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RF Probes
Coaxial Probes are said to offer repeatable performance up to 3 GHz in custom or standard configurations.
See Also: Test Probes
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Calibration
RF Test Equipment
We calibrate following types of RF test equipment:EMF test systems (frequency selective)EMF test systems (broadband)Field strength transfer standards (e.g. RefRad)Line Impedance Stabilisation Network (LISN)Cable, attenuator, couplerAntennaField Probe
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RF Power Generators
MKS RF Power Generators provide reliable solid state power for thin films processing equipment. They are vital components of semiconductor fabrication systems, which produce the integrated circuits (ICs) or chips required by modern computers and electronic equipment. MKS RF Generators, combined with our Impedance Matching Network and our V/I Probe form a complete RF Delivery System.
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RealProbe RF Probes
Unmatched performance In-Circuit RF Probes covering up to 18GHz. These are must tools for any in-circuit RF and Microwave testing and troubleshooting.
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MOD MONITOR
TYPE HFX-1
The Type HFX-1 Modulation Monitor is an ancillary piece of equipment, which is used with narrow bandwidth, or older oscilloscopes to allow viewing of RF signals and particularly modulated signals as high as 55MHz. The equipment contains an RF signal source and a broadband mixing circuit which converts the high frequency signal to an intermediate frequency within the oscilloscope’s range. The frequency control dial is simply adjusted until the RF signal is viewed on the scope. BNC connectors are mounted on the rear panel to allow interconnect to the scope and RF probe. This product was previously called "oscilloscope frequency extender" and may be used to view other high frequency signals on older or narrow band scopes.
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Test Contactor/Probe Head
Hydra
Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
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Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Test Contactor/WLCSP Probe Head
ACE
ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have the electrical properties of BeCu with the non-oxidizing properties of a precious metal. The short signal path, sharp tips, and large contact area between plungers provide high current conductance and reliable contact with less force.
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6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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Compact Monitoring Probe
ISDB-T/Tb
Network operators:automate the tests of new transmittertemporary monitoring/investigation toolrebroadcasting receiver: RF to ASI or IPBroadcasters: off-air monitoring probe to validate the on-air contentTV/STB producers: automated tests against a professional receiverLabs: easy & simple access to live DTV sources via RF
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RF Radio - Frequency Probes
*3 to 6 Ghz *PCB MCX SMB SMC *SMA U. FL MS / MM Fakra *Exchangeable inner plunger
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Mini Probe Station
C-2
The smallest probe station which still preserves the key functions and precision that are fundamental to all probing. This size is still capable of DC and RF measurements, making it the most versatile in its size.
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EMCTD Broadband RF Safety Systems
The EMCTD analog Smart Fieldmeter® is easy to read and to operate. The EMCTD broadband electromagnetic probe covers the 0.2 to 3000 MHz spectrum where most common industrial, communications, medical and government RF emitters are found. The ANGPE-3000 system enables checking of home, office, and workplace RF levels. The system is designed to conveniently measure RF levels around WiFi access points, RFID systems and rooftop antennas; to find transmitter cabinet radiation, locate transmission line leaks, to identify non-radiating antenna elements, and much more. With the supplied NIST-traceable calibration, this system supports laboratory testing of RF devices in compliance with present EMC and RF safety standards.
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Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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RF Near Field Probe Set DC to 9GHz
EMF & RF close field sniffer-set for use with any Spectrum Analyzer or Measurement Receiver. The EMC Near Field probe set allows for straightforward pinpointing and measurement of interference sources in electronic component groups as well as execution and monitoring of generic EMC measurement. Our RF near field probe set is especially suitable for: - Pinpointing interference sources - Estimation of interference field strength - Verification of shielding and filtering measures - Identifying faulty components - Detecting circuitry overly sensitive to interference.
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Diode Power probe
The COMM-connect 3026 Diode based temperature compensated probe is designed for use with the COMM-connect range of Power Monitors. The probe will handle from 50µW to 100mW . Used with external couplers and the our measurement system application from 1W to 1MW, a high dynamic range can be configured. The 3026 Diode based probe gives excellent stable results along with the COMM-connect Power Monitor variants. This gives our customers a number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
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Complete Probe Station
BD Series
Best for DC and RF probing, the platen lift is designed for smooth raise and contact of your probes simultaneously to your device. It is ideal for probing multiple spots on your device, or through multiple devices.
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Data Loggers
ThermoWorks temperature and humidity loggers are perfect for food processing, transportation, and restaurant fridge and freezer storage, including cold chain management, cook chill, and critical control points (HACCP). They are also used in labs and for pharmaceutical applications like VFC. Wirelessly pair multiple network-connected units to a single base station through WiFi, Bluetooth, or RF and store your temperature or humidity readings in the cloud. Our USB probes and USB data transfer loggers are also popular and come with integrable software. Specialized loggers are also made for harsh environments, including extreme low and high temperatures.
