HIL
a system's simulation test of embedded controls by the electrical emulation of it's motors, sensors and actuators.
See Also: Loop, Current Loops, Loop Testers, Hardware in the Loop Simulation, Hardware-in-the-Loop
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PXIe-2512, 7-Channel, 10 A PXI Signal Insertion Switch Module
780587-12
PXIe, 7-Channel, 10 A PXI Signal Insertion Switch Module—The PXIe‑2512 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXIe‑2512 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls (FADECs).
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Real-Time Target Machines
Speedgoat offers a range of high performance multi-core, multi CPU target computers (target machines) with i3 and i7 CPUs up to 4.2 GHz, and up to 20 cores. Each is optimized for a different application area, from mobile controller prototyping (RCP) to multi-target rack systems for Hardware-in-the-Loop (HIL).
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Embedded Software Test Environment
Mx-Suite
Using intuitive graphics, Mx-Suite streamlines your engineering development efforts by automating tests, clarifying testable requirements, improving traceability and diagnosing possible root failure causes. Mx-Suite provides the connectivity to your MIL, SIL, or HIL test environments, allowing you to complete testing earlier in your development cycle to achieve superior product quality levels.
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PCIe-7821, Kintex 7 FPGA, Digital Reconfigurable I/O Device
785359-01
The PCIe‑7821 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PCIe‑7821 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in-‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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Bloomy Simulation Reference System
The Bloomy Simulation Reference System provides a hardware in-the-loop (HIL) test environment for dynamic, closed-loop testing of many aerospace and transportation control systems. The reference system integrates the computing, I/O, and software components needed for standalone use or to form the basis of a more complex test system.
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Electric Servomotor Steering HILS Tester
This device is a complex simulation test device completed by the operation of the steering system performance / durability test machine and the hardware in the loop systems (HILS) system.
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PCI-7811, 1M Gate Virtex-II FPGA, Digital Reconfigurable I/O Device
779363-01
The PCI‑7811 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. The PCI‑7811 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, custom communications protocols, bit error rate test, and other applications that require precise timing and control.
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Brinell Optical Scope
HiLight Series
Newage Testing Instruments, Inc.
The Newage 5620 Series HiLight Brinell Optical Scopes features a high-efficiency LED array for its light source, providing excellent illumination and improved readability over conventional “flash light” scopes.
