Game Test
-
Product
Memory Test System
T5511
-
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
-
Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
-
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
-
Product
Desktop PCB Test System
BOARDWALKER 9627
-
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
-
Product
Laser Diode Burn-in Reliability Test System
58604
-
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
-
Product
SMD Array Type LCR Test Fixture
16034H
-
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
-
Product
EMI Test System
TS9975
-
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
-
Product
Sealed Beam Bulb Testing System
H710019SSL
-
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
-
Product
Audio and Acoustic Functional Test Solution
-
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
-
Product
ATE Self Test Fixtures
AL663
-
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
-
Product
Test Fixture (SMD Components)
16034E
-
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
-
Product
Build-to-Print for Test Systems
-
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
-
Product
VXI Digital Multiplier
4152A
-
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
-
Product
Semiconductors Testing
-
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
-
Product
200 Vdc External Voltage Bias Fixture
16065A
-
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
-
Product
Gaming Platform Based On AMD® Ryzen V2000 Processors, Supporting Up To Eight Independent Displays, Including 4K UHD
ADi-SA3X-RZ
-
ADLINK‘s ADi-SA3X-RZ all-in-one gaming platform features powerful processing and graphics performance for gaming and retail. Equipped with AMD® Ryzen V2000 processors, the ADi-SA3X-RZ provides compelling graphics performance from a PCI Express 3.0x16 discrete graphics card and/or an AMD® Radeon™ Graphics supporting up to eight independent monitors.
-
Product
Test Handler
M6242
-
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
-
Product
High-Performance Gaming Platform with Backplane Architecture
ADi-SC2X
-
- High performance, high-end gaming platform with backplane architecture for easy maintenance- Superior, highly scalable CPU/GPU performance- Advanced security feature set and software solutions- Highly flexible system configurations that are fully in line with real project requirements- Lower costs: due to implementation of socket-type Intel® CPUs- Flexible maintenance and upgrade: slot-in machine construction, socket-type CPU support- Flexible maintenance and upgrade: slot-in machine construction, socket-type CPU support- Full-scale customization: GDDR5, V-BIOS, video ports, I/O ports, etc.- High integration: FPGA & logging controller onboard
-
Product
Automated Test Equipment
-
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
-
Product
In-Line RF Test Platform
AR925
-
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
-
Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
-
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
-
Product
Disk Drive Test System
Saturn
-
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
-
Product
NI HIL and Real-Time Test Software Suite
-
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
-
Product
CATR Benchtop Antenna Test System
ATS800B
-
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
-
Product
ARINC-708 Module
M4K708
-
The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
-
Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
-
eBIRST adapters allow extension to other switching system connectors, including SMB
-
Product
Memory Test System
T5801
-
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
-
Product
Wireless Device Functional Test Reference Solution
-
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
-
Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
-
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
-
Product
NFC Conformance Test System
T3111S
-
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
-
Product
Laser Diode Reliability Burn-In / Life-Test System
58602
-
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
