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Reflectance
fraction of the electromagnetic energy.reflected.
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Verifier Computer Interface Report
VCIR
The Verifier Computer Interface Report (VCIR) is a Windows software package that allows for transferring inspection report from your Inspector series bar code verifier to a computer. Once transferred you can review the ISO/ANSI inspection results or view the scan reflectance profile for detailed troubleshooting. The inspection results can be saved by job for later retrieval or to append new inspection results to the existing job. As each job is saved an Excel spreadsheet (CSV file) is generated. You can customize which parameters should be saved in the spreadsheet. The spreadsheet provides a simple report that will have a line for each bar code inspected.
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Fiber Optic Measurement Systems & Sensors
MTI Instruments offers large measurement range and standoff distance fiber-optic measurement sensors and probes that provide ultra sensitive linear output response. Our modular (interchangeable) non-contact fiber optic sensors systems have dual channel that enables the user to make simultaneous measurements. Our fiber optic probes are designed to automatically compensate large changes in reflectivity making it possible to monitor dynamic reflectance of up to 100:1 making it ideal for measuring vibration of ultrasonic horns, modal analysis of disk drive suspension, displacement and timing of fuel injectors and lateral motion measurements.
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Reflectance/Transmittance Test Set
RT-500
An Integrating Sphere is a hollow sphere which has its interior coated with a paint that is nearly perfectly diffuse or Lambertian and which has extremely high reflectance. Light energy introduced in an integrating sphere is reflected from the wall and distributed uniformly around the interior. A detector which is placed at a hole or 'Port' in the sphere wall sees an output which is completely independent of the angularproperties of the input light. The independence of the output of a sphere from the angular properties of the input and the uniform internal distribution of light make integrating spheres ideal for many uses.
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Spatial Heterodyne Surface Chemical Agent Detector
SHSCAD
Wide area, high areal coverage rate surface contaminant detection via LWIR reflectance spectroscopy employing eye safe broadband quantum cascade lasers (QCLs) and a high-speed spatial heterodyne spectrometer (SHS) in a handheld sensor package (~ 10,000 cm3, 10 lb).
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DOI / Haze Meter
807
TRICOR’s Hazer Meter and DOI is ideally suited for measuring flat, non-textured high reflectance surfaces. The Model 807A Haze Meter design is in accordance with ASTM E430 and ASTM D5767 (method A) and is used to measure ±3 degrees around the specular lobe centered at 30 degrees in approximately 220 increments. That’s an angular sample size of 1 sample per 1.6 minutes of arc! This allows differentiation between samples with very small differences in reflectance characteristics. Verified replacement for the older Hunter Dorigon II haze meter unit.
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Flatness Accessory Kit
55282A
The 55282A Flatness Accessory Kit is composed of an 10759A Footspacing Kit and two 10773A Flatness Mirrors. The footspacing kit provides three precision baseplates, with 50.8 mm (2 in), 101.6 mm (4 in), and 152.4 mm (6 in) pad spacing respectively, that minimize the grid setup and data accumulation time required for plate calibration. The flatness mirrors provide 100 percent reflectance and turn the direction of an incoming laser beam 90 degrees.
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Reflectance Standards
STAN Series
Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
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Loaded Spectrophotometer
DSCD-900
DSCD-900 is a highly performance spectrophotometer with test caliber upward. The instrument adopts the geometric conditions of D/8 lighting and observation of CIE recommendations, integration of the full band LED composite light source, double beam optical system, ETC every-time calibration technology, spectral reflectance standard deviation within 0.08, maximum of colorimetric values ΔE*ab is 0.03, to provide all the necessary color formula. It could be widely used for coating, printing, textile, meet plastic, food, medicine, automobile field to meet customers’ measurement requirement.
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UV-Vis Double Beam Research Spectrophotometer
UVD-3400
UVD-3400 has an excellent performance blazed holographic grating optimized and optional reflectance attachment CT-type Monochromator and reduces stray light and widen the photometric range. Wavelength range: 190 nm – 900 nm ; Spectral bandwidth: 2nm
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Radiative Transfer Numerical Model
HydroLight
The HydroLight radiative transfer numerical model computes radiance distributions and related quantities (irradiances, reflectances, diffuse attenuation functions, etc.) in any water body.
