Highly Accelerated Stress Test
High reliability testing using a destructive high temperature, humidity and pressure enviroment.
See Also: HAST
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Backgrinding & Stress Relief
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Grinding and Dicing Services, Inc.
GDSI delivers complete backgrinding solutions to the semiconductor, MEMS and biomedical industries. Backgrinding is a necessary process step to reduce wafer thickness prior to dicing and final assembly. By utilizing fully automated grinders staffed by highly qualified engineers, GDSI’s grinding procedures produce unsurpassed precision and repeatability.
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Extremely Accelerated Stress Test Chambers
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The extremely accelerated stress environment is defined by high temperature, high humidity and high pressure. WEIBER provides humidity resistance evaluation test for electronics components through customized Extremely Accelerated Stress Test Chamber. This chamber provides high performance test in minimal amount of time according to international IEC 60068-2-66 standard. This chamber also known as Accelerated Stress Test Chamber, Halt and Hass Test Chamber, Halt Test Chamber and Hass Test Chamber.This chamber reduces the time taken for humidity testing in electronic components. 2 types of tests saturated and unsaturated extremely accelerated stress test can be performed. In saturated test the temperature is maintained at 1210C at 100%RH, and for unsaturated temperature of 110, 120, 1300C is maintained at 85%RH. Normally for electronic components unsaturated type test is done.
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Digital Test Instrumentation
EDigital-Series™
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Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Thermal Stress
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Specialized environmental testing devices that rapidly cycle products between extreme hot and cold temperatures to simulate harsh real-world conditions.
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Medalist i1000D
U9401B
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The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Cattle Heat Stress Tracker With LiNK + Vane Mount
5400AG
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Don't let cattle heat stress reduce your herd performance and cost you money. Implement an effective management plan based on objective and accurate THI, HLI, and AHLU measurements at the pen level with Kestrel. This rugged, hand-held meter can also be mounted with included hardware for longer-term monitoring of heat events.
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Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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Instrument for linear accelerators and TomoTherapy® systems
QA BeamChecker™ Plus
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The NEW QA BeamChecker Plus is a reliable and uncomplicated daily QA instrument for linear accelerators and TomoTherapy® systems.
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EV Power Components End of Line Test Platform
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Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Bow and Global Film Stress Measurement
128 Series
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Bow and Global Film Stress Measurement.Non-contact full wafer stress mapping for semiconductor and flat panel application.Dual Laser Switching Technology.
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ESS Environment stress screening
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Temperature adaptability test under the condition of rapid change, or gradient for electrical, electronic, instruments and other products or spareparts, particularly applies to environmental stress screening test（ESS）
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Stress Test Software
PassMark BurnInTest
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PassMark BurnInTest? is a software tool that allows all the major sub-systems of a computer to be simultaneously stress tested for endurance, reliability and stability.
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Sealed Beam Bulb Testing System
H710019SSL
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EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
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The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Livestock Heat Stress Monitor
DROP D2AG
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Livestock heat stress can cause serious health issues in your valuable livestock as well as reduced performance and productivity. Stay informed of heat conditions in the barn or during transport with the Kestrel D2AG Livestock Heat Stress Monitor. Multiple built-in environmental measurements mean your DROP D2AG can also be used for many other agricultural applications including hay and feed storage areas and greenhouses.
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Optical Receiver Stress Test
N4917BACA
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A complete, automated, and repeatable solution for optical receiver stress test.
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CPE Design Verification System
Jupiter 310
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Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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GS1 Acceleration Sensor
AGS11351
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Panasonic Industrial Devices Sales Company of America
GS1 Acceleration Sensor
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Advanced SoC/Analog Test System
3650-EX
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Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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High Core Density 2U Network Appliance With Security And Acceleration Features Ready. Ideal For Network Security And Crypto Acceleration Workloads.
FWA-6080
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Single AMD EPYC™ 7003 Processors, up to 64 Cores16 x DDR4 ECC RDIMM slotsHot-swap 2.5" disk bays and system fan, redundant PSU, 2 x HH/HL Gen4 PCIe x16 slotIntegrated security features with secure boot, memory encryption, and virtualizationIPMI v2.0 compliant, with web interface8 x Advantech network module expansions w/ PCIe Gen4 bandwidth
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Hailo-8™ M.2 AI Acceleration Module
EAI-1200
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26 TOPS AI Computing delivered by Hailo-8 NPU. Compact M.2 AI module key B+M / A+E. -40~65°C operating temp. w/ optional heatsink. Typical 2.5W low power consumption. Rich AI Dev. Toolkits including Model Library, Model Converter, Runtime SDK Integration.
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Constant Acceleration Tester-Arm Type
KRD31 series
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KRD31 series constant acceleration tester are used to test articles under extreme acceleration conditions based on standard like MIL-STD-810F, MIL-STD-202 and IEC68-2-7. It is most suitable for testing electronic components or devices. Under high g effect on microcircuits, to check adaptability and reliability of wiring and the internal structures. It may expose mechanical and structural defects that are not found with vibration and shock tests.
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UV Accelerated Weathering Testers
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Dongguan Amade Instruments Technology Co., Ltd
UV accelerated weather tester is also well known as UV test chamber, which is a type of environmental test chamber using fluorescent UV as light source to determine the resistance of plastics, leathers, rubbers, fabrics and so on to weathering under the specified conditions. We know that Ultraviolet light only accounts for 7% of the total sunlight, but it plays a core role in deterioration of materials. Not only does the ultraviolet, but UV test machine also can simulate dewing, high temperature, high humidity, black environment to be reappeared as a circulation. So UV weathering test is an essential measure for people to research and know the degradation state of specimens in advance as the time goes on.
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High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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SmartNIC Storage Accelerator Card Zynq Ultrascale+
iW-RainboW-G35P®
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Your product description goes here.
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Scienlab Battery Test System – Module Level
SL1001A Series
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The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Wireless Device Test
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New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Serial Bus Buffers, Extenders, and Accelerators
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The Analog Devices family of I2C solutions support hot swappable, 2-wire bidirectional bus buffers to allow I/O card insertion into a live backplane without corruption of the data and clock busses. Additional supported 2-wire buses include SMBus, PMBus, the ATCA intelligent platform management bus (IPMB), and the HDMI DDC bus. I2C/SMBus Accelerators improve bus transitions to allows multiple device connections or a longer, more capacitive interconnect, without compromising slew rates or bus performance. ADI's software-programmable and pin-selectable I2C multiplexers help resolve I2C address limitations, increase fan-in or fan-out, and integrate bus buffers and rise time accelerators for an all-in-one solution. Resistor configurable I2C address translators can be configured with over 100 unique slave addresses to allow multiple slave devices with the same address to coexist on the same bus.
