Measuring Microscopes
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Radius Measurement
Spherometers
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Ultra-accurate measurement of radius of curvature. Our spherometers have become an industry standard for ultra-accurate radius measurement and calibration of test glasses. The long term accuracy and automated features make our spherometers the preferred instruments for laboratory and production environments.
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Measuring Meters
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MRC provides MEASURING METERS in a high level .Water Quality, Air Quality, Temperature, Humidity, Meteorologic, Plant Maintenance, Health & Safety, Electric, Mechanic, Gases, Airflow, Sound, Light, Tachometer.
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Force Measuring Instruments
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Force measuring means measuring a certain load in newton, independent of the gravity.
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Test & AMP Measure
IP Traffic
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IP Traffic - Test & Measure is a software testing tool that can run on any PC with Windows 98, 2000 or XP. It can generate, receive, capture and replay IP traffic, and measure end-to-end performance and Quality Of Service over any IP fixed or mobile network.
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Additional Test & Measurement Hardware
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Additional Test & Measurement Hardware by electro-PJP
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Non-contact Measurement Wafer Sorting System (Belt Drive Tranceportation)
NC-6800
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*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function
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Differential And I/Q Device Measurements
S95089B
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The S95089B combines source-phase control of multiple internal or external sources with frequency-offset mode, enabling simplified test of I/Q modulators/converters, differential mixers, and harmonics or amplifiers.
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Wafer Edge Profile Measurement
WATOM
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WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
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Quantum Efficiency Measurement Systems
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Newest generation of quantum efficiency (yield) measurement tool, which allows the user to determine QE of powders, liquids, solids and films. An optically optimized geometry using an integration hemisphere and low stray light array spectrometer enables world class measurements and new applications.
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Smart Inductive Digital Measurement Sensors (DMS)
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Contrinex Smart Inductive Digital Measurement Sensors (DMS)
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Data Loggers, Data Recorders, and Measuring Transducers
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Wuntronic Data Loggers, Data Recorders, and Measuring Transducers
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Product
Custom Test & Measurement
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Delserro Engineering Solutions
DES provides customized bench test and measurement services. After conducting the test, we have the tools and experience to analyze the data and offer solutions to your problems. All of our instruments are maintained and calibrated traceable to NIST standards.
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Measurement & Simulation
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Highland Technology offers a wide array of tools for measurement, simulation, and control. Tachometers, thermocouples, RTDs, precision voltages, current loops, strain gauges, and more can be measured or simulated by Highland's products.
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Non-contact Measurement Wafer Sorting System (Robot Hand Tranceportation)
NC-3000R
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*High accuracy measurement system for large diameter wafer*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Compact design of Two-stage by measuring area and transfer area*Number of cassette station can be changed by customers request Option : Add wafer flattness measurement system(FLA-200)
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Temperature, Velocity & Pressure Measurement
ATVS-NxT
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Advanced Thermal Solutions, Inc.
The ATVS-NxTTM hot wire anemometer is a fully-portable scanner that provides rapid and highly precise of temperature and air velocity measurements for thermally characterizing electronic packages.
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The Leading Measurement System for the Analysis of Porous Materials
ELWIS
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ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An additional impedance tube for absorption measurements at higher frequencies is available for ELWIS-A.ELWIS-S measures structural parameters that are needed to simulate the dynamic and acoustic behavior of sound packages in the medium to low frequency range (including the "Poisson Ratio" for foam materials).ELWIS is very easy to operate: Thanks to its user-friendly software, the system can also be used to obtain reliable results by users with only limited experience in the characterization of porous materials.
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Spatial Laser Measurement
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Our laser systems for mine and quarry scanning, vessel-mounted waterway scanning, land-based mapping applications and marine dynamic positioning have been developed over many years of close work with those in the field, and have been adopted widely due to their reliability and ease of use.
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Product
Basic Pulsed-RF Measurements For E5081A — Up To 44 GHz
S960251B
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Add pulsed-RF measurement capabilities to your E5081A ENA-X vector network analyzer.
