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Fiber Interferometers
Wuhan Sunma Technology Co., Ltd.
SunmaFiber Interferometer is an automatic, non contact fiber endface interferometer for single fiber connector developed by SunmaFiber. It is designed to measure the geometry parameters of single fiber connector end-face. Equipped with auto focus and auto centering functions, SUNMA INTERFEROMETER is very accurate and stable, it can also test bare fiber and bare ferrule. It is very helpful in fiber connector manufacturing to increase the quality of the connectors.
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10 N Screw Flat Grips
10 N (2.2 lbf) screw flat grips are primarily used for tensile testing low force, soft materials such as yarn, paper, plastics, and cloth, in film or wire geometry. Grip faces are flat and rubber-coated, and the supplied coupling joints for the 10 N screw flat grips are designed for use on lower-capacity load cells.
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Rotman Lens Designer
Rotman Lens Designer (RLD) is a software tool for the design, synthesis, and analysis of Rotman Lenses and their variants. It is based on Geometrical Optics combined with the classical Rotman Lens design equations. It is intended for rapid development and analysis of Rotman Lenses given several physical and electrical input parameters. RLD generates the proper lens contours, transmission line geometry, absorptive port (dummy port) geometry, provides an approximate analysis of performance, and generates geometry files for import into Remcom's XFdtd® for further analysis and fabrication.
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Manual Spin Rotary Table for Optimal Circular Geometry (TIR) Inspection
TruMotion
Rotary Precision Instruments UK Ltd
Inspect circular components in a shop floor environment whilst maintaining world class accuracies more commonly seen in the standards laboratory.
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3D Sensors (Main Screen)
surfaceCONTROL
surfaceCONTROL sensors are used for 3D measurements and surface inspections. The sensors use the fringe projection principle to detect diffuse reflecting surface and to generate a 3D point cloud. This point cloud is subsequently evaluated in order to recognize geometry, extremely small defects and discontinuities on the surface. Sensors with different measurement areas are available. This enables the inspection of the finest of structures on components as well as shape deviations on large-area attachments. Powerful software packages are available for evaluation and parameter setting.
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Fiber Geometry System
2400
The 2400 Fiber Geometry System is designed to provide high-speed automated measurements of optical fiber end-face geometry. Repeatable and accurate measurement of parameters such as core and cladding diameter, core and cladding non-circularity, as well as core-cladding concentricity provide invaluable process control information, and ensure that customer demands for low loss fiber splices are satisfied. Measurement options are available for both side view coating geometry measurement and fiber curl characterization.
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Correlation Analysis
EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software. A modal mapping procedure is executed to match the EMA and FEA models. After this matching procedure, the new mode shape information from FEA is interpolated and the FEA modal parameters are displayed alongside with EMA results. Finally, to observe the correlation between the results from the two methods, a Cross-MAC matrix is calculated and shown.
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High Temperature Operating Life
7000 Series
With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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Systems Tool Kit
STK
STK is a free 2D and 3D modeling environment used by engineers, mission analysts, operators and decision-makers from more than 700 global organizations to model complex systems (such as aircraft, satellites, ground vehicles and their sensors) to evaluate their performance in real or simulated time. Built on a time-dynamic, physics-based geometry engine, AGI software answers fundamental questions essential to solving dynamic analysis problems
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High Precision Angular Positioning, Calibration and Geometry INspection
LabStandard AIR
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.The LabStandardAIR has been designed as a “Contact Free” system and eliminates features, which may detract from achieving the optimum rotational performance. The rotating elements are supported on super high precision, air lubricated, hydrostaticbearings and are not subject to disturbances associated with gear drives.
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Solar Wafer Geometry and Surface Inspector
7201
The Chroma 7201 was designed to measure wafer lengths, widths, diagonal, orthogonal and chamfer size and angle, it is also capable to detect surface stains. User friendly software and GUI enable versatile parameter setting and result, it also provides a defect display and storage function for further analysis or potential MES/CIM integration.
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Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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ReMesh
ReMesh is the CAD program, which provides powerful tools for geometry creating, checking and editing. Program has tools to remesh discretely or semi-analytically specified geometry in 3D and has convenient interface for editing geometry manually. Problems with remeshing of such geometries arise in EMC simulations.
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Multibeam Echosounder - Deep Water
SeaBat 7160
The SeaBat 7160 transducer array is comprised of linear receive and transmit arrays mounted together on a support base. The T-shaped array geometry provides the basis for a compact, high-resolution sonar which is easily installed for portable or hull mounts – a first for a high-resolution system in this frequency range. The system features a pitch-stabilized transmitter and an active roll compensated receiver.
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Benchtop Non-Contact Directional Geometry Spectrophotometers
Hunter Associates Laboratory, Inc.