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Glossmeter
480
Quickly and accurately measure and record Gloss, % Reflectance & Haze measurements on a wide range of materials, including paint, plastic, ceramic or metal with the Elcometer 480 Glossmeter.
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SRA01-Albedometer
Hukseflux Thermal Sensors B.V.
SRA01 albedometer is an instrument that measures the solar albedo, or solar reflectance, and net solar radiation. It is composed of two second class pyranometers with thermopile sensors, the upper one measuring global radiation, the lower one measuring reflected solar radiation. It complies with the latest ISO and WMO standards. SRA01 can be connected directly to commonly used datalogging systems.
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Single Fiber Aligner
1100
The 1100 Single Fiber Aligner uses patented fiber alignment concepts to produce virtually instantaneous temporary couplings for OTDR, dispersion, or any other optical fiber or component test that requires a fiber-to-fiber connection. It delivers low loss, low reflectance couplings on the first try virtually every time, without the need for test instrument feedback. As a result, temporary coupling times are minimized and manufacturing costs are reduced without compromising product quality.
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Reflection/Transmission Test Chamber
CHTR-100
When measure the surface spectral reflectance of all kinds of reflect mirror, metal, plastic and so on or the spectral transmission of glass and plastic, CHTR-100 Reflection/Transmission Test Chamber is mainly used to collect photometric and chroma energy, and then send the tested light signal to spectrometer or reflection and transmission photometer to get the color parameters via optical fiber or photoelectric detector.
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Diffuse Reflectance Sphere
DRS100
Mobile displays are used in a variety of ambient lighting environments. The evaluation of mobile displays under diffuse illumination conditions is critical to the understanding of display performance in the real world, as mobile displays are used in a wide range of ambient lighting environments. The DRS100 is purpose-made to completely characterize the diffuse reflectance properties of mobile displays, providing uniform hemispherical illumination.
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Sensor
VL53L1
The VL53L1 is a state-of-art Time-of-Flight (ToF) laser-ranging miniature sensor. Housed in a miniature and reflowable package, it integrates a SPAD (Single Photon Avalanche Diodes) array, physical infrared filters and optics to achieve the best ranging performance in various ambient lighting conditions, with range of cover glass options.Unlike conventional IR sensors, VL53L1 uses ST’s latest generation direct ToF technology which allows absolute distance measurement whatever the target color and reflectance. It provides accurate ranging up to 4m and can work at fast speed (60Hz), which makes it the fastest miniature ToF sensor on the market.With patented algorithms and ingenious module construction, VL53L1 is also able to detect different objects within the Field-of-View with depth information (histogram) at 60Hz. Scene browsing and multi-zone detection is now possible with VL53L1, thanks to software customizable detection array for quicker “touch-to-focus” or mini depth-map use cases.
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Red Tide Spectrometers
USB-650
USB-650 Red Tide spectrometers are ideal for teaching about UV and visible absorbance, reflectance and emission applications. They are preconfigured, ready-to-use spectrometers that come in several different options. Fully integrated – USB650-UV-VIS and USB650-VIS-NIR models are preconfigured, ready-to-use systems.
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Thermal Conductivity Analyzer
TCi
The default C-Therm TCi Thermal Conductivity Analyzer employs the Modified Transient Plane Source (MTPS) technique in characterizing the thermal conductivity and effusivity of materials. It employs a one-sided, interfacial heat reflectance sensor that applies a momentary constant heat source to the sample. Typically, the measurement pulse is between 1 to 3 seconds. Thermal conductivity and effusivity are measured directly, providing a detailed overview of the heat transfer properties of the sample material.
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Bare Fiber Aligner
1120
The Photon Kinetics 1120 Bare Fiber Aligner makes it possible to reduce test setup time to seconds, thereby reducing overall testing cost. Just strip the fiber, scribe and break it (or use a more precise fiber cleaver, if desired) and then insert the prepared end into the 1120. In an instant, the fiber is coupled to your OTDR or chromatic dispersion test system with low optical loss and low reflectance. The 1120's compact, ergonomic industrial design is well-suited for low to moderate volume fiber and cable testing applications where automated fiber alignment systems are less economical. It is particularly useful as part of an in-process or finished cable test station employing either the 8000i or 8000 OTDR, and the OASYS.net OTDR Automation Software.
