Filter Results By:
Products
Applications
Manufacturers
Defect
other than specified, imperfection .
-
product
Lab Inspection & Testing Services
Our lab services use advanced techniques to thoroughly inspect components for manufacturing flaws before assembly. We work with clients in the aerospace, automotive, oil & gas, manufacturing, wind energy, and various other industries to ensure their materials and components are free from defects that were introduced in forging or manufacturing processes.
-
product
Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
-
product
Electroluminescence Test Systems
The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
-
product
Advanced Vision
Automated visual inspection solutions that leverage the advanced imaging performance of Radiant's photometry-based cameras and inspection software to detect subtle, low-contrast defects in complex assemblies and on surfaces.
-
product
Exploratory Testing
Defects in apps and on websites directly impact customer conversions and retention. They exhaust user goodwill and ultimately damage your brand and revenues. Scripted or automated testing might indicate whether a particular customer journey works as intended, but will not necessarily reveal bugs beyond specific boundaries. They come to light only when the app or website is in front of real users.
-
product
Voltage Detector / Phase Comparators
VisualPhase
Hachmann Innovative Elektronik
With the VisualPhase line you get a type series of handy, exact and easily operated multi-functional devices with integrated voltage detectors, phase comparator and maintenance testers. Equipped with a thorough self test to ensure reliable function, a permanently enabled interface-tester to warn against defect interfaces and the connectability to HR, MR, LR, LRM or LRP string parts every VisualPhase delivers uncompromising safety.
-
product
Dual Voltage Detector / Maintenance Tester
MicroPhase I
Hachmann Innovative Elektronik
MicroPhase I is an easily operated phase comparator, dual voltage detector and maintenance tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-testers warn against defect interfaces. The integrated "Universal Phase Comparator" compares two different interface signals, even if they are of different interface type or voltage. A unique error control avoids switching errors caused by erratic or unfeasible phase comparison.
-
product
Open Source Service to Help Secure and Trust Your Software
Community Attestation Service / CAS
- CAS stores all signatures inside of immudb, the standard for open source immutable databases.- CAS is protected against tampering. All attestation data is integrity-checked and cryptographically verified by the CAS client.- CAS is also protected against MITM attacks. The public key below is checked by every communication.A Software Bill of Materials (SBOM) is a list of components in a piece of software.Like a list of ingredients on food packaging -- where you might consult a label to avoid foods that may cause an allergy -- SBOMs can help companies avoid use of software that may harm their organization.If defects are later found in a specific part, the SBOM makes it easy to locate affected products.
-
product
Near Infrared Subsurface Defect Detection and Review Systems
DDR200/300 NIR
The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
-
product
Atomic Force Microscope
HDM Series
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
-
product
Vibration Testers
Analyzes vibration patterns within mechanical systems or individual components and structures to identify defects and evaluate the test object's overall condition.
-
product
Power Capacitor
POLB HD 7%
Lifasa - International Capacitors, SA
They are self-regenerating condensers with low loss polypropylene dielectric, filled with N2 inert gas mainly, or with resin, and with overpressure disconnection system, which offers a high level of safety against defects, when cutting the 3 phases in case of action.
-
product
PXI Fault Insertion Insertion Switch Modules
Our PXI Fault Insertion Insertion Switch Modules feature a breakout arrangement that allows faults to be attached to the sensor lines, this includes the breaking of a connection or the adding of defect – all of which can simulate connectivity problems in the system.
-
product
Power Steering Tester in Storage Case
34650
Gives fast, accurate power steering analysis. Test for defects in power steering pumps, gears and lines. Large heavy duty gage reads from 0-2,000 PSI and 0-140 BAR. Use to rule out power steering problems before expensive suspension or steering linkage problem is attacked. Includes 13 adapters. Supplied with instructions in a durable, plastic molded storage case.
