Stimulus
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Product
VXI 12-Channel, 3-Wire LVDT/RVDT Simulation
65DL2
Simulator
NAI’s 65DL2 is a 12-channel, 3-wire, LVDT/RVDT Simulation Instrument on a VXI board. This single-slot, message-based board features up to 12 stimulus channels of 3-wire LVDT/RVDT, wraparound self-test, and onboard programmable excitation supply. The board is uniquely versatile, as each excitation input and output voltage is programmable. In addition, each channel can be programmed to be controlled by an external DC voltage. A replacement for the 5410C-83, the 65DL2 is ideally suited for defense, commercial aerospace, and industrial applications.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Stimulus Test Cell
HA7200
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The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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Product
RFP DC Low Power
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AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Product
Modulation Distortion Up To 70 GHz
S930707B
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S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Modular Power
RFP DC High Power
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AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Product
Motion Simulator For Test Systems
Metis
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METIS is a motion simulator for sensor and end system level testing. Configurable design allows you to create system you need! - 1-axis rate table for gyro testing - 2-axis unit for 6DOF accelerometer and gyroscope testing - 3-axis Gimbal system for simultaneus Yaw, Pitch and Roll stimulus.
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
Modulation Distortion Up To 90 GHz
S930709B
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S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Chroma LCR Meters
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Chroma Systems Solutions, Inc.
Some of the key features to look for in an LCR meter (also known as an impedance meter) are: accuracy, test frequency, measured parameters, test voltage and test current. Additionally, an easy to understand display of test results and the ability to access and use these results has become increasingly important. Component testing often requires much more than simply a resistance, capacitance or inductance value at a given test frequency and stimulus voltage. An LCR meter or impedance meter must have the flexibility to provide multi-parameters over wide frequency and voltage ranges.
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Product
Digital Pattern Generator
Wave Gen Xpress
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A digital pattern generator is an essential stimulus source for almost every type of digital device: digital and mixed-signal ASIC, FPGA, microprocessors and microcontrollers. The digital pattern generator can be used early in the design cycle to substitute for system components that are not yet available.
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Product
Advanced Circuit Card Automated Test
ACCAT
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The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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Product
Engineering/Development System
ULTRA L
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The ULTRA L is a high performance “Lab” system that provides thermal conditioning, mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Product
Tri-Temp Strip Level Test Instrument
Apollon
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APOLLON is a tri-temperature strip-level test system for motion sensors. It is especially designed for high-end Automotive and Industrial applications. APOLLON offers extremely good testing conditions: high stimulus and temperature accuracy and low noise level.
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Product
COTS VME Board Tester
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*Developed for support of Virginia Class Submarine at the COATS Integration Facility.*Provides Stimulus and Measurement Subsystem (SMS) to control, monitor, and evaluate VME assets used in the Non-Propulsion Electronic System (NPES) of the submarine.*Provides Native Environment Subsystem (NES) that simulates the operational configuration of typical NPES installations, and permits the test and evaluation of several types of VME assets.
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Product
16-Channel 500kSa/s USB Modular Multifunction Data Acquisition
U2353A
Data Acquisition Module
The U2353A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2353A to simulate simultaneous analog input acquisition.
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Product
Modulation Distortion Up To 13.5 GHz
S930701B
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S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Manufacturing Defects Analyzer
406A
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The 406A is designed to target the highest number of assembly failures for the least amount of capital equipment cost, programming time, and maintenance costs. The precision Stimulus Measurement Unit provides AC/DC analog measurements that are accurate, stable, repeatable, and reliable.
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Product
CompactPCI & CompactPCI-X Bus Analyzer / Exerciser
CPCI850
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The CPCI850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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Product
64-Channel 1MSa/s USB Modular Multifunction Data Acquisition
U2331A
Data Acquisition Module
The U2331A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2331A to simulate simultaneous analog input acquisition.
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Product
Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument
785855-01
Digital Pattern
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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Product
Resolver to Digital and Digital to Resolver Converter
DP-VME-5031
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DP-VME-5031 is a Resolver to Digital and Digital to Resolver Converter module. This module has four resolver to digital converters as measurement channels and six digital to resolver converters as stimulus channels.
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Product
Modulation Distortion Up To 53 GHz
S95070B
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S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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Product
Arbitrary / Function Generators
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Today's designs are often complex, demanding a variety of stimulus signals during test. With standard waveforms, arbitrary waveform capability and signal impairment options, a Tektronix Function Generator supports a wide range of application needs with one instrument. Best-in-class Function Generator performance from Tektronix AFGs ensures signals are accurately reproduced.
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Product
Portable Functional Near-Infrared Spectroscopy System For Research
LIGHTNIRS
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Shimadzu Portable functional Near-Infrared Spectroscopy (fNIRS) System for Research* Near infrared light, which readily diffuses easily through biological tissue, can be used to measure localized blood oxygenation levels of the brain to monitor where activity occurs in response to a task of stimulus. The portability of LIGHTNIRS allows visualizing brain function activity in real time in a more natural state than other methods. Consequently, it is being used in a wide range of applications including medical research, developmental psychology, education, cognitive science and engineering.
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Product
ICAP/4 Consumer
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Looking to build electronic circuitry and watch its operation right on your computer? ICAP/4 Consumer is an easy to use program that does exactly that. ICAP/4 Consumer enables you to quickly construct any type of analog, digital or mixed analog-digital design, apply electrical stimulus, and view signal waveforms throughout the design.
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Product
NI-5741, 16-Bit, 1 MS/s, 16-Channel Signal Generator Adapter Module for FlexRIO
782864-01
Signal Generator
The NI‑5741 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs and general-purpose digital input and output lines for system stimulus and control. The NI‑5741 is ideal for applications requiring high-channel density and the power of a user-programmable FPGA. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the NI‑5741, you must pair it with a compatible PXI FPGA Module for FlexRIO.
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Product
USB Controlled Multi-Function DAQ For ATE Education And ATEasy Training
GT98901 Series
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The GT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all of which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol. Power for the board is provided via the USB interface, providing a totally self-contained assembly which can provide users with a simple yet complete vehicle that replicates many of the stimulus and measurement functions associated with ATE systems. When combined with Marvin Test Solutions' ATEasy® Test Executive and Test Development environment, the GT98901 is the ideal product for creating and supporting ATE training and education applications.
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Product
PCI and PCI-X Bus Analyzer / Exerciser
PCI850
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The PCI850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
