Impact Testing Machines by Infinity Machine International Inc. - for applications such as laminated glass impact testing, plastic drop ball impact testing machine, tempered glass pendulum impact testing machine, testing machine for safety glass, slope inclined impact test apparatus for package carton, and more.
-
Product
NI-9236, 10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module
785996-01
Strain/Bridge Input Module
10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The NI‑9236 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The NI‑9236 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 V rms transient isolation, providing high‑common‑mode noise rejection and increased safety.
-
Product
High-Speed Impact Testing Machines
HITS-X Series
-
With the increasing demand for safety and reliability, evaluation of the dynamic strength (impact properties) of materials and parts is becoming more and more important. This machine can obtain data, such as the maximum test force, energy, and displacement, up to a maximum velocity of 72 km/h (20 m/s). A tensile load type (HITS-TX) and a punching type (HITS-PX) are available.
-
Product
Impact Test Apparatus
-
SCR Elektroniks make Impact Test Apparatus is used to test the Electrical Accessories / appliances for their mechanical strength.
-
Product
Impact Testing
-
When you need to evaluate how your product & materials react to shock loading, Trialon is here to help. By utilizing our laser-aiming test stand to create consistent positioning and ball impact, you can trust that Trialon has the equipment and personnel to conduct your test accurately and timely.
-
Product
High-Speed Digital Image Correlation System
Q-450
-
The 3D High-Speed Image Correlation System Q-450 allows the full-field, non-contact and three-dimensional dynamic measurement of shape, displacements and strains on components and structures made from almost any material. Based on the digital image correlation technique, the Q-450 system is designed for full-field vibration analysis and high speed transient events. This makes it ideal for ballistics testing, fracture mechanics, shock excitations, the Hopkinson Bar test, or Impact Testing.
-
Product
Impact Testing Machine
-
Instron Dynatup drop weigh impact testing machine next generation is the Instron 9400 Series. A drop weight impact testing machine is used to determine the energy required to break or damage a material in which a defined weight falls onto a specimen or a component from a specific height and with a specific impact energy and velocity.
-
Product
Electric Servomotor Threaded Impact Tester
-
This equipment is a new type of impact test equipment that uses the uniquely developed servomotor with ultra-low inertia and high torque that is used in our vibration.
-
Product
Bump Test Machine
-
Labtone Test Equipment Co., LTD
Bump test systems for electrical products repeating impact testing during transportation
-
Product
Upgrades and Parts
-
The Lorlin Test Systems Impact Testing Software Upgrade Version 7+® operates under Windows 7/8/10® 64-BIT with a USB 2.0 tester interface is available for Impact and Dataspec Testers.
-
Product
Test Workflow Standard
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
-
Product
Testing Service
CloudTesting™ Service
test
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
-
Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
-
Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
-
Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
-
Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
-
Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
-
Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
Test Fixture Kits
Test Fixture
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
-
Product
Bottom Electrode SMD Test Fixture
16197A
Test Fixture
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
-
Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
-
Product
Mixed Signal, Multi-Functional Test Module
PXIe-ScanIO-112
Test Module
The PXIe-ScanIO-112 delivers a powerful combination of digital, analog, and AC-coupled testing in a single PXIe module. With 104 boundary-scan controllable digital I/O channels and 8 analog I/O channels ranging from –15V to +15V, engineers gain the flexibility to test a wide variety of board-level designs. The module supports IEEE-1149.6 AC-coupled interconnect testing, configurable single-ended and differential pin operation, and integrates seamlessly with the Corelis ScanExpress™ suite.
-
Product
Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
-
Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
-
Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
-
Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
-
Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