-
product
Eddy Current Test System
CIRCOGRAPH® Product Family
Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
-
product
Manual Testing
TestingXperts brings in a unique blend of testing processes, tools & technology expertise, and domain knowledge to ensure that the product is delivered without defects in accelerated time frame. TestingXperts provides end to end manual testing services for your functional testing needs with a foundation of matured test processes, in-house accelerators and experience of all industry-leading functional testing tools.
-
product
Magnetic Particle Inspection(MPI)
Magnetic particle inspection is an inspection method used to identify defects on the surface of ferromagnetic materials by running a magnetic current through it.
-
product
Defect Inspection System
NovusEdge
The NovusEdge System provides high sensitivity inspection for the edge and backside of bare unpatterned wafers for current and advanced nodes. Multiple modules can be configured on the same automation platform for increased throughput while maintaining a small footprint for an improved cost of ownership.
-
product
GFCI Receptacle Tester
RT600
Designed to detect the most common wiring problems in standard 120V receptacles.Also tests GFCI receptacles for proper operation.Test for correct wiring, open ground, reverse polarity, open hot, open neutral, hot and ground reversed.Conditions NOT indicated: Quality of ground, multiple hot wires, combinations of defects, reversal of grounded and grounding conductors.Large light indicators for greater visibility.Reinforced prongs for increased durability.Push-pull design with slip-resistance ribbing.
-
product
3D Sensors (Main Screen)
surfaceCONTROL
surfaceCONTROL sensors are used for 3D measurements and surface inspections. The sensors use the fringe projection principle to detect diffuse reflecting surface and to generate a 3D point cloud. This point cloud is subsequently evaluated in order to recognize geometry, extremely small defects and discontinuities on the surface. Sensors with different measurement areas are available. This enables the inspection of the finest of structures on components as well as shape deviations on large-area attachments. Powerful software packages are available for evaluation and parameter setting.
-
product
Ultrasonic Imaging System
USPC 3010
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Detects internal defects in new materials and metals. The wide frequency range up to 35 MHz enables highestresolution. A-, C-, and D-scans can be recorded. The imaging in B-scans is an option.
-
product
Cross Sections and Metallography
Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
-
product
E-beam Metrology And Inspection
Our HMI e-beam solutions help to locate and analyze individual chip defects amid millions of printed patterns.
-
product
Battery Boxes Testing Equipment
Battery boxes can be tested for faults by placing the box on a metal plate. By applying a test voltage to an electrode inside the box, the moulding can be checked thoroughly - particularly at the injection points - and any faults found. Defects will be identified by a spark passing from the electrode, through the defect itself, to earth (the conductive material placed outside the battery box.
-
product
Precision Impedance Analyzer (10Hz to 130MHz)
ST2851
ST2851 series precision impedance analyzer is a new generation impedance test instrument by adopting the current international advanced automatic balance bridge principle. It is based on Windows10 operating system, which realizes a fully computerized operation interface, making the measurement more intelligent and easier.ST2851 series impedance analyzer surpasses the 120MHz frequency bottleneck of similar foreign instruments, and solves the defect that it can only be analyzed but cannot be tested independently. At the same time, it adopts two interfaces of single test and analysis to make the test easier.
-
product
Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
-
product
Defect Isolation
*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB
-
product
Permanent Monitoring
Real-time Ultrasound and Vibration data indicate changes in healthy function earlier in the P-F Curve than other condition monitoring technologies. Advanced warning allows every maintenance job to be planned while reducing levels of critical spares held in inventory. Reliability teams benefit from a proactive culture that affords them time to eliminate defects rather than simply applying band-aids.
-
product
Inspection System
X-eye 7000B
Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
-
product
Thermal Shock Chambers
We provide a large selection of thermal shock chambers to accommodate various types of product testing. Thermal Shock Chambers perform tailored environmental stress screening of component and board electronic assemblies. Our unique chamber design transfers product between two extreme temperature-controlled chambers, passing equal volumes of high velocity conditioned air over the product and resulting in rapid product temperature changes. The induced thermal stresses can reveal hidden manufacturing defects in electronic sub-assemblies and other components by the expansion and contraction of critical parts.
