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Logic Probes
Analyze the logic state of a digital circuit.
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Logic Probes
Logic probes are used to analyze the logic states (high/true: logic 1 or low/false: logic 0) of digital signals. To verify and debug today’s high-speed, low-voltage digital signals, you need logic probes that can accurately acquire signals from a wide variety of electronic designs, while protecting signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance. Compare and learn more about Tektronix logic analyzer probe solutions below.
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DDR5 Logic Analyzer
FS2602
The FS2602 is our the latest logic analyzer probe used to test DDR5 SO-DIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 SO-DIMMs running at ~4000MT/s.
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Active Probe, 2 GHz
N2796A
The N2796A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±12 V), the probe can be used in a wide variety of applications.
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Semiconductor Test Equipment
Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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LASAR Post Processor, Run Time And Diagnostic Test Solution
DtifEasy Series
DtifEasy is a full-featured tool set for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy; providing the user with the ability to execute go/no-go, fault dictionary, and guided probe sequences. DtifEasy supports MTS' 3U PXI GX529x series of dynamic digital instrumentation to 200 MHZ as well as the 6U PXI GX5960, 50 MHz digital instrumentation. All of these instrument families are compatible with the digital logic probe.
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Cantilever Probe Card
MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fine pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements. With outstanding craftsmanship, innovative architecture and proven methodologies based on mechanical and electrical simulation/measurement results, making MPI the top cantilever provider worldwide.
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DDR3 X16 Non-Stacked DRAM BGA Interposer For Logic Analyzers
W3636A
The W3636A DDR4 x16 BGA interposer allows you to gain signal access to the DDR3 signals critical to your debug and validation effort through a logic analyzer. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DDR3 x16 non-stacked DRAM or with an optional 3rd party socket (not provided) enabling operation and acquisition of high-speed DDR3 signals without impacting the performance of your design.
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T3DSO2000HD Series Oscilloscopes
T3DSO2000HD Series
The Teledyne Test Tools T3DSO2000HD Oscilloscopes feature four channel bench models with analog bandwidth options of 100 MHz, 200 MHz and 350 MHz all with 12 bits of vertical resolution. The series offers both DSO and MSO configured models with the MSO units having a 16 channel logic probe as standard. Each model offers a maximum sample rate of up to 2 GSa/s sample rate (interleave mode), and a maximum memory depth of 200 Mpts in interleave mode.
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Logic Analyzers
Verification and debug of today's high speed, low voltage digital signals requires probing solutions that can accurately acquire from a wide variety of electronic designs and protect signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance. Compare and learn more about Tektronix logic analyzer probe solutions.
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Protocol Analyzer
BusFinder
*PC-based, 64 channels*USB 3.0 interface, 12V power adaptor*32Gb total memory*Protocol Analyzer：eMMC5.1, NAND Flash, SD3.0, SD 4.0 (UHS-II)*Logic Analyzer：eMMC5.1, NAND Flash, SD3.0, Serial Flash, SPI NAND, SPI*Each protocol has its own probe for easier connection, higher capture quality*Two sets of voltage detects to detects voltage changes
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DIMM Interposer Probe
FS2361
The FS2361 is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154/64 Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 DIMMs.
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Logic Analyzer
FS2352B
The FS2352B is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR3 DIMMs. This logic analyzer probe has a CKE qualification circuit that allows for the use of older Keysight logic analysis modules when testing systems using power saving modes.
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Logic Analyzer Probe
FS2600A
The FS2600A is our newest and fastest logic analyzer probe used to test DDR5 RDIMM and LRDIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 RDIMM/LRDIMMs and DDR5 Memory Channels.
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DDR4 X16, 2-Wing, Small KOV, BGA Interposer For Logic Analyzers
W4636A
The W4636A DDR4 x16 – 2 wing BGA interposer for 96 ball DDR4 DRAM is designed for data rates up to and including 2.4 Gb/s. The W4636A probes all ADD/CMD/CNTRL and partial DQ/DQS, and it is designed for minimal KOV for space limited systems under test. The W4636A is the least expensive DDR4 BGA interposer for a logic analyzer.
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RC BGA Interposer, LPDDR4 200-ball, Rigid, Connects Using 2x U4207A
W6602A
The W6602A LPDDR4 rigid RC BGA interposer for LPDDR4 200-ball DRAM enables capture of simultaneous read and write traffic at data rates and has been tested to 3200 MT/s. Two U4207A zero Ω, 34-channel, soft touch pro, single-ended, 4 x 160-pin direct connect probes are required to connect the W6602A LPDDR4 BGA interposer into two U4164A logic analyzer modules. The W6602A LPDDR4 rigid RC BGA interposer allows signal access to the LPDDR4 signals critical to your debug and validation effort through a U4164A logic analyzer system. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DRAM using a LPDDR4 200-ball riser (included) or an optional 3rd party socket (not provided), enabling operation and acquisition of LPDDR4 signals.
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DDR5 Logic Analyzer
FS2601
The FS2601 is one of our newest and fastest logic analyzer probes used to test DDR5 memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 UDIMMs running above 4000MT/s.
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Logic Analyzer Probe
FS2512
The FS2512 is a logic analyzer probe used to test DDR4 SO-DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154A/B/64A logic analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR4 SO-DIMMs.
