Sensor Test
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL
In-Circuit Test System
The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.
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Product
RF Sensor for Spectrum Monitoring
N6841A
RF Sensor
Reduce operating costs with affordable spectrum monitoring and TDOA geolocation measurementsDeploy fully capable RF monitoring stations faster with simple hardware and measurement-specific software24/7 real-time remote spectrum monitoring with Signal Surveyor 4D softwareCapture intermittent signals with spectrum analysis softwareFaster search and signal isolation with broad attenuation and wide dynamic rangeLocate narrow or wideband signals with geolocation software
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Product
3U cPCI Sensor Interface Unit
SIU31
Sensor Interface Unit
NAI's SIU31 is a highly configurable rugged COTS system or subsystem ideally suited for military, industrial, and commercial applications that require high-density I/O, communications, Ethernet switching, and processing. The SIU31 uses one NAI field-proven, 3U cPCI board to deliver off-the-shelf, SWaP-optimized COTS solutions that "Accelerate Your-Time-to-Mission."
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
Universal LightProbe S2 Sensors
LED Sensor
Optomistic Products’ Universal LightProbe S2 Sensors are designed for the In-circuit, Functional or Finished Product test of an LED’s color and/or intensity. Implemented in a unique and customizable 2-Part solution, the S2 Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.
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Product
Thermocouple Power Sensors
N8485A
Power Sensor
N8480 Series Power Sensors are the replacement solutions for 8480 Series Power Sensors.
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Product
Memory Test System
T5830/T5830ES
Test System
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
Power Sensor
8483A
Power Sensor
The 8483A diode power sensor measures average power over the frequency range 100 kHz to 2 GHz and power range -30 to +20 dBm (50 dB dynamic range).
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Product
4-Module ICT System, I307x Series 6
E9903G
In-Circuit Test System
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
In-Circuit Test System Repairs
Test System
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Test System
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
10 MHz - 18 GHz USB Power Sensor
U2000A
Power Sensor
U2000-series USB Average Power Sensor enable fast, simple setup by providing plug-and-play USB connectivity and by eliminating the need for a separate power meter.
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Product
Waveguide Power Sensor
W8486A
Power Sensor
The W8486A waveguide power sensor measures average power over the frequency range 75 GHz to 110 GHz and power range -30 to +20 dBm.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Automotive Test Platform
ETS-800
Test Platform
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Compact Functional Test System
E2230C / TS-5040
Functional Test
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
Functional Test
cUTS
Functional Test
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Product
Desktop PCB Test System
BOARDWALKER 9627
Test System
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
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Product
Regenerative Battery Pack Test System
17020E
Test System
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Product
Test Port Adapter Set, 1.85 Mm To 1.85 Mm
85130H
Test Port Adapter
The Keysight 85130H test port adapter protects the test set port from being directly connected to the device under test. This adapter has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 1.85 mm to 1.85 mm male adapter and a 1.85 mm to 1.85 mm female adapter. The frequency range for these adapters is dc to 67 GHz with a return loss of 23 dB or better.
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Product
Benchtop Automated Functional Test
midUTS
Functional Test
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
10 MHz To 54 GHz LAN Wide Dynamic Range Peak And Average Power Sensor
L2066XA
Power Sensor
Accurately measure any modulated signal with the Keysight Technologies, Inc. U/L2050/60 X-Series wide dynamic range power sensors. The USB/LAN connectivity models come with a wide dynamic range, covering -70 to +26 dBm. This sensor offers very accurate and repeatable power measurements for any modulated signal and comes with a super-fast measurement speed of 50,000 readings/sec, which enables higher manufacturing throughput. Users can also save time and reduce measurement uncertainty with the internal zero and calibration function. The U/L2050/60 X-Series is supported by the Keysight BenchVue software. BenchVue makes it easy to control your power meter to log data and visualize measurements in a wide array of display options without any programming. Simply connect the sensor to your PC installed BenchVue BV0007B Power Meter/Sensor Control and Analysis app to perform average power measurement and analysis.
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Product
10 MHz To 67 GHz LAN Thermal Vacuum Compliance Power Sensor
L2067XT
Power Sensor
Accurately measure any modulated signal with the Keysight Technologies, Inc. U/L2050/60 X-Series wide dynamic range power sensors. The USB/LAN connectivity models come with a wide dynamic range, covering -70 to +26 dBm. This sensor offers very accurate and repeatable power measurements for any modulated signal and comes with a super-fast measurement speed of 50,000 readings/sec, which enables higher manufacturing throughput. Users can also save time and reduce measurement uncertainty with the internal zero and calibration function. The U/L2050/60 X-Series is supported by the Keysight BenchVue software. BenchVue makes it easy to control your power meter to log data and visualize measurements in a wide array of display options without any programming. Simply connect the sensor to your PC installed BenchVue BV0007B Power Meter/Sensor Control and Analysis app to perform average power measurement and analysis.
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Product
NI's Wireless Connectivity Functional Test Solution
Functional Test
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
