Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Test Probes & Clips
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CF Instrument Accessories Ltd.
CF Instrument Accessories Ltd. Test Probes & Clips
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ICT Test Probes
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C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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Multimeter Test Probes
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Multimeter Test Probes, Voltmeter test leads,with the Parrot™ Clip Invention provide precise, HQ, accurate, reliable contacts and connections. Parrot™ Clips with HQ leads and banana plugs or other connectors are the best solution for DDM, analog multimeter for high voltage measurements as well as for high current measurements. Measurements with multimeter test probes require both: Hands-on direct point contact and grip on, Hands free removable connection.
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Single Ended Test Probes
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Single ended probes ranging from 0.4mm to 1.27mm pitchWide selection of plating options to optimize contact challenges and maximize probe lifeVarious length option to provide drop-in replacement capabilityTri-temp applications – 55°C to 155°C
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General Purpose Test Probes
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Low profile, short travel test probes for restricted space applicationsApplications where long travel is not required such as thin film/hybrid circuits or bareboard PCB testingReplaceable test probe by use of a receptacle
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RF Test Probes
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With over 50 Tip-Styles, you can be certain we can help you find the right solution for your testing demands. And if we don’t offer a probe solution already in production, we will work together with you to develop a custom solution.
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Fine Pitch Test Probes
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Micro probes allow very fine pitch testing ranging from 0.13mm to 0.35mm pitchLow Resistance, Low inductance, High FrequencyWide selection of plating options to optimize contact challenges and maximize probe lifeTri-temp applications – 55°C to 155°C
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Semi-Rigid Test Probes Up to 6 GHz
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Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
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Test Probes
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Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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µHELIX® Test Probes
Series S200, S300, S400, and S500
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Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.
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Test Probes
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A physical device used to connect electronic test equipment to a device under test (DUT).
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SMD Test Probes
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The Parrot Clip, model PCM W1 or PCS-MB W1 invention can be connected to resistance’s, diodes, integrated circuits (SOIC, SO) etcThe advantage of the Parrot Clip is given by the double metal connection made between the new metal tip and the steel hooked rod, spring loaded. This connection, being made by metal parts is electrical and mechanical reliable, even if the contact point are small. Connections are resistant even at high temperatures.
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Test Probes
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Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Exchangeable Test Fixture
MA 2111/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Plug Solutions
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Operation based on the insertion of a plug or test probes which isolate field equipment from the relay, and provide secondary connection points for secondary injections.
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6 Sided Bed of Nails Testers
BoxProber Family
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6 sided Bed of Nails circuit board test fixture. Probes top bottom and all 4 sides. Central camming mechanism pull plates inward. Mechanically or electrically actuated options. Designed primarily for testing products in plastics. Side access electrically probes outside panel connectors. The unit will also optically read LEDs and key segments off LCD displays. Solenoids will press buttons and servos will turn selector switches. DC motors are used to adjust multiple turn potentiometers. Microphone will detect audio output tones. Top and bottom of circuit boards can also be probed if removable access panels are available. This unit will also probe all 6 sides of a circuit board. This is typically utilized in applications where connector testing is required.
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Photonics Test Solutions
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Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Test Switches and Accessories
FT Flexitest Family
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The ABB FT test kit comes with a convenient carrying case to hold your hand held meter, test plugs patch cords, clips, and test probes in neat order. Patch cords are highly durable and flexible. Test switch accessories include: Test plugs Test kits Covers Interlocking bars Miscellaneous
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Stand-Alone Test Fixture
MA 2013/D/H/Pylon
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 24,00 kg
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Product
30 Amp Fuse Buddy
305M
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*Fuse Buddy Testers can test circuit current up to 30 Amps. *Two 30 Amp models, #305M used with Mini size fuses and #306B used with ATC size fuses. *Blowing fuses? Get the Fuse Buddy, a great new product. *Clever design allows for easy connection into fuse sockets. *30 Amp models have resolution of .1A, while 20 Amp models have .01A resolution. *Fuse Buddy ends are molded into the shape of the fuse itself. *During testing the fuse is removed and replaced into the Fuse Buddy. This way, the circuit being tested maintains fuse protection. *The Fuse Buddy stays put and won't fall out of the socket, like test probes do. 305M & 306B Specifications *Tests circuit current from 0 to 30 Amps/48 Volts *Resolution .1A (100 milliamps), accuracy + 2%
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Stand-Alone Test Fixture
MA 2012/D/H/GR2270/71
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,00 kg
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Test Probes / Test Fixtures
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INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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Semicon Test Probes
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Fine pitch, 0.20 mm [8 Mil] - single & double ended - non-rotating - kelvin - RF - high performance.
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Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Spring Contact Probes
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Spring Contact Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Test & Test Development for Circuit Card Assembly
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Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
