Mapping
See Also: Wafer Mapping, Survey
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Product
Pressure Mapping
BPMS
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Measure pressure distribution between the human body and support surfaces such as seats, mattresses
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Product
Concrete Corrosion Mapping System
15620
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Our Concrete Corrosion Mapping System (CCMS) can be used to satisfy the ASTM C-876 standard test method and the kit contains all equipment items that are needed to perform a corrosion survey on virtually all types of reinforced concrete structures, such as bridges, highway slabs and parking garages.
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Product
Pin-Mapping for Custom Connectors, Test Fixtures, UUTs | Cable & Harness Testers
PinMap™
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Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester.
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Product
Stress Mapping System
413 Series
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Substrate and tape total and individual thicknesses, warpage, and TTV Measurement. Able to measure with or without backing tape. For wafer back-grind and etch thinning processes control. Non-contact Echoprobe or VITE Technology. Thin film and surface roughness options.
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Product
Stress Mapping System
900 Series
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Stress Hysteresis in vacuum or gas up to 900C for the study of annealing cycles. Thermal Desorption, Film Shrinkage, Reflectivity, and Resistivity options provide additional insight to causes of material changes with temperature. NEW: Optional wafer rotation offers unique 2D/3D mapping to study wafer deformation as a function of temperature.
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Product
Film Thickness Mapping Systems
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Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer mapping (SRM) tools are for industry or lab routine thin film uniformity measurement. This is relatively low cost and easy to use setup. Mapping size can be configured from 2" to 18" if needed. Dependent on film thickness range, a broad wavelength range can be configured within DUV, Vis and/or NIR range. A user-friendly software interface allows you to define various mapping patterns to map. A CCD array based detecting and data acquisition mechanism offers fast measurements. 2D/3D data presentation gives user option to quickly generate reports.
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Product
Retail Foot Mapping
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Tekscan works with you to develop customized solutions that maximize customer engagements, advance consumer satisfaction, and increase sales.
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Product
Temperature Mapping
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Measure temperature between two surfaces, utilizing a thin and flexible sensor. The resulting data and our analysis tools offer insights to enhance product design, manufacturing, quality, and research.
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Product
Photoluminescence Mapping System
VS6845A
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Industrial Vision Technology Pte Ltd.
With its unique optical design technology, the System detects and classifies defects that affect yield and uses advanced photoluminescence (PL) technology to enable real-time monitoring of MOCVD production processes.
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Product
Non-Contact Mapping Life Time System
MWR-2S-3
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The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Product
Validation, Mapping and other Services for GxP Regulated Applications
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The individuality of your GxP application may require a variety of function-specific settings and measurement systems. Benefit from our know-how and let our application engineers design the optimal measuring system for you. With our consulting services in GxP, we support you from project planning (URS) to implementation and testing of your system. This ensures an optimal and efficient design.
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Product
Cable + Network Tester
LinkIQ
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The LinkIQ™ Network+Cable Tester is designed to provide trusted cable testing along with network testing professionals need to do their jobs. LinkIQ™ validates cable performance (up to 10 Gig) using frequency-based measurements and provides distance to fault information along with a wire map of the cable under test.
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Product
X-ray Fluorescence, XRF Analysis Services
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Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Product
Ocean Surveyor
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Teledyne Marine RD Instruments
For decades, Teledyne RD Instruments has been the preeminent supplier of Acoustic Doppler Current Profiling (ADCP) instrumentation for open ocean applications. Teledyne RDI’s vessel-mounted Ocean Surveyor family of ADCPs continues to raise the bar, collecting detailed maps of the distribution of water currents and suspended materials through the water column and along the ship’s path - at depths and resolutions previously considered unattainable. In real time, the ADCP is also used to aid in situ decision-making, to adapt field operations, and to understand current regime characteristics.
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Product
TestTools for Lab & Field
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Analyzer designed to be used on the field to generate maps including measurements of the field quality of service, enabling identification of reception issues and efficient troubleshooting.
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Product
RF Near Field Scanner
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The TEM Consulting near field scanner is a high precisions positioner that supports the precise movement of field probes. Using our scanning positioner field maps of planes and volumes can be developed to assist engineers in antenna design, analyzing and solving EMC problems and mapping signal intensity.
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Product
Terrameter LS 2
ABEM
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Now Guideline Geo is introducing a new unique IP feature using 100 % duty cycle. This means twice as fast data collection and double the signal to noise ratio compared to the conventional IP method (50%) using the same settings.Resistivity/IP surveying is a versatile geophysical method suitable for a broad range of applications and environments such as groundwater prospecting, mineral exploration, geological mapping and geotechnical investigations. Depending on the application used, system designs can vary. ABEM Terrameter LS 2 has been made available in many different configurations to perfectly match your requirements.
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Product
Process Analytics
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The data-driven examination of business workflows to map, monitor, and improve performance in real time.
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Product
In-Circuit Emulator - 80C186/80C188 Family
DS-186
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* Support for 80C186/8/XL/EA/EB/EC, 8086/8, V20/25/30/40/50 and other Microprocessors * Full-speed Emulation up to 25MHz * 1MB of Zero-Wait-State Mapped Memory * 8K x 32-bit Frames Dynamic Trace Buffer * 1MB Hardware Breakpoints * 115 KBaud RS-232 Communication Link * Numeric Coprocessor Support * OMF Converter * Support for Borland, Microsoft and Intel Compilers * Full Support for C, C++, Pascal and Assembler
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Product
Cyber Forensics
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Cyber Forensics deals in safeguarding the digital evidence gathered during the cyber attack, identifying the duration of the attack, and locating the geographical location of the attack followed by mapping them.
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Product
Thermal Image Analysis Software
Thermalyze
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Thermalyze software provides a stable platform from which to perform sophisticated temperature analysis and failure analysis testing. Tools such as Emissivity Tables allow you to perform true temperature mapping on the surface with varying emissivity. Lock-in thermography tests enable you to detect heating below 0.001°C.
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Product
Intelligent Displays
Military Clocks DTG Series
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The DTG series supporting (DTG) format date-time group format which is used in the Military’s message traffic (a form of Automated Message Handling System). For example In US military messages and communications (e.g., on maps showing troop movements) the format is DD HHMM (SS) Z MON YY. Although occasionally seen with spaces, it can also be written as a single string of characters. Plura DTG series can support these three different formats:-
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Product
kSA Scanning Pyro
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For use on Veeco K465i and EPIK700 MOCVD reactors, the kSA Scanning Pyro performs automated temperature mapping in order to measure temperature variations across wafer carriers and wafers. Use it to tune heater zones and optimize process and hardware to achieve higher yields, wafer uniformity and device performance.
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Product
Pipe And Cable Locators
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Professional-grade electronic tools used to detect, trace, and map underground metallic utilities like water pipes, gas lines, and electrical cables.
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Product
Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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Product
Defect Isolation
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*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB
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Product
Wafer Mapping Sensor
M-DW1
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Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Product
Fast Portable Spectral Sensors
Turbo FT
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This compact field and industrial instrument is used for both ground based and airborne applications requiring high speed spectrometry, and utilizes our patented Turbo FT technology. Applications in remote sensing for geological mapping, airborne chemical agent detection, and online process control systems. Our rugged and compact design allows you to "Take It There".
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Product
Time-of-Flight Sensors
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STMicroelectronics’s 4th generation of FlightSense™ sensors offer a multi-zone ranging sensor able to create a 64-zone mini depth map up to 4 m.
