High Speed Data Recorders
See Also: Recorders, XY Recorders, Chart Recorders, Fault Recorders, Disturbance Recorders, Event Recorders, Transient Recorders, Temperature Recorders, Data Recorders
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Product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25H-10
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Frequency Surge Testers
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The 50KV Digital P J High Frequency Surge Tester is the most powerful tester in a class of its own. No other 50KV Surge Tester can pulse/resonate 60 pulses per second at a risetime of 100 nano seconds.This powerhouse is loaded with the TDS3012B Digital Phosphor colored oscilloscope with a built-in floppy disk drive.
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Speed Sensors & Controls
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Our highly engineered speed sensors are used in a wide variety of automotive systems to improve emissions, fuel economy, safety, comfort and reliability.
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Sound and Velocity Data
MIDAS SVX2
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The MIDAS SVX2 is the standard for the offshore Oil & Gas industry. Recognising the conflict faced by users requiring the superior Sound Velocity data from an SVP, but still needing the Salinity and Density data from a CTD, the Midas SVX2 combines both technologies to give the best of both worlds
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High Precision Electronic Load
PEL-8000
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PEL-8000 series adopts high-performance chip high-speed and high-precision design, providing resolution of 0.1mV, 0.01mA (basic accuracy is 0.03%, basic current rise rate is 2.5A / US)
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DCON RS-485 Data Acquisition
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DCON ASCII modules communicate over RS-485 and come in many analog and digital I/O configurations including current, voltage, thermistor, thermocouple, RTD, and strain gauge. They can be daisy chained together over insulated copper wires. The I-7000 series is distributes I/O communicate over DCON ASCII Protocol over RS-485 and are available in a bevy of digital and analog configurations, much like the M-7000 series. The tM series, tiny compact modules, communicate over Modbus RTU and DCON protocols and provide Analog and Digital I/O functions like isolated digital input, relay and open-collector output.
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High Current Probe HCF77206B250G300
1019016
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The High Current Probe HCF77206B250G300 (item number 1019016) is designed for electrical test and contacting tasks with elevated current loads. HCF77206B250G300 focuses on current capacity and low transition losses, as required in battery testing, formation and other e-mobility applications. For HCF77206B250G300, current capacity, low contact resistance and defined contact force are key to limiting electrical losses and unwanted heating. HCF77206B250G300 combines a pitch of 2.54 mm / 100 mil with tip style 06 (Serrated stepped) and a tip diameter of 2.5 mm. HCF77206B250G300 operates with 300 cN spring force and 4 mm nominal travel. The continuous-current rating of HCF77206B250G300 is 20 A.
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Data Acquisition & Analysis
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American Environments Co., Inc.
American Environments facilities are equipped with automated data acquisition systems.
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Product
IQ Data Bandwidth Up To 10 GHz
S93052B
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Send wideband IQ data (up to 10 GHz) to PathWave 89600 VSA software running on PNA/PNA-X/PNA-L network analyzers
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Product
High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1I40-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High Current Probe HCF73211B080G300
1008000
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The HCF73211B080G300 High Current Probe is designed to cater to the demanding requirements of power electronics applications. Built with precision and reliability in mind, this device can handle continuous currents up to 20 A while maintaining a minimal typical contact resistance of just 10 mΩ. With a temperature range spanning from -45°C to +200°C, it ensures robust performance across various operating conditions. Whether employed in testing or routine measurements, this probe provides excellent accuracy and stability for high-current applications.
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Product
High Speed Dielectric Cure Monitor
LTF-631
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The LTF-631 High Speed Dielectric Cure Monitor is designed for the study of rapidly reacting materials in research and development, quality assurance/quality control, and manufacturing applications involving thermoset materials such as resins, composites, paints, and coatings.
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-1H-10
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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USB Modular Data Acquisition
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The Keysight USB Data Acquisition (DAQ) family gives you the choice and flexibility to create standalone or modular solutions that expand and evolve according to your test requirement needs. Whatever your configuration, setup is easy with high-speed USB 2.0 connectivity: just plug the device into your PC and launch the bundled software.
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High Output Simulators
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The Abet Gen II optical design, patent pending, dramatically increases the percentage of photons reaching the work plane.All electronics are packaged in the lamp house – no clutter of high power cables to deal with. A digital shutter timer allowing both manual and external control is included with every unit.Standard maintenance, lamp or filter replacement, does not require any tools.Locking indicator dials on all the system controls provide for a reproducible and stable setup.
