Geometry
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Product
Hybrid Photon Counting Detectors
MYTHEN2 Series
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MYTHEN2 detectors guarantee noise-free performance, maximum resolution, and outstanding signal-to-noise ratios for an extended energy range from 4 to 40 keV. These systems include two module sizes: 1K with 1280 strips, and 1D with 640 strips. Their compact size, symmetrical sensor position, and DCS4 control unit make the MYTHEN2 series suitable for any diffractometer geometry — from portable instruments to large systems.
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Product
Hardware and Software Complex for Measuring Geometric Parameters
Vishera
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Non-contact measurement of the geometry of objects using telecentric lenses Opto Engineering, illuminators of various modifications, 3D scanner Sick Ranger. The telecentric pair, in conjunction with modern digital cameras from Basler, ensures high accuracy in measuring the geometric parameters of objects, the principle of laser triangulation ensures high accuracy and scanning speed.
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Product
Vibration Analysis
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The vibration analysis software WaveImage includes a full set of methods providing an accurate and detailed overview of your vibration measurement data. This gives you a clear understanding of the cause-and-effect relationships between specific excitations and their vibrational response. Create a simple geometry model of your structure and link your multi-channel measurement data to the points in the geometry where the data was recorded. Then visualize the dynamic deformation of the structure under specific operating conditions with a detailed animation.
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Product
XRD System
SmartLab®
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SmartLab includes as standard Rigaku's patented Cross Beam Optical™ (CBO) technology. CBO technology uses simultaneously mounted, simultaneously aligned optical components for both focusing (Bragg-Brentano) and parallel beam diffractometer geometries. Users can switch between the two geometries without the need to remove, replace, or realign optical components.
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Product
ICP-MS spectrometers (ICP MASS)
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SPECTRO Analytical Instruments GmbH
SPECTRO MS is a double-focusing sector field ICP MS (ICP mass spectrometer) based on a Mattauch-Herzog geometry with a newly developed ion optic and pioneering detector technology. It is the only ICP MS instrument available on the market today that is capable of simultaneously measuring the complete mass range used for inorganic mass spectrometry from 6Li to 238U with a permanent ion beam going to the detector.
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Product
Premium Spectral Light Meter
GL SPECTIS 1.0 TOUCH
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The Spectis 1.0 Touch handheld light meter offers unmatched performance and flexibility. With an interchangeable detector, the system can be used for wide range of applications and measurement geometries. Use in the field, the lab or both!
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Product
Inspect a Large Range of Part Geometries
ECHOMAC® PA Composite Tester
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ensures complete inspection of the part. The system is scalable, allowing the flexibility of adding channels as needed to handle a large range of part geometries. Meets or exceeds USA, European and other international specifications in aerospace and automotive industries. MAC can supply mechanics designed to meet customer requirements ranging from inline bubbler systems to stand alone immersion tanks with part placement.
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Product
Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Product
Straightness Measurement Kit
55283A
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The Keysight 55283A Straightness Measurement Kit, used with the Keysight 5530 Laser Calibration System, makes straightness, squareness and parallelism measurements to identify geometry errors that seriously degrade machine tool performance. These measurements allow documentation, analysis and diagnosis of machine tool travel and parallel axes of motion.
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Product
Polaris Tools And Accessories
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The Polaris® optical measurement solution is designed with accuracy, reliability, and versatility in mind. Versatility is delivered in part by NDI software packages and developer tools that are available to enhance OEM application development and system customization. The Polaris solution consists of an optical tracker and navigation markers, the latter of which must be attached to a rigid body; i.e. a tool that is rigid in form to prevent unwanted marker movement. The Polaris solution requires three or more markers to be attached to the rigid body tool, the geometry (configuration) of which is unique to each tool.
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Product
PAL Standard Pattern Generator
PG315P
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The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Product
Wheel Running Tester up to 15000 kg axle load
MINC II EURO | VP 420005
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Maschinenbau Haldenwang GmbH & Co. KG.
The test lane-compatible MINC II EURO guarantees a verification of the axle geometry in seconds when the test vehicle drives over (up to 15.0 t axle load) as well as a fully automatic evaluation of the deviation in m / km. The measured values are displayed either in analog form on a dial or by transmission to a PC screen (including graphic representation).
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Product
Automated XY Stage
AT2
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The Instron AT2 is a compact automated XY stage that streamlines compression, tensile, and flexural testing for both batches of specimens and single components with multiple test points. Designed for seamless integration with 6800 Series universal testing systems, the AT2 features standard bolt patterns for custom fixturing and accommodates a wide range of specimen geometries. Fully integrated with Bluehill® Universal software, it enables operators to quickly define and execute test sequences using grid, diamond, or custom layouts—boosting throughput, consistency, and testing efficiency.
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Product
High Impedance Active Probes
7
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Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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Product
Multiphysics Simulator
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The COMSOL Multiphysics simulation environment facilitatesall steps in the modeling process defining your geometry, specifying your physics, meshing, solving and then post-processing your results. Model set up is quick, thanks to a number of predefined modeling interfaces for applications ranging from fluid flow and heat transfer to structural mechanics and electromagnetic analyses.
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Product
Torque Sensors
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In universities and industry, for basic research or quality assurance: Kistler torque sensors guarantee precise definition of the power and friction values of drives, transmissions and pumps. Strain gage technology (DMS) is a powerful solution for measurements on rotating shafts, and also for long-term dynamic and static measurements. Maximum precision, the most rigid structure possible and high temperature stability: thanks to these assets, DMS sensors can accomplish the most demanding tasks. Piezoelectric reaction torque sensors offer convincing features such as exceptional overload protection, high signal resolution and a wide frequency range. They are ideal for measurement tasks when conditions are difficult due to geometry, temperature range or dynamics.
