Recording Systems
Equipment designed to make an automatic record of output from test equipment.
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Product
Physical Layer Test System
N19301B
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The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Product
SoC Test System
T2000
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SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
In-Circuit Test System Repairs
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Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
Mezzanine System
5181
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ECM P/N 5181 uses TI TLV320AIC23 high resolution audio codecs to provide two channels of Audio input and two channels of Audio output. Each input channel consists of two inputs a left and a right, and each output channel consists of two outputs left and right. The outputs are muteable.
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Product
Battery Management Systems Testing
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A Battery Management System (BMS) is an embedded unit performing critical battery functions, including cell monitoring and balancing, pack charge and discharge control, safety, and communications. The BMS must be tested early in development to optimize control algorithms, as well as during manufacturing to ensure reliable functionality. Bloomy’s family of BMS test systems provides a consistent platform for engineers to bring a BMS to market faster, and more reliably.
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Product
Image Sensor Testing
IP750Ex-HD Family
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The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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Product
Enclosed Fanless Industrial Embedded Computer with NXP® i.MX8M Application Processor
SYS-444Q
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The SYS-444Q is a rugged enclosed fanless embedded computer system with NXP’s i.MX8M industrial application processor with quad-core Arm Cortex®-A53 for low-power processing. This rugged system has dual Ethernet, industrial I/O, expansion options, TPM 2.0 hardware security, and options for wireless connectivity. The processor supports industry-leading video processing along with an M4 microcontroller for real-time subsystems making it an ideal fit for industrial IoT applications requiring highly reliable performance in harsh conditions such as digital signage, industrial automation, energy management, building automation, and others.
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Product
Regenerative Battery Pack Test System
17040
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Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
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The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
HV Test System up to 20000 Volt
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Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Real-Time Operational and Situational Awareness for IoT Systems
Vortex Insight
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Vortex Insight is a web-based tool that can be used to monitor and manage a Vortex-based system from any location and on any device. It provides views of a Vortex system including statistics associated with DDS entities and system elements active in a live environment. It also provides configurable dashboards for monitoring system behavior through graphs and charts of statistics, including resource usage. Vortex Insight allows users to control the configuration and the QoS of Vortex applications, services and systems.
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Product
Photonics Module Test System
58625
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Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
In-Line Test System
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With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Bloomy Simulation Reference System
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The Bloomy Simulation Reference System provides a hardware in-the-loop (HIL) test environment for dynamic, closed-loop testing of many aerospace and transportation control systems. The reference system integrates the computing, I/O, and software components needed for standalone use or to form the basis of a more complex test system.
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Product
True Concurrent Test
TestStation Duo
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The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
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Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
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Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
VXI Digital Multiplier
4152A
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The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
BMS Manufacturing Test System
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The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Product
NI LabVIEW Base Development System for Windows
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NLabVIEW is system engineering software designed for applications that require test, measurement, and control with rapid access to hardware and data insights. The LabVIEW Base Development System is recommended to integrate NI hardware and third-party devices together to build automated desktop measurement applications with an intuitive graphical programming syntax.For applications that require advanced inline analysis or PID control, consider LabVIEW Full Development System.
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Product
Mezzanine System
3564
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The 3564 is a four channel comparator board with a common mode range of -150V to 150V on the two differential inputs and a DAC per channel to set trigger levels. The high common mode range and DC coupling provides a robust solution to level detection and triggering.
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Product
Laser Diode Characterization System
58620
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The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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Product
Component Test Systems
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These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
RSE Wireless EMC Spurious Emission
TS8996
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The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
In-Circuit Test System Calibrations
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Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
Automated Test Systems
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WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
Systems
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In addition to our ISO 9001:2008 certification, we are proud to have the highest possible score for delivery-on-time and QA rating - 100% - from all the major aerospace companies.
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Product
Flying Prober Test System
QTOUCH1404C
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Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Product
Universal Function Test System for Industrial Electronics
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General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
