Test Prods
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Test Prods
Test prod with 4mm plug, test prod with 2mm pin, safety test prod, test prod 2mm, test prod 4mm, miniature test prod.
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High Voltage Breakdown Tester
Model HV-55
Laxtronics Instruments & Controls Pvt. Ltd
5 Kilo Volt AC, 5 Kilo Volt DC, 30 Milli Ampere, Timer 0 To 100 Seconds, HV Prods, Start-Stop-Trip-Reset Using Single Switch On The Test Prods. Start Function Apply Test Voltage From 0 To Set Voltage Gradually.
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Pen-Style Meter
MT-1630
Compact in size, light in weight and simple in usePenlight illuminates brightly the point to be measured, even in dark placeUnique protection mechanism for the test prod for safetyAuto power off function saves the battery life
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Contunuity Tester With Audio Warning
CT-01
Laxtronics Instruments & Controls Pvt. Ltd
5 Kilo Volt AC, 30 Milli Ampere, Timer 0 To 100 Seconds, HV Prods, Start-Stop-Trip-Reset Using Single Switch On The Test Prods. Start Function Apply Test Voltage From 0 To Set Voltage Graduall
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Junior Set and Kits
Contents* AM-510-EUR (Digital multimeter)* ACD-10 PLUS (Digital current clamp)* TPP1-C1 (contact thermometer)* EU-200 (test lead set with 2 leads), 2 test prods (4 mm), 2 crocodile clips (CAT III/1000 V)* Hard carrying case
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High Voltage Breakdown Tester
Model HV-50
Laxtronics Instruments & Controls Pvt. Ltd
5 Kilo Volt AC, 30 Milli Ampere, Timer 0 To 100 Seconds, HV Prods, Start-Stop-Trip-Reset Using Single Switch On The Test Prods. Start Function Apply Test Voltage From 0 To Set Voltage Graduall
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Test Lead Set
131139
IEC 1010 Rating: 1000 Volts Cat III Double/Reinforced Insulation 20Amps. Kit Comprises:- 1 Pair 123856/OF-OR/1.2 Double Insulated Silicone Lead Assemblies. 1 Pair 121017 Test Prods. 1 Pair 121026 Sprung Hooks. 1 Pair 126024 Fully Insulated Crocodile Clips. Packed In Silver Wallet.
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Scienlab Combined Battery Test Solution
SL1133A
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Build-to-Print for Test Systems
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Test System for Detecting Exact PCB Short Circuit Locations
QT25
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Active Alignment Assembly & Test Platform
Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Test Fixture (SMD Components)
16034E
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
