Light Fixture
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Product
EBIRST 78-pin D-type Verification Fixture
93-006-101
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The 93-006-101 78-pin D-type Verification Fixture is an accessory for the eBIRST range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces switching solutions. The tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
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Stopper kit includedYAVCANCON2 for fixture identification not included
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Product
Test Fixture (SMD Components)
16034E
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Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
EBIRST 68-pin Male SCSI Termination Fixture
93-015-103
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Component Test Fixture For N1413 With B2980 Series
N1428A
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The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Product
EBIRST 23 X SMB Verification Fixture
93-011-101
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The 93-011-101 23 x SMB Verification Fixture is an accessory for the eBIRST range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
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The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
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The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Parametric Test Fixture
U2941A
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The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
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The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Bottom Electrode SMD Test Fixture
16198A
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Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Product
Fixturing Kit
10744A
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The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
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Product
SMD Test Fixture
16034G
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Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
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Product
Dielectric Test Fixture
16451B
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The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Product
EBIRST 200-pin LFH Verification Fixture
93-002-101
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The 93-002-101 200-pin LFH Verification Fixture is an accessory for the eBIRST range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces switching solutions.. The tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
200 Vdc External Voltage Bias Fixture
16065A
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Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
High Temperature Component Test Fixture
16194A
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Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
EBIRST 50-pin D-type Verification Fixture
93-005-101
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The 93-005-101 50-pin D-type Verification Fixture is an accessory for the eBIRST range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Spring Clip Fixture
16092A
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Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
Magnetic Material Test Fixture
16454A
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The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. Complex permeability is calculated from the inductance with and without the toroid. When the E4991A/4291B with option 002 is used as the measurement instrument, direct readouts of complex permeability are possible. In addition, it is furnished with a small and a large fixture to adapt to a wide range of sizes.
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Product
Test Fixture
OCP NIC 3.0
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These test fixtures are necessary for testing within the OCP NIC subgroup (found under the OCP Server Work Group). These fixtures will arrive meeting the OCP NIC 3.0 Specification with a characterization of the boards. These fixtures mate with the OCP form factor connector, and will allow an electrical break out of each signaling lane.
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Product
Light
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Welcome to Thorlabs; below you will find links to light emitters, sources, and controllers, a subset of our entire line of photonics products. Our light sources are conveniently separated into coherent and incoherent sources. The coherent source category includes laser diodes, laser diode modules, tunable lasers, HeNe lasers, and femtosecond lasers, while the incoherent source link brings you to a selection of LEDs, white light, and broadband SLD sources. The Quantum Electronics category includes optical amplifiers, modulators, and gain elements that are frequently used in research and OEM applications. All of our light sources and optical amplifiers are supported by an extensive line of mounts, sockets, TEC controllers, and current controllers.
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Product
ESS Fixture
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ESS - Environmental Stress Screening - is not a test. It is a product level screening process. ESS is part of manufacturing process, that verifies the operational parameters and guard bands of a product from an environmental - temperature, shock, vibration - point of view.
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Product
Fixture Design
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TestEdge offers quick, cost effective test fixture design services for low-speed, full-speed, and high-speed devices. Based on our experience in developing high performance test fixtures for a wide variety of devices, test sockets, and tester platforms, we provide a premium quality test and engineering validation environment for everything from high power (40W) to high pin count to high speed ECL to high speed SerDes (3.25Gb) devices.
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Light Sources
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Bentham's range of light sources has evolved to suit the requirements of our systems and their users and now offers single or multiple sources from 200nm to 40m:
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Light Sources
LS 150 Xenon Arc Lamp Source
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Model LS-150 is a Patented US Pat. No. 8116017 low cost, high output 150 watt Xe arc lamp based light source. The entire source, power supply, lamp, and optical compartment are housed in an extremely compact enclosure, 9 x 6 x 11 inches. The unit's base allows mounting on inch or metric spaced optical tables with the optics centered over the hole pattern to allow for easy integration with the rest of your setup.
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Product
Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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Headphone Test Fixture
AEC206
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The Larson Davis Model AEC206 Binaural Test Fixture is the tool for testing supra-aural, circumaural, supra-concha, intraconcha, and insert-type headphones. Preassembled with IEC 60318-4 (711) occluded-ear simulators and TEDS compatible preamplifiers that provide electronic calibration information, the Model AEC206 is user-friendly and easy to learn. Additionally, calibration is a simple process—a custom adapter is included for the Model CAL250 acoustic calibrator or similar device.
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Product
Light Source
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A light source essentially is an optical transmitter that is paired with an optical receiver, both of which are connected to electrically based devices or systems. So, the source converts electrons to photons and the detector converts photons to electrons.





























