PC Test
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Die Test Handler
3112
Test Handler
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131C
Test Port Cable
The Keysight 85131C is an 81 cm (32 in) long1 semi-rigid cable with a 3.5 mm female2-to-PSC-3.5 mm female connector. Cable frequency range is DC to 26.5 GHz with a return loss of 17 dB or better. Insertion loss is 0.43 * sqrt(f) + 0.3, where f is frequency in gigahertz, for the test port connector and 2.5 dB at maximum frequency for the device connector. Phase stability of the semi-rigid / flexible cables is specified with a 90-degree bend using a 4 to 3-inch radius. Stability1 of the 85131C is less than 0.06 dB, and phase is 0.16 * f + 0.5, where f is frequency in gigahertz.
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Terminal Test Kit (19 PCS)
3604
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Peaceful Thriving Enterprise Co Ltd
1. Checks voltage on 6, 12 and 24V systems.2. 12-feet flexible rubber wire with spring relief.3. Tough plastics handle lights up if circuit is good.4. 4mm connection for banana plugs.5. Facilities the measurement on connectors and components without destroying the insulation or the plug connection.
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Modular Embedded Box PC With Intel® Core™ Ultra CPU (Series 2)
UNO-2484V3
Box PC
Intel® Core™ Ultra Processors (Series 2), including Ultra 5 225U & Ultra 7 255U (formerly Arrow Lake)Wide operating temperature: -20 ~ 60 °C; power input: 10 ~ 36 VDCUp to four display outputs (DP + HDMI + 2 x Type-C)4 x LAN, 3 x USB 3.2 Gen2, 1 x USB 2.0, 2 x Type-C4 x RS-232/422/4852 x M.2 M-key, 1 x M.2 E-key, 1 x M.2 B-keyUser-friendly design: side-extractable SIM card, easy RAM & logo replacement, reserved punch-out holes for antennasOptional DDR5 slots x2, each channel supporting up to 32GB, enabling flexible memory expansion and optimized system performance
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Product
4-Module ICT System, I307x Series 6
E9903G
In-Circuit Test System
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
PC Link Software
LE-PC300G
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LE-PC300G is Windows® software which enables a PC to control LINE EYE protocol analyzers from remote in order to use measurement data of those analyzers on a PC. It is compatible with the following analyzers: LE-3500, LE-2500, LE-1500, LE-7200, LE-3200, LE-2200 and LE-1200.
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Product
Wallmount/Desktop Barebone PCs
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IPC-730 wallmount GPU IPC feature high wattage power supply & great heat dissipation efficiency, providing the robust base for edge AI applications.
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Product
Embedded PCs
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Powered by NXP, Nividia, Rockchip, and TI silicons, Advantech Arm-based Edge AI Boxes and IoT gateways are designed for the AIoT applications.
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Product
Regenerative Battery Pack Test System
17020
Test System
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
Magnetic Material Test Fixture
16454A
Test Fixture
The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. Complex permeability is calculated from the inductance with and without the toroid. When the E4991A/4291B with option 002 is used as the measurement instrument, direct readouts of complex permeability are possible. In addition, it is furnished with a small and a large fixture to adapt to a wide range of sizes.
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Product
Memory Test System
T5830/T5830ES
Test System
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Test System
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
PC Edition Ynit
RH-2000
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"RH-2000" is a digital microscope which can evolve and customize. 2D Measurement, 3D Measurement, and Tilting. "RH-2000" enables you to make a high performance observation and analysis.
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Product
PC Analysis Software
TekScope
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Get the analysis capability of an award-winning oscilloscope on your PC. Analyze waveforms anywhere, anytime. The basic license lets you view and analyze waveforms, perform many types of measurements and decode the most common serial buses - all while remotely accessing your oscilloscope. Advanced license options add capabilities such as multi-scope analysis, more serial bus decoding options, jitter analysis and power measurements.
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Product
Rugged PC Compatible
SYS-405D
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The SYS-405D is a rugged, industrial system capable of operating at extended temperatures without requiring a fan or heat-pipe. The SYS-405D is based on the dual-core Intel® Atom™ E3827 processor and protected by a rugged enclosure.The SYS-405D includes dual Ethernet, dual MiniPCIe, USB 3.0, serial ports with RS-232/422/485 and two independent displays via DisplayPort, and/or Analog VGA
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Product
PC Based Tester
Cablescan L8
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The Cablescan L8 provide the PC-based power of the larger PC based testers, but in an economical package for users who do not require more than 1024 test points. This analyzer is designed to operate under the control of your PC.
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Product
23.8" Fanless Panel PC With Intel® Core™ I7/i5/i3 Processor
PPC-324W TGL
Panel PC
Industrial-grade 23.8" LCD panel with 30k backlight lifetimeTrue-flat touchscreen with multi-touch projected capacitive controlHigh-performance, fanless 11th generation Intel® Core™ i processorDual channel memory slots, max 64GCompact, fanless design with aluminum alloy enclosureIP66-rated front panelSupports dual displays (1 x external HDMI)1 x M.2 bay (2242/2280 NVME or SATA Interface) for storage and support SATA RAID 0, 11 x 2500BASE-T Ethernet Supports Time-Sensitive Network(TSN) technology
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
SAS Protocol Test System
Sierra M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
