Test Pattern Generators
-
Product
Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
-
Product
14-Bit AWQ, 2 GSPS Waveform Generator
SDR14TX
Waveform Generator
The SDR14TX is a dual-channel flexible arbitrary waveform generator (AWG). It offers an outstanding combination of high bandwidth and dynamic range which enables generation of wideband signals.
-
Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
Test System
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
-
Product
ATE Self Test Fixtures
AL663
Test Fixture
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
-
Product
Arbitrary Waveform Generators
M9300 Series
Arbitrary Waveform Generator
The M9300 Series arbitrary waveform generators (AWGs) offer you high resolution and wide bandwidth waveforms with excellent signal quality in a PXIe form factor. Generate the most realistic waveforms for your radar, satellite, and frequency-agile communication systems.
-
Product
Ethernet/LXI generatorNETBOX 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 8 Channels, up to 80 MS/s on 16 Channels
DN2.656-16
Arbitrary Waveform Generator
The generatorNETBOX DN2.65x arbitrary waveform generators (AWG) is a general purpose multi-channel AWG with outstanding dynamic performance. The series includes LXI units with either four, eight or 16 synchronous channels. The large onboard memory can be segmented to replay different waveform sequences.
-
Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
-
Product
VXI Waveform Generators
Waveform Generator
Astronics Test Systems offers VXI Arbitrary Waveform Generators with a long, reliable heritage for military use.
-
Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
-
Product
VR/AR/MR Calibration Platform
Test Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
-
Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74C
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
-
Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
-
Product
VXI Digital Test Instrument
T940 Series
Test Instrument
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
-
Product
G-S General Purpose Probes
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
-
Product
PXIe-5654, 10 GHz or 20 GHz RF Signal Generator
783126-01
RF Signal Generator
The PXIe‑5654 features an ideal combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe‑5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications.
-
Product
Alternate 0.50 (14.00) - 2.50 (71.00) General Purpose Probe
P2662BG-2V2S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 68Full Travel (mm): 1.73Recommended Travel (mil): 50Recommended Travel (mm): 1.27Overall Length (mil): 575Overall Length (mm): 14.60
-
Product
Test Workflow Standard
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
-
Product
3GHz Dual Channel Signal Generator 19" 1U Rack Module
LS3082R
Signal Generator
The LS3082R, 3GHz dual channel RF Analog Signal Generator, offers industry leading performance, in a 1U, 19” space efficient, rack-mounted box. The LS3082R features two phase coherent channels, exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The LS3082R was designed to offer excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
-
Product
Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2J30
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
-
Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
Test Fixture
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
Product
65 GSa/s Arbitrary Waveform Generator
M8195A
Arbitrary Waveform Generator
Sample rate up to 65 GSa/s High channel density: 1, 2 or 4 channels per module, synchronization of up to 16 channels on 4 modules with the M8197A multi-channel synchronization module Built-in frequency and phase response calibration Embedded DSP enables real-time waveform and impairment generation(in conjunction with the 81195A optical modulation generator software)
-
Product
HPA-64 General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
-
Product
Test Patterns
DisplayMate Multimedia Edition
-
DisplayMate Technologies Corporation
DisplayMate Multimedia Edition is the most advanced and powerful version of DisplayMate ever, with lots of proprietary and highly innovative suites of test patterns for setting up, tuning-up, calibrating, testing, evaluating, diagnosing, and analyzing CRTs, analog and digital LCD, Plasma, DLP, LCoS, and SXRD monitors and projectors, microdisplays, video boards, color printers, TVs and HDTVs, NTSC/PAL Television encoders and decoders, and more.
-
Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2L-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
-
Product
20 Bit / 2 MS/s Arbitrary Waveform Generator
AWG20
Waveform Generator
The AWG20 is a 20 bit Arbitrary Waveform Generator for medium-speed / high resolution waveform generation. The module combines an excellent dynamic performance with a very high DC accuracy.
-
Product
9GS/s 16Bit 8GS Mem 4CH 8 Markers RF AWG Desktop
P9484D
Waveform Generator
The desktop version of the Proteus arbitrary waveform generator series offers up to 12 channels in a 4U, half 19” dedicated chassis. The compact form size and small footprint save valuable bench space. So for synchronized, phase coherent, multi-channel applications such as quantum physics and radar applications the Proteus arbitrary waveform transceiver is an ideal, space efficient and cost effective solution.
-
Product
350MHZ, 2.4 GSa/S, 20 Mpts, 2 Channel, 20 Vpp Function/Arbitrary Waveform Generator
T3AFG350
Arbitrary Waveform Generator
Teledyne Test Tools T3AFG5 and T3AFG10 series Function/Arbitrary Waveform Generators are a new family of low cost, high performance, single channel Function / Arbitrary waveform generators offering a high level of functionality and an excellent specification at a very competitive price point.
-
Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2X-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
-
Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
-
Product
PXI FlexRIO Signal Generator
FlexRIO Signal Generator
The PXI FlexRIO Signal Generator combines analog I/O and a user-programmable FPGA into a single, customizable instrument. The instrument enables RF signal generation up to 2.9 GHz with 12 bits of resolution. The PXI FlexRIO Signal Generator uses FPGAs from Xilinx alongside LabVIEW and Vivado programming options for custom algorithm implementation and real-time signal processing. Using this instrument with NI-TClk, you can synchronize modules in one or more PXI chassis at up to picosecond‐level accuracy for high‐channel‐count applications.
