Test Connectors
-
Product
VLSI Test Systems
-
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
-
Product
Communications Test System for Frontline Diagnostics
ATS3000P
-
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
-
Product
Physical Layer Test System
N19301B
-
The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
-
Product
In-Circuit Test
TestStation LH
-
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
-
Product
SoC Test System
T2000
-
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
-
Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
-
Stopper kit includedYAVCANCON2 for fixture identification not included
-
Product
Scienlab Battery Test System – Module Level
SL1001A Series
-
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
-
Product
Connector, 104-Pin D-Type Female, Solder Bucket, 5A, 4-40 UNC Screwlocks
C104DFR-2SB-1A
-
This 104-pin female D-type connector allows users to create their own cable assemblies. Cable connection is via solder buckets - supplied with rear cable entry backshell. This connector is suitable for use with Pickering modules that use the 104-pin D-type connector.
-
Product
Memory Test System
T5801
-
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
-
Product
Regenerative Battery Pack Test System
17020E
-
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
-
Product
Test Handler
M6242
-
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
-
Product
68-Pin SCSI Micro-D Conn Block DIN
40-966-068-M
-
Suitable for mounting on DIN Rails this connector block provides a simple method of connecting to 68-Pin SCSI Style Micro D connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage. The metal shell includes an internal insulation barrier under the carrier board.
-
Product
9-Pin D-Type, Right Angled PCB, Male,HV
40-963-009-RM-HV
-
9-Pin Male Right Angled D-Type Connector, High Voltage - PCB Mount
-
Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
-
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
-
Product
Functional Test System
TS-5040
-
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
-
Product
Solder Cup Connector Kit
Y1140A
-
Used to build custom cables for 34922, 34924 – 78-pin Dsub female – 60 V
-
Product
68-Pin SCSI Micro-D Male Connector Block
92-965-068-M
-
This connector block provides a simple method of connecting to 68-Pin SCSI Style Micro-D connectors. The screw terminals use a rising cage clamp mechanism to minimize risk of copper strand breakage.
-
Product
Iridium Physical Layer Test Systems
PLTS
-
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
-
Product
25-Pin D-Type Male Right Angled PCB
40-963-025-RM
-
Accessory allows a user to create their own PCB based termination solution mounted directly on the front of the product or on the end of a cable. Interfacing PCBs should be designed with suitable clearances for the voltage the application requires. 25-Pin Female connectors can be directly mated to a corresponding Pickering Switching Module while Male versions can be used to interface to a Female cable assembly termination.
-
Product
SCB-12, Nano-Pitch Connector Block, 8 SE DIO, 1 QSFP+
787419-01
-
8-Pin 3.5 mm Pitch Connector to Nano-Pitch I/O, QSFP28 Terminal Block - The SCB-12 converts the Nano-Pitch connector to the industry-standard QSFP28 connector for interfacing I/O signals to plug-in data acquisition. This Terminal Block features the QSFP28 variant of the quad small form-factor pluggable (QSFP) transceiver for high-capacity data communication. The SCB-12 combines with shield cables to provide low-noise signal termination. Additionally, the SCB-12 supports the Nano-Pitch I/O Interconnect System that provides data transfer at 24 Gbps per lane and compatibility with PCI Express, Serial Attached SCSI (SAS), and SATA protocols. The SCB-12 breaks out the NanoPitch connector to a QSFP28 connector as well as an 8-pin connector for general-purpose DIO signals.
-
Product
Component Test Systems
-
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
-
Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
-
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
-
Product
37-Pin D-Type Female Solder Pin HV
40-960-037-F-HV
-
This connector is designed to allow users to directly terminate cables with soldered connections.
-
Product
96-Pin Micro-D Connector Block, Female With Backshell
44-965-096-F
-
This connector block provides a simple method of connecting to high density 96-Pin SCSI Style Micro-D BRIC connectors. The screw terminals accept wires up to 20 AWG and use a rising cage screw clamp mechanism to minimize risk of copper strand breakage. The metal shell includes an internal insulation barrier under the carrier board.
-
Product
Advanced SoC/Analog Test System
3650-EX
-
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
-
Product
Automated Aerospace and Defense Test
-
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
-
Product
26-Pin D-Type Female Straight PCB Mount
40-963-026-SF
-
Accessory allows a user to create their own PCB based termination solution mounted directly on the front of the product or on the end of a cable. Interfacing PCBs should be designed with suitable clearances for the voltage the application requires.
-
Product
6TL22 Off-Line Testing Platform
H71002200
-
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
-
Product
NFC Conformance Test System
T3111S
-
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
-
Product
Tabletop Single Site Test Handler
3111
-
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