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Product
Manual Four Point Probe Sheet Resistance/resistivity Measurement
RT70V series
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• Combinational measurement system by Measurement tester(RT-70V) & Stage.• Thickness input with easy JOG dial operation (RT-70V Tester)• Tester self-test function/Auto change-over measurement range function• Thickness & Temperature correction function for Silicon sample
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Acoustical Measurement System
MLSSA
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MLSSA is the industry standard loudspeaker measurement system and the MLSSA Speaker Parameter Option (SPO) is the industry standard for measuring the Thiele-Small parameters of loudspeaker drivers. MLSSA and SPO both include QC (Quality Control) PASS/FAIL functions for high-speed automated production line testing of loudspeakers and drivers.
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Scanning Acoustic Microscope
Echo
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The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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Power Quality Measurement & Digital Fault Recording
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In view of the growing number of factors with a disturbing influence on power systems and the ever increasing sensitivity of devices and installations on the consumer side, simple monitoring criteria such as undervoltage or overcurrent are no longer adequate. Reliable registration of all the relevant processes within the electrical power system calls for constant observation of a wide variety of derived parameters, such as individual harmonic content, system unbalance and interharmonics, and the swift identification of even slight deviations from the norm.
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Temperature Measurement System
6625T
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Temperature Measurement System provides demanding users around the world with the best in temperature measurements and value. Incorporating unique features, this system is a true "turn-key" Temperature Measurement System. The 6625T System provides leading measurement specifications with uncertainties as low as 0.013 mK and the widest range of options available from any manufacturer.
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Roughness Measurement
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ZEISS ROTOS offers optimum precision and maximum flexibility when performing roughness measurements thanks to its modular design and rotation in three axes: easy-to-change stylus arms further expand the range of possible applications.
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Non-contact Surface Texture And Contour Measuring Instruments
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From sub-nano level surface roughness to milli level profile with 3D.Tokyo Seimitsu provides non-contact type surface roughness and contour measuring instruments with the confidence born out of many years cultivating know-how of surface roughness measurements.
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2-18GHz Instantaneous Frequency Measurement Unit
DR073
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Teledyne Defence & Space’s Instantaneous Frequency Measurement (IFM) module, also known as a Digital Frequency Discriminator (DFD), offers high speed frequency measurement across the full operating bandwidth.The IFM measures the frequency of RF signal present at its input and presents a result at its output as digital data. The RF input signal is conditioned by an RF amplifier that provides sufficient drive for the frequency resolving circuits. The raw video from the resolvers is digitised and processed into the required output format. There is additional timing and control circuitry which initiates the measurement process and provides handshake data to the host system processor.
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Measurement Types and Kits
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Keysight supplies a wide variety of optics for different calibration measurements. Choose individual optics or a pre-configured kit. Select desired measurement type from the chart or individual optics listed below.
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Measuring Devices for Magnetically Hard Materials
SF2
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Electromagnet SF2 is a measuring circuits, which makes possible the generation of adequate values of static magnetic fields in air gap between the electromagnet poles, where the measured samples is placed. The range of magnetic field strength H amount from -1 650 to +1 650 [kA/m]
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Strain Measurements and Experimental Stress Analysis
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Experimental structural testing using strain gauges is necessary in a wide range of applications from airframes and sub-assemblies down to individual components such as turbine blades, satellites, wind turbines, buildings, bridges and many others. These tests enable the engineers to compare the acquired data with the predicted results from the design calculations.
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Electric Insulation Oil Automatic Measurement System
DAC-5016
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DAC-5016 is an automatic test system of insulation oils according to JIS C-2101.The system automatically enables changing over samples (liquid cells) up to max 8 pieces and testing the dielectric loss tangents and the volume resistivities.In automatic mode, the dielectric loss tangents and the volume resistivities are automatically measured, and then the results are printed out with the built-in printer. And the relative permittivities and the volume resistivities calculated are also printed out. Therefore the test time is greatly saved compared to the conventional test methods.
