Genrad Fixtures
See Also: Teradyne Fixtures
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Stand-Alone Test Fixture
MA 2012/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 15,50 kg
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Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 197 x 114 mm (wxd)
CMK-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 230 x 175 mm (wxd)
CMK-06
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Manual Test Fixture (MA)
MA 2013/D/H/VPC-G12x-18
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 25,00 kg
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Spring Clip Fixture
16092A
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Stand-Alone Test Fixture
MA 2011/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg
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Flexible Pitch GND Fixture Clamps
GF-A
High Power Pulse Instruments GmbH
*Compatible with GGB picoprobe model 10 replacement probe tips*<1 ns rise time (200 ps possible with 5 mm GND wire length)*Custom selectable GND wire length 5-15 mm*Gold-coated spring-steel clamp with micro-machined groove for locking of the clamps on the probe tip*High conductivity and low inductance copper HF litz wire with 200 x Ø 0.02 mm strands*Easy to use clamping*Tungsten carbide probe needle with 1 inch length, 15° taper and 7.5 µm tip radius
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EBIRST 68-pin Male SCSI Termination Fixture
93-015-103
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Test Fixture Adapters for In-Circuit Test Fixtures
Circuit Check test fixture adapters are utilized when the target ICT tester is not available or has been replaced with a newer technology tester. The tester adapter will often allow existing test fixtures from one test manufacturer to be utilized on another manufacturer test platform, eliminating the need for replacement fixtures. Contact Circuit Check to discuss your tester and fixture combinations for the best choice of a cost effective solution.
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Test Fixture and Test Programing
Landrex Technologies Co., Ltd.
Test Fixture and Test Programing
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/7
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,30 kg
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Automatic Fixture Removal
S96007B
Automatic fixture removal (AFR), is the easiest way to remove fixture effects from non-coaxial device measurements.
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Bottom Electrode SMD Test Fixture
16197A
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
