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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Atlas LCR Passive Component Meter
LCR40
The Atlas LCR40 automatically identifies and analyses almost any passive component (Inductor, Capacitor or Resistor). It measures its parameters using automatically selected test frequencies (DC, 1kHz, 15kHz and 200kHz).
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DC Current Bias Supply
DC1000A
To guarantee the quality and performance of inductive components such as inductors, chokes and transformers they are tested at their real-life operating point. If the inductor is designed to carry a DC current, then its inductance must be measured with that DC current present. Until now, these measurements were made by an LCR meter connected via special interfacing to a DC bias supply available only from the manufacturer of the LCR meter. The unique NEW DC1000A can be used with any precision LCR meter and connects simply into existing test fixturing.
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Inductor Tester
An impulse can be applied to the coil of a chip power inductor to perform insulation tests (surge tests) within the windings.
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50Hz-100kHz LCR Meter
11022/11025
Chroma Systems Solutions, Inc.
0.1% basic accuracyTransformer test parameters (11025), Turns Ratio, DCR, Mutual Inductance0Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz test frequencies21ms measurement time (≥100Hz)Agilent 4263B LCR Meter commands compatible4 different output resistance modes selectable for non-linear inductor and capacitor measuringHigh resolution in low impedance(0.01mΩ) and high accuracy 0.3% till 100mΩ rangeAdjustable DC bias current up to 200mA (constant 25Ω) (11025)1320 Bias Current Source directly control capability0.01mΩ ~ 99.99MΩ wide measurement range (4 1/2 digits)Dual frequency function (11022 option) for automatic productionBIAS comparator functionComparator function and 8/99 bin-sorting functionPass/fail judge result for automatic productionHandler interface trigger edge (rising/falling) programmableTest signal level monitor functionStandard RS-232, GPIB, and Handler I/FOpen/short zeroing, load correctionLabView® Driver
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LCZ LCR Meter
SS1062
This (SS1061 / SS1062 / SS1063) LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they are actually optimum test instruments for component incoming and production inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor, cable, wire, etc..
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Inductor Test & Packaging Machine
1870D
The Chroma 1870D Series (1870D/1870D-12) are specifically Designed automated test equipment for chip inductors. It comprises Various test functions that are required for verifying chip inductors. In addition, an automated tape packaging machine at the end of production line is equipped to fulfill demand for automated manufacturing.
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200KHz / 10000Freq.Point LCR Meter
MCH-2816A
It has high test frequency of 300kHz and 0.01Hz stepping arbitrary programming, and it has 10mV-2V signal level, all making it meet the precision test requirements of production line quality control, in-coming inspection and lab. Its HANDLER, RS232c interfaces are used for the component automatic sorting system, which provides the conditions for computer telecommunication and test recording. Flexible frequency-response analysis:Due to non-ideal inductor, capacitor and resistor, in order to precisely evaluate the characteristics of one component in one frequency band, MCH2816 could use its signal generation ability with 10mHz resolution to correctly analyze frequency response of the component parameters in any frequency band. In particular, it can do the precise measuring of the resonant impedance of the low-frequency ceramic resonant devices which has wide impedance range.
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Wafer Level Multi-Die Test System
ITC55WLMD
The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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Power Inductor - Impulse Winding Tester
19301A
Chroma Systems Solutions, Inc.
The Chroma 19300 Impulse Winding Tester with high/low inductance test technology has 1000V of impulse voltage and a 200MHz high speed sampling rate that satisfies most power inductor test requirements for a wide range of inductance products from 0.1uH to 100uH. The built-in Area Size Comparison, Differential Area Comparison, FLUTTER value, and LAPLACIAN value functions are able to effectively inspect coils for insulation abnormalities.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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LCZ LCR Meter
SS1061
LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they are actually optimum test instruments for component incoming and production inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor,cable,wire,etc.
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Round Wire Coil Inductors
Round wire coil (RWC) inductors come in six platform sizes and enable the highest efficiency of any SMT inductor through the use of a low loss ferrite core material which minimizes AC losses and also eliminates thermal ageing. The use of round magnetic wire instead of rectangular flat coils enables a lower cost while still maintaining a low DCR and small footprint. The platforms have passed the AEC-Q200 stress test qualification proving the designs robustness and suitability to difficult environments but the parts are not IATF certified. The platform range from 7.6×7.4×6.4mm to 26x26x15mm and are suitable for a wide range of applications and markets including communications, computing and industrial.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Bobbin Winding Coil Tester
SS108A series
Bobbin winding coil testers are used to test various coil of turns. Such as: generator winding turns, transformer winding turns, motor winding turns, inductor winding turns, contactor winding turns, relay winding turns, sparking winding turns, ignition winding turns, speaker voice coil, etc.
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LCR Meters
PeakTech Prüf- und Messtechnik GmbH
A type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component.[1] In the simpler versions of this instrument the impedance was measured internally and converted for display to the corresponding capacitance or inductance value. Readings should be reasonably accurate if the capacitor or inductor device under test does not have a significant resistive component of impedance. More advanced designs measure true inductance or capacitance, as well as the equivalent series resistance of capacitors and the Q factor of inductive components.
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LCZ LCR Meter
SS1063
This (SS1061 / SS1062 / SS1063) LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor,cable,wire,etc.
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Application Software for Electronic Test & Instrumentation
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Communication Test System
CTS-2700
The CTS-2700 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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6TL10 Table Top Test Base
H71001000
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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FADEC/EEC Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