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Flatness Mirror
10773A
The Keysight 10773A Flatness Mirror is a 100% reflectance mirror that turns the direction of an incoming laser beam 90 degrees. The mirror, used in the 5530 Laser Calibration System, measures flatness in applications such as surface plate calibration. It can be used in place of the 10707A Beam Bender (6 mm or less beam diameter) for applications that require the larger aperture of the 10773A.
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Retro-Reflectometer
The visibility is an important factor for road markings, traffic signs, road studs as well as high-visibility material such as warning clothes and Heavy good vehicles (HGV's) contour safety marking.The measurement of retroreflectivity is essentially a measurement of the reflectance of material under specified geometrical and spectral conditions. Instruments are available for measuring the retroreflectivity of various reflection materials.
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General Purpose Integrating Spheres
General Purpose Integrating Sphere Systems are designed to spatially integrate radiant flux in order to measure optical radiation. The spheres can be coupled with a sensor to create radiometers, photometers, or spectroradiometers in order to measure the total geometric flux emanating from a light source or the flux density of an illuminated area. Additionally, these sphere systems can be used to measure the output of high power lasers and laser diodes or to measure the reflectance and transmittance of materials.
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Hybrid Diffuse Reflectance Spectrometer
Poly602™
Solar Light has developed the fastest performing DRS instruments on the market, keeping product research, formulation and clinical testing in mind. HDRSplus™ software is designed specifically for a clinical testing laboratory environment and simplifies all HDRS calculations.
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Chemical Absorbance Systems
UV-VIS & NIR systems for chemical absorbance measurements 190-2300nmSpectrochemistry Systems include a miniature spectrometer, light source, and sampling accessory such as cuvette holders, dip probes, & flow cellsSpectraWiz Software has built in features for ChemWiz Concentration Analyzer with multivariate chemometric optionsEpisodic capture for kinetics, time series analysis, & batch monitoringEasily convert to fluorescence or reflectance for multi applicationsGreat for Teaching Labs, Research, Process Control & much more!Also see details about our Fluorescence and Raman Systems
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Scatterometers/ Thin Film Metrology Systems
LittleFoot Series
The n&k LittleFoot-CD, and LittleFoot-CD450 are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements (Rs and Rp) from 190nm to 1000nm, with microspot technology. The systems in the LittleFoot-CD Series determine thickness, n and k spectra from 190nm-1000nm of thin films, as well as depths, CDs, and profiles of trenches and contact holes.
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kSA Emissometer
The kSA Emissometer is designed to quickly and easily generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers. Carrier emissivity variation means temperature non-uniformity, which can lead to reduced device yield and possibly complete growth run failure. With the kSA Emissometer, emissivity changes can be tracked to determine carrier end-of-life, without wasting growth runs. The kSA Emissometer also detects unwanted residual deposits after baking, and easily identifies carrier surface defects, scratches, microcracks and pits that are not visible to the eye.
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Integrating Sphere Coating
SP-80
Integrating Spheres are essential tools for photometric research laboratories & lamp / luminaire manufacturers. A good internal coating is essential forintegrating spheres. It is a special water based BariumSulphate (BaSO ) white reflective paint particularly suitablefor internal coating of Integrating Spheres. It offers an almost constant reflectance in the range of 380 nm to 780 nm (visible wavelength range).
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Spectroscopic Reflectometry
Measure reflectance of flat or curved samples with smooth or rough surface.
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Hybrid Diffuse Reflectance Spectrometer
Mono602™
Solar Light has developed the fastest performing DRS instruments on the market, keeping product research, formulation and clinical testing in mind. HDRSplus™ software is designed specifically for a clinical testing laboratory environment and simplifies all HDRS calculations.
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kSA SpectR
The kSA SpectR is a complete metrology solution for measurement of absolute spectral reflectance, growth rate and end point detection. Custom spectral features such as reflectance minima, maxima, inflection points, or baseline scatter level, over a user defined wavelength range of interest, are easily measured.
