Embedded System
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Compact Manual Laser Repair System
LCD 2400C
Extremely versatile, the LCD-2400 is available in both tabletop and console configurations.Korima's 2400 Laser Repair System is an economical, precision instrument designed to cut lines, repair shorts, and drill holes in passivation in virtually any metal.
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Analog IC test system
A paradigm shift has been occurred in Japan’s major brand WL25 series tester. Ultimate simple system is available by effective analog pin architecture.This cost performance system is covered analog IC extensively, which are high accuracy, speed and multi-site test function.
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Fully-Automated CTIA-Compliant OTA Test System
TS8991
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Satellite Terminal Geolocation System
Satellite Terminal Geolocation System is designed to identify and locate sources of satellite transmission such as satellite gateway, VSAT Hub and VSAT terminals etc. The system is useful to the intelligence and defense agencies to identify the sources of satellite transmission of their adversaries and locate the terminals on digital map.
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Wafer Probe Test System
STI3000
The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Desktop Type AE Systems
Compared to the online remote AE systems, desktop type AE systems are connected to and accessible within the local network, either directly by wires or via wireless local networks. Such desktop type AE detection system is normally use with a computer or laptop on a desk or table on site or near the facility. It is usually conducted and real-time controlled by professionals to accurately locate the AE ‘Hits’ sources and analyse the AE data in full aspects. There are two types of AE systems that can be used as desktop type systems, the SAEU3H multi-channel AE system and the RAEM systems respectively.
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Mini-ITX Embedded Boards
Industry trends indicate that users require a smaller and lower cost solution for their system requirements. Mini-ITX has a smaller board size and lower keep-out zones to enable a reduced chassis size for systems placed on the user’s desk, mounted on a display, or installed in space-restrictive environments. In addition to deployment in smaller chassis designed around the Mini-ITX form factor, these boards are compatible with ATX and microATX chassis without the need to retool the I/O shield. Mini-ITX embedded boards are ideal for applications in industrial automation, self-service kiosks, and other infotainment driven solutions.
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Observational Systems: Profiling Floats
Autonomous profiling floats are revolutionizing the way scientists study the ocean. Before the first profiling float entered the water, our ability to measure climate, biological, and chemical trends was limited in scope while large-scale studies were a costly endeavor.
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Power Supply System
PL506
The PL 506 is a high sophisticated, high density, programmable 6-channel floating low-voltage power supply system. Using the remote monitoring and control features either via USB or Ethernet it can be used to supply external load-channels with high power consumption also over long distances. Up to 3kW (3Ubox) DC output power can be provided.
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Probe Systems
These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Hall Effect Measurement system
HMS-3300
Magnetic flux density : 0.55Tesla (+/-0.03T)Gap distance between both round magnets : 26mm / Round magnet diameter : 50mmMeasurable temp : RT ~ 300℃(model# HT55T3). Resolution : 0.1℃(Model# HT55T5 : RT ~ 500℃)Both HT55T3 and HT55T5 are only capable of using with HMS-3000 main body.(Not compatible with HMS-5000 )- You can flow purge gas into small chamber and measure hall effect at the same time. Gas control valve can be installed as an option.
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Metal Detector Combination System
The metal detection combination system is designed for simultaneously detecting metal contaminants and reducing giveaway in food products. This system is perfect for inspecting a wide variety of food products, including retail-packed convenience food/ Food to Go and much more.
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Rugged Embedded MIL-STD-1553PCI Express Mini Card
AME1553-1-E
Rugged Embedded MIL-STD-1553 PCI Express Mini Card with 1 Dual Redundant channel plus 2 discrete Input, 2 discrete Output channels.
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Embedded Chassis With Expansion Slots For Mini-ITX SBC
ECM300
*Designed for Mini-ITX SBC with expansion slots*One 3.5" or 2.5" HDD drive bay*2 PCIe or 1 PCIe x16 expansion slots supported*Slim design with 1 system fan*250W power supply supported*Easy and quick customization
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Backlight Module Optical Measurement System
RayClouds Photoelectric Technology Co.,Ltd.
The DM series backlight module optical characteristic automatic measurement system is equipped with photometer, colorimeter and spectroradiometer to measure the luminance and chrominance, uniformity of the backlight module.
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Hall Effect Measurement system
HMS-5000
Constant current source + Van der Pauw method terminal conversion system
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MB-OFDM Protocol Test System
WiMedia Explorer 300
The WiMedia Explorer 300 is the world's first over-the-air MB-OFDM protocol test system for WiMedia Alliance's Ultrawideband common radio platform, Wireless USB protocol and Bluetooth.
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Automated Soil CO2 Flux System
LI-8100A
A portable, automated system for simple and reliable survey and long-term measurements over a study site. The LI-8100A Analyzer Control Unit contains an infrared gas analyzer and a connection panel to interface with the 8100-103 Survey Chamber, the 8100-104 and 8100-104C Long-Term Chambers, additional gas analyzers, and the LI-8150 Multiplexer.
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System Controls
Exar Corporation offers a broad range of USB VBUS power distribution switches supporting both the USB 2.0 and latest USB 3.0 specifications. These devices, the SP/XRP252x series, are offered in single and dual channels configuration for maximum design flexibility. The XRP2527 and XRP2528 are generic single and dual channels power distribution switches capable of operating at input voltage as low as 1.8V supporting the typical 1.8V, 2.5V, 3.3V and 5V power rails. Current limit for each channel is programmable from 300mA up to 1A through an external resistor and achieves better than 8% accuracy.
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Electrical Probe Systems
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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Gauging System
Equator™ 300
Advanced Industrial Measurement Systems
The Equator is a flexible gauge that is designed to provide speed, repeatability and ease of use for manual or automated applications. The Equator is a highly valuable option for manufacturers who are looking to replace their current gauging method. Its system enables process control by delivering highly repeatable, thermally insensitive, versatile, and re-programmable gauging to the shop floor.
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Stand-alone I-V Test Systems
OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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Circuit Breaker Test Systems
Crest has over a decade of experience of designing and manufacturing test systems for testing all the different kinds of switchgear and controlgear.
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Modular Test Systems
Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
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Direction Finding System
Direction finding systems can detect the direction from which the RF signal is being received and can detect, and direction find multiple targets simultaneously.
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Optics Test Systems
Mirror Collimator And Autocollimator
Optik Elektronik Gerätetechnik GmbH
Mirror collimator and autocollimator for the entire wavelength range from UV to MIR The compact mirror collimator can be used both as an autocollimator and as a telescope.
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High-Speed Embedded Host Electrical Test Board
HSEHET
High-Speed Embedded Host Electrical Test Board is approved by USB-IF, specifically designed for the electrical test of USB embedded host products.