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Product
Crack Opening Displacement (COD) gauges
COD
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Instron® Crack Opening Displacement transducers are designed specifically to perform standard ASTM and ISO fracture mechanics tests (both cyclic and static), covering all common specimen geometries (CT, SEB, Centre Crack, Arc Shaped). Each model offers class leading linearity, whilst being rugged enough to withstand the high energy release common in many of these applications and can be used at both elevated and sub-ambient temperatures. These gauges comply with requirements laid down in ASTM E399-09.
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Product
Mobile Assay System
ISO-CART-85
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Complete In-situ NDA Gamma-Ray Analysis Solutions for a Wide Variety of Samples including "Free-Release" Decommissioning WasteMeasures all common geometries: pipes, cylinders, floors, ceilings, walls, drums, boxes, and soilsEasy-roll cart for maneuvering over any surfaceWide selection of collimators and shields available for different measurement situationsContinuous height adjustment and variable tilt adjustmentISOTOPIC software, proven results on thousands of real-world samplesFactory pre-calibrated or calibrate with a single inexpensive mixed isotope point sourceFlexible reporting: measurement results can be reported in grams or activity (Bq or Ci)
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Product
SANA 2 Interferometer
CA3004
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SANA 2 fiber endface interferometer is a type of cost-efficient non-contact test instrument with excellent performance. It is able to measure the fiber endface geometry parameters such as radius of curvature, apex offset, fbre height and polishing angle of APC connector.
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Product
Wafer Sorter and Inspection
SolarWIS Platform
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Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Product
Rock Mechanics
ROCK3D
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ROCK3D is a program for stability analysis of removable blocks on planar rock slopes. It identifies and analyses all the blocks that have formed under each kinematic mode. Once the geometry of the rock blocks has been identified, the bolt forces necessary to reach a required safety factor are calculated.
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Product
Integrating Sphere Solutions
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An integrating sphere is a light collector which takes advantage of physical geometry to homogenize any radiation being emitted inside by relying on a high-reflectance coating material. Depending on the wavelength range the end user using a sphere with, different coatings have different advantages based on the application.
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Product
Spectrometer
AirSPEC
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Baltic Scientific Instruments, Ltd
Scintillation gamma-ray spectrometer AirSPEC is intended for measuring scintillation spectra and alsofor determination of activities and specific activities of radionuclides in samples and in conditions of natural occurrence in geometries 2 and 4.Spectrometercan be usedfor various tasksradiation monitoring, including the definition ofspecific effective activity of naturally occurring radionuclides (NORM) in building materials (granite,crushed stone, gravel, etc.), raw materials, products, waste industrial productionand rockswithoutsampling; measurements surface activity of the radionuclide 137Cs (and other); mass fraction of NORM in rocks andoresin the conditions oftheirnatural occurrence on a surface, inboreholes and in warehouses andtransportcontainers, and also in study ofsurface contaminationof soil,as well asprospecting and exploration ofmineral deposits resources.The spectrometercan be used forworkin the laboratoryand in the field conditions.
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Product
High Power LED Test System
Lumere-GM
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Evolusys Technologies Sdn. Bhd.
Lumere GM is a LED test and measurement system for various parameters of LED light. It is a high-accuracy system with a temperature-controlled CCD, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. The Lumere GM is used in laboratory applications and in the production of high-power LEDs.
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Product
Correlation Analysis
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EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software.
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Product
Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
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The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Product
Non-Destructive Testing (NDT)
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Marposs complements its geometric measurement solutions with solutions for non-destructive testing using eddy current technology.The testing options can be divided in three large groups:Material integrity test, to check for the presence of defects (cracks, porosity, blow holes, inclusions) on the surface and in the layer just below the surface.Material properties test, to check if the thermal cycles (hardening, hardening and tempering, annealing, stress relieving, etc.) have been performed correctly. Material identification checks are done to sort parts with the same geometry but made with different materials.Thread inspection to check if the treading has been carried out and its quality.In addition to the non-destructive checks performed with the eddy currents, we have developed a durometer for the conventional measurement of surface hardness, according to the Rockwell scale (HRC or HRA); which uses a diamond penetrator to measure the hardness of the sample being tested.
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Product
10μm Transparent Quartz IDE Chip
TID1
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The TID1 10um Transparent Quartz IDE Chip is an interdigitated electrode chip designed for gas sensing, humidity sensing, biosensing, impedance measurement, and MEMS-related electrochemical or electrical detection research. The 10 um transparent electrode geometry provides a defined interdigitated pattern for surface-functionalized sensing experiments. The quartz glass substrate supports optical access, transparent sensing, and photoelectric detection, while the IDE layout helps improve interaction between the electrode fingers and the target film, electrolyte, vapor, or biological interface.
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Product
NTSC Standard Pattern Generator
PG315N
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The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Product
Impedance Measurement
CITS880s
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Finer geometries and thinner copper can present a challenge for fabricators measuring impedance on leading edge PCBs. The CITS880s answers that challenge with the introduction of Launch Point Extrapolation (LPE). LPE extrapolates the TDR response back to a point close to the start of the transmission line effectively allowing to users more accurately to measure the instantaneous or incident impedance of the line.