Unique measurement methods that don’t require instrument contact with your samples. These benchtop spectrophotometers are perfect for samples that are not smooth, uniform or are messy. These solutions reduce sample preparation time and cleanup time while ensuring absolute measurement accuracy and consistency.
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Wafer Sorter and Inspection
SolarWIS Platform
Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Fully Automatic Colorimeter
DRK103C
Shandong Drick Instruments Co., Ltd.
(1)5 inch TFT color LCD touch screen, the operation is more humanized, new users can be mastered in a short period of time using the method.(2)Simulation of D65 lighting lighting, using CIE1964 complementary color system and CIE1976 (L*a*b*) color space color difference formula.(3)The motherboard brand new design, using the latest technology, CPU uses 32 bits ARM processor,improve the processing speed, the calculated data is more accurate and rapid electromechanical integration design, abandon cumbersome testing process of the artificial hand wheel is rotated, the real implementation of the test program, a determination of the accurate and efficient.(4)Using d/o lighting and observation geometry, diffuse ball diameter 150mm, diameter of the testing hole is 25mm.(5) A light absorber, eliminate the effect of specular reflection.(6)Add printer and imported thermal printer, without the use of ink and color, no noise when working, fast printing speed.(7) Reference sample can be physical, but also for data,? Can store up to ten only memory reference information.(8) Has the memory function, even if the long-term shutdown loss of power, memory zeroing, calibration, standard sample and a reference sample values of the useful information is not lost.(9) Equipped with a standard RS232 interface, can communicate with computer software.
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Circular Helmholtz Coils
Helmholtz-Coils are especially designed to generate precisely defined magnetic fields from DC to the upper end of the audio frequency range and beyond. The generated fields are in a strongly linear relation to the coil current. The field- strength can be calculated exactly by analytical (or numerical) methods, based on the coils' geometry, the number of turns and the coil current.
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Low Temperature Operating Life (LTOL) Test
LTOL
LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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Camera Testing
FLIR
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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Non-Destructive Testing
The essential feature of active thermography is the targeted supply of energy to the test object. A temporal and spatial characteristic heat flow results depending on the geometry and thermal properties of the test subjects. Its progression on the surface of the test object is captured by a thermographic camera.
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CMM (Coordinate Measuring Machine) Solutions
A device that measures the geometry of physical objects by sensing discrete points on the surface of the object with a probe.
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Straightness Measurement Kit
55283A
The Keysight 55283A Straightness Measurement Kit, used with the Keysight 5530 Laser Calibration System, makes straightness, squareness and parallelism measurements to identify geometry errors that seriously degrade machine tool performance. These measurements allow documentation, analysis and diagnosis of machine tool travel and parallel axes of motion.
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Wafer Thickness, TTV, Bow and Warpage
ALTO-TTV FAMILY OFFERS THE SPEEDY MEASUREMENT OF WAFER GEOMETRY PARAMETER, MORE IMPORTANTLY, WE CAN AUTOMATE THE TOOL TO HANDLE FROM THIN WAFERS TO PERFORATED, WARPED, BUMPED, AND TAPE-FRAMED WAFERS. OPTIONAL SORTER AND SHIPPING JAR UNPACKING FUNCTION AVAILABLE.
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3D/2.5D Time-Domain Electromagnetic Field Solver Software
EM-CORE ®
3D/2.5D Time-Domain Electromagnetic Field Solver Software for Planar-Circuit and Antenna Simulation. 3D & 2D Radiation Patterns Modeling, Spiral Inductors Modeling, 3D EM Modeling of Filters, Intuitive Geometry Build, and more!
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Turbine Flowmeters
Titan’s small turbine flowmeter range use a radial flow principle based on the Pelton wheel technique. This well proven method is the ideal way of measuring low rates of flow of low viscosity liquids. For these mini flowmeters, a jet of fluid is directed at a turbine that is mounted on robust low friction sapphire bearings. The geometry of the turbine and the fluid chamber ensures that the rotational speed of the rotor is proportional to the flow rate through the device. The use of this radial arrangement allows more energy to be imparted into the turbine, so the bearing drag is far less important. Furthermore, because more energy is available the bearings themselves can be a lot stronger so increasing the life of the flowmeter. For larger flows, some of the liquid can bypass the turbine chamber, which then behaves as a “shunt” to the metered fluid. Accuracy is still maintained and the output remains linear.
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Step Probes
*Precisely controlled probe travel*Step tip geometry*Replaceable and non-replaceable versions*Plating options available
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Coordinate Measuring Machines
Coordinate Measuring Machines (CMMs) measure the geometry of physical objects by sensing points on the surface of the object with a touch probe. They are commonly used in manufacturing processes to inspect a physical part or assembly against the design specification.
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High Precision Angular Positioning Calibration and Geometry Inspection
LabStandard
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.Designed for horizontal and vertical applications with self-locking worm gearing and a high accuracy angular encoder ensures sensitivity and fine positioning for metrology and precision testing.
