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Programmable Digital Attenuator
LDA-602EH
The LDA-602EH has a large attenuation range of 120 dB with an exceptional 0.1 dB step size, allowing for both precision and accuracy during fading tests or device characterizations. This attenuator also features a fast 15 us switching speed, an operating temperature from -30oC to 50oC, a maximum RF input of +28 dBm, and is priced at $875. The LDA602-EH operates with a low insertion loss of 9 dB to 6 GHz, an input IP3 of +55 dBm and a typical VSWR of 1.3:1. Easily programmed for ATE applications, the LDA digital attenuators are a cost effective solution whether you are in engineering, the production test lab, or in the field. Units are ROHS compliant and can be used with any PC or laptop computer with USB 2.0 port (or powered USB hub) and Windows operating system. Lab Brick Signal Generators are provided with easy to use Lab Brick GUI software, 32 and 64 bit API DLL files, LabVIEW and Linux compatible drivers.
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Solar Photovoltaic
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film.
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Amplified Spontaneous Emissions (ASE) Sources
The AP505xA series, high power ASE sources provide stable output power up to + 23dBm and broad flat spectrum over C+L band or T band. They enable effective and efficient measurements for component characterization or optical sensing. Finally, these products are proposed in friendly-user stand alone benchtop instrument with touch sensitive screen, GPIB, ethernet, RS-232 or USB controls.
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PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
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Low Leakage Switch Mainframe
B2201A
The B2201A reduces the cost of test by enabling characterization tests to be automated, with only slight compromise to the measurement performance of the semiconductor parameter analyzer. It supports a 4-SMU, full-Kelvin configuration and a capacitance meter, with room for future expansion. Includes 14 inputs, each with a unique internal measurement path, and a distinctive capacitance measurement compensation feature for two of the inputs. Provides front panel control via keypad or optional light pen, and supports instruments such as pulse generators.
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Amplifier Characterization With Wideband Modulated Signal
N5245BV
The N5245BV provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for amplifier measurements with modulated signal such as EVM, NPR and ACPR in addition to gain, gain compression, IMD and other measurements.
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QFN/QFP35 Sockets
Test sockets are designed for testing today’s high-performance QFN, QFP, DFN and SOIC devices. For development, characterization, at speed burn-in, and low volume production manual testing.
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Solar Cell I-V Characterization System
VS6825
Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
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Test bench for Infrared Focal Plane Array detectors
BIRD
The BIRD bench enables characterization of any types of Infrared Focal Plane Array (IRFPA) detectors.
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Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope
780319-01
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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High Temperature Test System
129620A
Solartron Analytical, specialists in the design of precision impedance test equipment, has joined forces with high temperature Furnace specialists Carbolite, and sample holder specialists NorECS to produce a range of advanced high temperature materials characterization test systems.
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Optical Measurement Methods and Characterization Services
The Fraunhofer IOF develops optical measurement methods and systems to customer requirements. Key areas include the characterization of optical and non-optical surfaces, coatings, components and systems in the micro and sub-nano range as well as 3D shape acquisition.
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PNA-L Microwave Network Analyzer
N5235B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to50 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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RCS Software
CEMExpert
CEMExpert is a software dedicated to the prediction of radar cross-section of aerial and naval targets. The software uses both the high-frequency asymptotic method (PO-PTD) as well as the full-wave equation solver (FVTD). A quick calculation is made possible by automated meshing, scripts for azimuthal scan and parallel processing. The software has been used for improving stealth performance of UAVs, for shape optimization of naval ships and RCS characterization of target missiles.
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Edge and Backside Inspection
LIGHTnPS
• Best in class throughput• High surface sentivity• Full haze characterization• High lifetime / low CoO solid state laser• Advanced Automatic Defect Classification
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Lab Equipment
LABORATORY MEASUREMENT SYSTEMS FOR CHARACTERIZATION AND OPTIMIZATION IN THE PRODUCTION OF SOLAR WAFERS AND CELLS
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Laser Source
TW3109
Techwin(China) Industry Co., Ltd
can provide 1 to 4 output wavelengths to meet specific requirements, including the 650nm red source and the 1310/1550nm wavelengths for single mode fiber or the 850/1300nm wavelengths for multimode fiber, as well as other wavelengths according to customer needs. Together with the TW3208 optical power meter, it is a perfect solution for the fiber optic network characterization.
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Vector Tester
PVT360A
The R&S®PVT360A is a VSG/VSA single-box vector tester optimized for FR1 base station, small cell and RFcomponent testing in production and characterization environments. Two independent signal generatorsand analyzers enable fast parallelized measurements. A frequency range of up to 8 GHz, flexible bandwidth configuration and an optional second TRX channel provide the necessary performance and enable flexible adaptation in a small form factor.
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High Frequency Coaxial Analytical Probes
D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm differential, single-ended probe.
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Modulation Distortion Up To 50 GHz
S930705B
S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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PathWave BenchVue Electronic Load App
BV0012B
Easily control your dynamic electronic loads, build automated tests and visualize measurements over time for better device characterization.
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Portable Cryogen-Free Cryocooler-Based Material Characterization Platform
PPMS® VersaLab™
Quantum Design’s PPMS VersaLab is a portable, cryogen-free cryocooler-based material characterization platform. With a temperature range of 50 – 400 K, this 3 tesla platform is perfect for accomplishing many types of materials characterization in a limited space.
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Liquid Cooling High Amp
qCf 12 High Amp
qCf Liquid Cooling High Amp: Our system for the professional characterization of fuel cells for high current densities and direct flow field cooling.
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PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-02
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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Signal Path Analyzers
HL2200 Series
HYPERLABS HL2200 Series Signal Path Analyzers™ provide high-performance test and measurement capabilities for a fraction of the cost of traditional benchtop systems. These differential, multi-channel instruments are ideal for interconnect characterization, debugging cable assemblies, coupon testing, controlled impedance analysis, and other applications requiring a fast rise time.
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White Light Continuum Generator
JIBE
A powerful coherent light source. Due to its amazing wide spectral band, the white light continuum is being applied in different areas such as optical parametric amplification, optical metrology, optical coherence tomography, materials characterization, etc.
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PNA-L Microwave Network Analyzer
N5234B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to43.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Optical Return Loss (ORL) Meter
OPTOWARE-S300 (FOTS-ORL Meter Systyem)
The Optical Return Loss(ORL) Meter is an efficient system for the characterization and test of optical components and systems to be performed in high quality.