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Logic Probe
HH2601
Handy, quick and easy to use tool. For DTL, TTL and CMOS testing. High frquency response. Instant indication. Pulse memory function. Size: 180mm x 30mm x 20mm
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Acute 4GS/s 68 Channel Logic Analyzer With 32Gb Memory
Acute LA3068B+
*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis*32Gb RAM*Active Probes*Logic, State, Protocol triggers
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Oscilloscope, 100 MHz, 2 GS/s interleaved, 4 CH, 200 Mpts/Ch DSO, Fully Loaded with 10.1" Color Display
T3DSO2104HD
The T3DSO2000HD series of Bench Oscilloscopes feature 4-channel models with analog bandwidth options of 100 MHz, 200MHz and 350 MHz. The T3DSO2000HD Oscilloscopes use 12-bit high resolution ADCs and a low noise front end which provides an impressive noise performance to cover a wide range of measurement applications. Each model offers a maximum sample rate of 2 GSa/s (interleaved) and a maximum memory depth of 200 Mpts in interleave mode. The MS configured models also include a 16 channel logic probe as standard.
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Eclipse Test Development Environment
The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Cantilever Probe Cards
Venture
Nidec SV Probe’s VentureTM line of cantilever probe cards represents the finest epoxy technology on the market and are perfect for logic testing. The Venture line includes an extensive array of cantilever cards, single to multi-die for a variety of test systems. Other capabilities include: • 3K Points • Pad Pitches as Tight as 35µm • Up to 32 DUTsContact your Nidec SV Probe sales representative to determine which VentureTM product is right for your testing application.
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Logic Analyzer Probe, 20 MHz, 4VDC to 18VDC
72-190
A compact and lightweight probe for the analysis and troubleshooting of logic circuits. The probe will recognise high, intermediate and low level pulses in DTL, TTL, HTL and CMOS logic circuits. Works as a pulse detector, pulse stretcher and a pulse memory.
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Oscilloscope, 100 MHz, 2 GS/s interleaved, 4 CH, 200 Mpts/Ch interleaved, Fully Loaded DSO with 16 Dig Ch MSO
T3DSO2104HD-MS
The T3DSO2000HD series of Bench Oscilloscopes feature 4-channel models with analog bandwidth options of 100 MHz, 200MHz and 350 MHz. The T3DSO2000HD Oscilloscopes use 12-bit high resolution ADCs and a low noise front end which provides an impressive noise performance to cover a wide range of measurement applications. Each model offers a maximum sample rate of 2 GSa/s (interleaved) and a maximum memory depth of 200 Mpts in interleave mode. The MS configured models also include a 16 channel logic probe as standard.
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Logic Analyzer Probes
Three probe types are available for GoLogicXL logic analyzers: flying leadset, Mictor, and Pinpoint probes. The Mictor and Pinpoint probes are compatible with similar Keysight/Agilent "soft touch" and Tektronix "connectorless" probes. All GoLogicXL probes are coaxially shielded and use passive termination inputs to prevent loading the device under test. Both differential and single-ended input signals are supported by all probes. Input voltage swings small as 300 mV are supported in single-ended mode, and 150 mV for differential signals.
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Computer Safe Automotive Logic Probe
TE6-0718
Hangzhou Tonny Electric & Tools Co., Ltd.
*For use on 6V, 12V and 24V DC systems*Tests high and low voltages on all vehicle circuits, including computerized engine and body controls*Dual color LED indicates red for power and green for ground
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Oscilloscope, 350 MHz, 2 GS/s interleaved, 4 CH, 200 Mpts/Ch DSO, Fully Loaded with 10.1" Color Display
T3DSO2354HD
The T3DSO2000HD series of Bench Oscilloscopes feature 4-channel models with analog bandwidth options of 100 MHz, 200MHz and 350 MHz. The T3DSO2000HD Oscilloscopes use 12-bit high resolution ADCs and a low noise front end which provides an impressive noise performance to cover a wide range of measurement applications. Each model offers a maximum sample rate of 2 GSa/s (interleaved) and a maximum memory depth of 200 Mpts in interleave mode. The MS configured models also include a 16 channel logic probe as standard.
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Logic Analyzer Probe
FS2520
The FS2520 is our newest and fastest logic analyzer probe used to test DDR4 DIMM memory. It is designed to work exclusively with 3 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR4 DIMMs running above 4000MT/s. It’s like having a 100 channel scope.
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S2 Blinx Digital Sensors
ULP-S2 BLINX
The Universal LightProbe S2 Blinx Digital is designed for the simple ON/OFF test of any color blinking or steady-state LED, for fast results with a digital output. The Universal LightProbe S2 Blinx Digital Sensors check the ON/OFF status of any color LED, whether stable or blinking/pulsed, up to a rate of 15 Hz, and provide a Logic “1” output (5 volts) only if the LED is “ON” and a Logic “0” if the LED is “OFF.”Operating temperature range: 0oC to 70oCPower consumption: Operates from +5, 12, 24 or 28 volts D.C., at 6mA max.Voltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsSignal Output Load: 20mA max. (Source/Sink). Non-inductiveOutput Pins: 3 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. longOperating Temperature Range: 0hC to 70hCTypical response times: <66mS, shorter for brighter LEDsFiber-Optic Probes: Wide Aperture Fiber-Optic Probe recomended
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Active FET Probe Kit 1.2 GHz, 10x, ±40 V
CT4121
The CT4121 is a compact FET probe with very high input resistance and low input capacitance. With a 1.2 GHz bandwidth, this probe is ideal for timing analysis or troubleshooting high speed logic circuits, for design verification of disk drives, as well as for wireless and data communication design. The CT4121 can measure up to ±40 V (DC + AC peak). Compatible with oscilloscopes from all major manufacturers, the probe is powered by the included 9 V battery or direct from the oscilloscope using the included USB power lead.