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LISN & Voltage Probes
All commercial LISNs include an artificial hand connection and a transient limiter. This adds a 30dB insertion loss. A 30dB pre-amplifier is included which can be connected in the RF output feed to return the insertion loss to 0dB. The Voltage Probe requirement is covered by our PLIP (Power LIne Interference Probe). This fully meets the requirements of CISPR16, but has additional features:*Fully galvanic isolation between input and output (>1kV), for the safety of operator and analyser!*Shrouded safety clips for attachment to the line to be measured.*Filtered frequency response matched to Band A and B.*Current limiting on the output.*Visual indication of high voltage input.
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MPI PCB Probe Systems
MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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SMART III RF Probe
Finna Sensors’ Smart III RF Moisture Probe is appropriate in those situations where NIR use on conveying systems/web applications or RF flat plate sensor use on board type products are not sufficient. Examples include tanks, bins, barrels, drums, Super Sacks™, silos, etc. These applications require a probe type moisture meter where the probe is inserted into, and is surrounded by product. Since the probe generates a 3 inch diameter radio frequency field around the length of the probe, a significant volume of product is measured. As the product is slowly removed from the silo, and refilled from the top, it passes by the RF Probe, thereby providing a constant real time moisture measurement. Typical applications would include starches, distillers and brewers grains, granulated chemicals or food ingredients, whole grains such as corn kernels, rice, soybeans, tree nut stockpiles, etc.
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MPI Fully Automatic Probe Systems
MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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Digital RF Power Monitor
3024
The COMM-connect 3024 RF Power Monitor from LBA Technology can control up to 8 external RF Measuring heads. The high dynamic range with external couplers and RF measuring heads cover from 1W to 1MW. The Power conversion algorithms handles multi carrier, multi mode, peak, average and RMS signals. The power readout is auto scaled and VSWR can be calculated between any probes. Also the measured and calculated results along with alarms can be shown in the local LCD. The instrument has SNMP support to allow network management. The instrument can be configured for VSWR and Power limits to give alarms. The alarms can be configured to operate relay drivers or isolated Optcouplers. The alarms can also be configured as SNMP traps sending relevant information to the network control center. The COMM-connect 3024 WEB enabled RF Power Monitor gives an unlimited number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
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Deep Access RF Probes
GigaTest Microwave Probes are perfect for device characterization and modeling. GigaTest Probes have a high tolerance allowing them to land repeatedly and take high-quality data.
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PCB Connectors
Smiths Interconnect offers a broad range PCB connectors for harsh environments. A wide choice of configurations and terminations of signal, power, high speed, RF contacts and spring probes solutions.
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Near Field Probes 30 MHz up to 3 GHz
RF2 set
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Standard 3.06 (86.70) - 4.00 (113.40) RF Probe For SMA Connectors
CSP-30ES-013
Nominal Impedance (Ohms): 50Current Capacity (Amps) @ 20° C: 1.00Bandwidth @ -1dB (GHz): 35.00Return Loss @ -20dB (GHz): 22.00Test Center (mil): 328Test Center (mm): 8.33Recommended Travel (mil): 100Recommended Travel (mm): 2.54Full Travel (mil): 200Full Travel (mm): 5.08Overall Length (mil): 1,033Overall Length (mm): 26.24Rec. Mounting Hole Size (mil): 297Rec. Mounting Hole Size (mm): 7.54
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High-Frequency Probe, 300 kHz to 3 GHz
85024A
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.
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Testing Services
Howland & Lawrence Chamber Services
RF shield testing: IEEE-299, MIL-STD-285, NSA 65-6CTIA CATL certification testing: Probe symmetry and amplitude ripple measurements following Test Plan for Wireless Device Over-the-Air PerformanceAnechoic material test, inspection, remediation: VSWR, inverse spherical nearfield testing of installed material and NRL arch screening tests of individual absorber pieces We can also provide in-process testing of welded steel shielded enclosures with a test technique based on ASME BPVC vacuum box testing—confirm quality of RF welds before the shield envelope is complete. We developed this method for testing the Navy’s Advanced System Integration Lab (ASIL) chamber at Patuxent River, shaving weeks off the construction/testing schedule.
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Current Probes
Com-Power's Current Injection Probes are used for RF conducted immunity testing per IEC 61000-4-6, CISPR 16-1-2, RTCA DO-160 and MIL-STD 461. Current injection Probes are to be used only when there is no commercially available CDN for the type of port(s) to be tested.
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Bulk Current Monitoring Probe
MP-50
The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.