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1B-8-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Data Sharing Software Framework
Adlink DDS
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ADLINK DDS is a ubiquitous data sharing software framework based on the open and proven DDS standard that supports a wide range of device technologies, operating systems and programming languages. Combining deterministic data delivery, system-wide data sharing and support for data analytics, ADLINK DDS helps system integrators, OEMs, device platform vendors and Cloud service providers (SaaS, PaaS and DaaS) deliver software solutions for many vertical markets, including: Aerospace and Defense, Energy, Robotics, Healthcare, Transportation / Automotive and Industrial Automation.
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Data Acquisition And General Test
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Get the data you want, where, how and when you want it. Fluke gives you a broad choice in data acquisition for process monitoring and laboratory test systems. You can choose a stationary or portable data logger. Transfer data to internal memory, to a removable memory card, or to your PC. Choose a standalone or distributed networked units. And you can expand your system from 20 to 1,000+ channels, depending on the series.
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Modbus TCP Data Acquisition
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Modbus TCP based Data Acquisition Modules in a analog and digital I/O configurations including current, voltage, thermistor, thermocouple, RTD, and strain gauge. Some are powered over Ethernet, some have two Ethernet ports and some can send email alarms and trigger outputs based on inputs.
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High Pressure Leak Tester
HPT 500
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A cost-effective, safe alternative that will change standard practices for heavy duty preventive maintenance and repair.
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Ultra High 3.83 (109.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-72T38-10
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Advanced Data Acquisition And Control System
ADACS
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This high-speed damage-control system was built around Arc Fault Detect and Continuous Thermal Monitoring (AFD/CTM) from the Johns Hopkins Applied Physics Laboratory. When AFD/CTM detects dangerous arc faults — powerful discharges of electricity between conductors — the ADACS system immediately cuts power to the affected circuit before it can damage equipment or injure nearby personnel. Altogether, the system prevents loss of life, preserves countless repair dollars and assures continuous readiness.
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1I-10
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Portable Paperless Recorder
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5.7” Colour TFT LCD (320 x 240) with Backlight8 Input Temperature Measurement / Logging (ºC/ºF )Colour Graphic Display of 8 Curves at the same timeDigital & Analog (bargraph) Data DisplaySelection of 11 Types of Thermocouple (K, J, E, T, R, S, N,..)Easy Socket for Thermocouple Mini ConnectorBasic Accuracy 0.05 % ± 1ºC (K Type)28 Hours Recording with Lithium Battery of 3400 mAHStatistics Data (Histogram) for easy AnalysisProgrammable Hi-Lo Alarm with TimerDisplay of Max & Min Values for each InputSampling Rate 8 Inputs / 1 SecondHide or Display Selected CurvesStandard 2G SD Memory Card (Stores 3.8 Year of Data)SD Card Directly Read by PCRead & Delete Data files DirectlyBuilt-in Calendar ClockAccept Analog Outputs from InstrumentsScreen Hardcopy for Easy Documentation Ready to Use Package ( Thermocouples, SD Card & Battery)
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Dynamic High Pressure Sensors
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Columbia Research Laboratories
Columbia's line of Dynamic Pressure Sensors can also serve as Acoustic Sensors (Microphones). They are designed to measure fast pressure variations, surges and dynamic blasts. The Sensors vary from low cost, small size, and lightweight to High Pressure (to 10,000psi) units, with all-welded contructions for extreme ruggedness, making them excellent choices for a wide range of applications.
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High Temp Loggers
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Bendable probe with rigid tip, measures up to 662°F (350°C)Monitor temperature inside bottles, vials, hard-to-reach placesHighly accurate over wide measurement rangeN.I.S.T. traceable calibrationRugged, submersible, for use in harsh environmentsNon-volatile solid state memory for maximum data securityUser replaceable batteryEasy to program and download
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High Insulation Digital Clamp Tester
HCL-3000+
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MULTI MEASURING INSTRUMENTS Co., Ltd.
・AC current measurements for 20mA~200A.・Easy operation, Push to Open and Pull to Disconnect Mechanism.・Safe AC current measurements for high voltage circuit (AC80 to 7000V).
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High Voltage, High Current Linear Amplifier
P100
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The P100 is a general purpose linear amplifier having a fixed amplification of 10 times and capable of bipolar high voltage output of ±50V. Any functiongenerator or arbitrary waveform generatoror any othe signal source with amplitude up to ±10 V can be used as an input device.
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1L-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Frequency Synthesizer
HFS Series 1.25” x 1” x 0.25”
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*Surface Mount Package *Broadband Designs Available *Optional Internal Reference *Optional Reference Detect Switch *Internal Reference Output Available *Off-the-Shelf Products Available





























