SFP+ Test
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Product
110 GHz, 1.0 Mm (m-f) Test Port Cable 10 Cm
11500JK10
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 10-cm cable
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
Other Test Systems
Test System
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
Test Fixture
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Spring Clip Fixture
16092A
Test Fixture
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
Tabletop Single Site Test Handler
3111
Test Handler
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
Standard Test Systems
WaveCore™ Products
Test System
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
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Product
EMI Test System
TS9975
Test System
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Automotive Ethernet Test Fixture
AE6941A
Test Fixture
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Product
SMD Array Type LCR Test Fixture
16034H
Test Fixture
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Functional Test Fixtures
Functional Test
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
Test System
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
ARINC 818 Tester
Test Platform
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Product
Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
Test System
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
ESS Performance Test System
Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Dielectric Material Test Fixture
16453A
Test Fixture
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
