MIxed Signal Test Systems
See Also: Mixed Signal, Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed-Signal Test, Mixed Signal Testers
-
Product
UXG X-Series Agile Signal Generator, 10 MHz to 40 GHz
N5193A
Signal Generator
Get closer to reality: simulate increasingly complex signal environments for radar, EW & antenna-test Test sooner & increase confidence in EW systems by generating signal simulations when you need them: the UXG is a scalable threat simulator Use pulse descriptor words (PDWs) to generate long pulse trains & individually control pulse characteristics Accurately simulate multi-threat environments: 180-ns PDW update rate, chirps 10 to 25% of carrier frequency, pulses as narrow as 10 ns
-
Product
Signal, Patchcord, ITA, 72", TriPaddle, 22 AWG White, Single Ended ( 5 Amps)
7-103922000-072
Signal Patchcord
Signal, Patchcord, ITA, 72", TriPaddle, 22 AWG White, Single Ended ( 5 Amps)
-
Product
NI-5742, 16-Bit, 1 MS/s, 32-Channel Signal Generator Adapter Module for FlexRIO
782865-01
Signal Generator
The NI‑5742 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs and general-purpose digital input and output lines for system stimulus and control. The NI‑5742 is ideal for applications requiring high-channel density and the power of a user-programmable FPGA. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the NI‑5742, you must pair it with a compatible PXI FPGA Module for FlexRIO.
-
Product
High-Speed Signal Recording Systems
System
GaGe has a long history of providing high-speed, real-time signal acquisition, processing, and recording systems on PC-based platforms. This expertise saves customers time and eliminates uncertainties and risks with self-integrated systems.
-
Product
NI's Electrical Functional Test Solution
Functional Test
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
-
Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
-
Product
Test Systems
-
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
-
Product
PXI Breadboard Module, 1-Slot, No Connector
40-220A-101
Signal Module
The 40-220A series of breadboard modules allow the user to construct their own circuit in situations where a suitable PXI module is not available. For example when it is required to integrate a non-switching function into a PXI chassis. Typical applications include: Creating custom circuitry that can be housed in on a 3U board, or to build special one-off switching modules.
-
Product
Mezzanine System
5174
System
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
-
Product
Stator Test Systems
-
Automation Technology's STS-3800 has become the "gold standard" in Stator Testing Equipment. The STS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems, it is backed by the industry leading two-year limited warranty. The STS-3800 offers the most comprehensive testing of stators and fields available.
-
Product
AirTech Test Systems
-
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Hillger NDT has developed AirTech testing technology for the requirements of air-coupled testing. Our USPC 4000 AirTech ultrasonic testing system and our robust AirTech sensors consisting of optimized transmit and receive probes deliver optimal results under demanding conditions.
-
Product
Signal, Patchcord, Receiver, 72", QuadraPaddle, 24 AWG Twisted Pair, Single Ended (5 Amps)
7-124424000-072
Signal Patchcord
Signal, Patchcord, Receiver, 72", QuadraPaddle, 24 AWG Twisted Pair, Single Ended (5 Amps)
-
Product
PXIe-5663E, 6.6 GHz PXI Vector Signal Analyzer
781339-03
Signal Module
6.6 GHz PXI Vector Signal Analyzer - The PXIe‑5663E offers wide instantaneous bandwidth and supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. You can use a PXIe‑5663E as either a spectrum analyzer or vector signal analyzer, and you can use it with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5663E can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5663E provides a low-cost solution to high-performance RF measurements.The PXIe-5663E comprises the following modules:• PXIe-5601 RF Signal Downconverter• PXIe-5622 IF Digitizer• PXIe-5652 RF Analog Signal GeneratorThere is no physical device named "PXIe-5663E".
-
Product
Vector Signal Generator
SMM100A
Vector Signal Generator
The R&S®SMM100A vector signal generator provides remarkably good RF characteristics across the entire frequency range from 100 kHz to 44 GHz. The instrument covers the bands below 6 GHz used by existing wirelessstandards as well as the newly defined bands for 5G NR FR1 and Wi-Fi 6E up to 7.125 GHz and the 5G NR FR2 bands up to 44 GHz.The internal baseband generator in the R&S®SMM100A supports a maximum RF modulation bandwidth of 1 GHz. Digitally modulated broadband signals can thus be generated as required by the prevalent wireless standards. The R&S®SMM100A is well prepared for future bandwidth requirements.
-
Product
Drop Test System
-
HIACC Engineering & Services Pvt. Ltd.
HIACC's Drop Test System is a specialized, automated testing apparatus designed to simulate real-world handling and transportation hazards, determining the "drop bearing capacity" (durability) of products and their packaging.
-
Product
EMC Test Systems
-
The sum of EMC is not necessarily equal to its parts; any modular electronic device from a complete aircraft down to a mobile phone needs to meet EMC requirements for the device itself, even if all the individual modules are compliant. For the enormous range of types of modular device requiring EMC test, R&S offers extremely flexible and scalable EMC test systems; practically as modular as the devices under test.
-
Product
C-Mic Testing System
BK3010
-
The BaKo BK3010 is our main C-Mic tester. It's small enough to carry under your arm and with a test time of under 0.5 seconds, it tests as fast as you can connect a microphone. Setting up the specifications is so easy and intuitive, we based the BK3012 D-Mic Tester on it. It is also the model for our BK9010B Fully Automatic C-mic Tester.
-
Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Test Instrument
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
-
Product
Magnetic-Field Test System
MTS-800
-
The MTS-800 is a compact test system for broadband generation and measurement of magnetic fields. Its internal components allow automatic EMC tests according to automotivestandards where high field strength need to be generatedor measured.
-
Product
Electroluminescence Test Systems
-
The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
-
Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
-
Product
40GHz Single Channel MW Signal Generator 19" 1U Rack
LSX4091R
Signal Generator
The LSX4091R is a 40GHz Single Channel Microwave Signal Generator, offers industry leading performance, in a 1U, 19” rack-mounted box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
-
Product
VME Data Acquistion System
ADM-31
System
The VME-based ADM31 data acquistion system supports up to 48 differential or up to 96 single-ended analog inputs. The ADM31 control card is an intelligent A/D subsystem master or slave device that controls the analog A/D cards. Up to two A/D cards can be configured with the control card to complete the A/D system.
-
Product
microLED Testing System
OmniPix-ML1000
-
The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
-
Product
VFTLP+ Test System
4012
-
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
-
Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
-
Product
Stress Testing System
Load Dynamix
-
LoadDynamix (former Swifttest) is famous for its IP based converged storage system stress testing, including iSCSI, SMB/CIFS, NFS, FC and HTTP/HTTPS based storage systems. Its GUI interface is very easy to use and allow customer engineer to fully configure all the parameters at the protcol layer. Nearlly all the major IP storage system manufacturers have LoadDynamix products in their test lab.
-
Product
Dynamic Test System
3430-SW
-
The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
-
Product
Test Adapters / Aeroflex Test System
52xx / 5300
-
We develop and manufacture test adapters for your existing interface including documentation and test program
-
Product
Test Automation System
RT-Tester
-
Verified Systems International GMBH
Designed to perform automated hardware-in-the-loop tests and software component test on process or thread level for embedded real-time systems. The functional components of RT-Tester can be structured as shown in the figure to the left. Please click on the small image to enlarge the picture. The System Under Test (SUT) denotes the object to be tested.
