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Electron Microscope Sample Preparation
Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Magnetic Permeability Meter Ferromaster
Instrument for easy measurement of the relative magnetic permeability µr of feebly magnetic materials and workpieces with a permeability between 1.001 and 1.999. The permeability is measured by touching the workpiece with the probe tip and reading the result from the display. Typical applications are: non-destructive testing of materials, e. g. quality control of stainless steel, material selection for electron-/ion-beam equipment, detection of material defects induced by mechanical or thermal stress.
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Manipulators
The patented Nanomotor is the heart of any manipulator. Three independent linear stages are used in every single manipulator. The manipulator provides 0.5 nm resolution in all three axis. All manipulators can be used in air setups or inside of electron microscopes. Docking stations allow an easy transport between any setup.
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Temperature Test Chamber
Temperature Test Chamber is designed for testing the capability of heat-endurance, cold-endurance, dryness-endurance, and humidity-endurance, suitable for quality control of the industries of electron, electrical equipment, vehicle, metal, foodstuffs, chemistry, building materials, luggage, adhesion tape, printing, packaging, etc.
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High Power Microwave Plasma System
The High Power Microwave Plasma System features the High Power Microwave Plasma Source, generator (with isolator) and auto-tuning system comprised of the Precision Power Detector and SmartMatch® unit. This comprehensive system delivers a high concentration of radicals with low electron temperatures for the highest dissociation and lowest recombination rates.
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Radiation Microdosimeters
Teledyne e2v HiRel Microdosimeter is a compact hybrid microcircuit which directly measures total ionizing dose (TID) absorbed by an internal silicon test mass. The test mass simulates silicon die of integrated circuits on-board a host spacecraft in critical mission payloads and subsystems. By accurately measuring the energy absorbed from electrons, protons, and gamma rays, an estimate of the dose absorbed by other electronic devices on the same vehicle can be made. The Microdosimeter can operate from a wide range of input voltages. The accumulated dose is presented to three dc linear outputs and one pseudo-logarithmic output giving a dose resolution of 14 µrads and a measurement range up to 40 krads. These outputs are intended to be directly connected to most analog-to-digital converters (ADCs) or spacecraft housekeeping analog inputs (0-5 V range), which makes minimal demands on the host vehicle. The Microdosimeter incorporates a test function to allow electrical testing of the hybrid without the need for a radiation source.
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Scanning Auger Nanoprobe
PHI 710
The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
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Metrology/SEM
Our SEM products use scanning electron microscope technology to measure and review tiny surface structures such as photomask etching and circuitry on wafers with high precision and stability.
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Analysis System
Trident (EDS-EBSD-WDS)
The Trident Analysis System combines the latest advances in Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Wavelength Dispersive Spectrometry (WDS) in a single analytical tool. With the Smart Features included in the easy to use EDAX analysis software, each technique can be optimized and used independently or they can be combined to provide seamless integration, resulting in comprehensive data collection that can then be shared between the different techniques.
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Gunn Diodes
The Gunn diode is the best known and most readily available device in the family of transferred electron devices (TED). They are employed as DC to microwave converters using the negative resistance characteristics of bulk Gallium Arsenide (GaAs) and only require a standard, low impedance, constant voltage power supply, thereby eliminating complex circuitry. Teledyne Lincoln Microwave’s DC1200 series of GaAs Gunn diodes is designed for operation at fixed frequency (determined by the oscillator cavity) within a specified band under CW or pulsed conditions.
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Failure Analysis
A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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Ion & Electron Detection
Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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Electron Sources
SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Electron Probe Microanalyzer
EPMA-1720
Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
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Tube Tester / Tube Checker
RM 1
Using the RM 1 Tube Checker it is immediately possible to do an exact plate current measurement without doing the often very toilsome procedures mostly necessary with classical devices. Put the electron tube, which should be measured, simply into the accordingly marked test socket, switch the equipment on, select the socket by using the rotary switch (it is indicated by a LED), wait for approx. three minutes till the tube is working stabile and read off the value on the panel meter.
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Electron Backscatter Diffraction (EBSD) Camera
Velocity™
high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
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Scanning Electron Microscopes
Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Sensitive Terahertz Detectors: Cooled Terahertz Detectors Based On Hot Electron Bolometer (HEB) And Room Temperature Terahertz Detectors Based On Golay Cell.
Insight Product Company offers Cooled and Room Temperature Terahertz (THz) Detectors
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PED Systems
Pulsed Electron Deposition
Is a process in which a pulsed (80-100 ns) high power electron beam (~1000 A, 15 kV) penetrates approximately 1 μm into the target resulting in a rapid evaporation of target material. The non-equilibrium heating of the target facilitates stoichiometric ablation of the target material. Under optimum conditions, the target stoichiometry is preserved in the deposited films. All solid state materials – metals, semiconductors and insulators, including those transparent to laser wavelengths in PLD – can be deposited as thin films with PED. By combining PLD and PED, the range of complex materials that can be prepared as thin films can be greatly enhanced.
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Fast Low Noise SWIR InGaAs Camera
C-RED 2
C-RED 2 is a revolutionary ultra high speed low noise camera designed for high resolution Short Wave InfraRed imaging. Thanks to its state of the art electronics, software, and innovative mechanics, C-RED 2 is capable of unprecedented performances: up to 400 images per second with a read out noise from 10 to 30 electrons. Designed for high-end SWIR applications, smart and compact, C-RED 2 is operating from 0.9 to 1.7 μm with a very good Quantum Effi ciency over 70%, offering new opportunities for industrial or scientifi c applications.
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Scanning Electron Microscope
SEM
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Field Testing Equipment for 3 Phase Energy Meter
SY3002
Hong Kong Songyang Industrial Ltd.
The field-testing instrument SY3002 is made by using the newest international digital electron technical skill To use DSP processor, as the axis to install this intelligent comprehensive automation field-testing instrument, which comes with a portable computer, the 11.3" colorful display screen, and Chinese characters operation menu suggestion.
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FAST SDD and C2 Window
EDS (SEM) Applications
Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
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Scanning Kelvin Probe Microscope
VS-SKP
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Charge Sensitive Preamplifier-Discriminator
A101
Model A101 is a hybrid charge sensitive preamplifier, discriminator, and pulse shaper developed especially for instrumentation employing photomultiplier tubes, channel electron multipliers and other low capacitance charge producing detectors in the pulse counting mode. The A101 is widely used in laboratory and commercial applications for mass spectrometers, laboratory and research experiments, aerospace instrumentation, medical electronics, and electro-optical systems.
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Analog Communication Trainer
Analog Communication is a data transmitting technique in a format that utilizes continuous signals to transmit data including voice, image, video, electrons etc. An analog signal is a variable signal continuous in both time and amplitude which is generally carried by use of modulation.
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Scanning Electron Microscope
E5620
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
