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PCI Express Test
See Also: PCI Express, PCI Express Analyzers, PCIe
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCI Express 4.0 Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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PCIe Compliance Testing
Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
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PCI Express, PCI, Multi-Interface Test Backplanes
Amfeltec PCI Express, PCI, Multi-Interface Test Backplanes
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PCI Express® 2.0 Protocol Test
The E2960B family is one of the best tools in the industry for PCI Express® 2.0 testing and debug. That’s not just from us, in fact the E2960B series wins the 2007 Best in Test Award – Honorable Mention.
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PCIe 3.0 and 4.0 Compliance Testing
Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 3.0 and PCIe 4.0 specification. This solution combines a Summit Z416 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 3.0 and PCI Express 4.0 Link and Transaction Layer Compliance Testing.
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PCI Express Gen 1 Test Backplane
SKU-015-01
The PCI Express Test Backplane was designed to support production testing/debugging of PCIe-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into one x4 and three x1 PCI Express slots via 7 ft CAT6 cable.
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PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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PCI Express® Electrical Performance Validation and Compliance Software
D9040PCIC
D9040PCIC PCI Express Transmitter Test Compliance Software for PCI Express 4.0 (PCIe 3.x, 2.x and 1.x also supported).
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PCI Express PLL Test Application
N1081PLCA
Keysight N1081PLCA PCI Express PLL Test Application designed to measure transmitter PLL bandwidth and peaking based on the PCI Express 5.0 TX PLL Specifications. Use N1081PLCA PCIe PLL test software to test, debug and characterize your PCIe designs.
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PCI Express 3.0 Test Platform with SMBus Support
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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PCI Express Full Tx Test Suite
SW02PCIE
The PCI Express Full Tx Test Suite is part of the subscription based Oscilloscope Compliance Test Software Suites. In addition to Tx Validation licenses for PCIExpress, this suite also provides the support of the Advanced PCIe Protocol Decode/Trigger Software. This suite supports coverage across the PCI Express technology starting from Gen4. Together with the subscription model, this enables the support and coverage continuity as the PCI Express technology progresses through generations.
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PXIe-8381, x8, MXI-Express Interface, PXI Remote Control Module
782362-01
PXIe, x8, MXI-Express Interface, PXI Remote Control Module—The PXIe‑8381 allows you to control PXI and CompactPCI systems from your PC using a fully transparent MXI‑Express link. It is installed in a PXI chassis and uses a PCI Express‑to‑PCI bridge to interface with an installed PCIe‑8381 through a copper, x1 MXI‑Express cable.
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Standardize Production Test Software For PCBAs And Electronic Devices
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Compact PCI-Express/PXI-Express Module
ACE1553-3U-x-DS
The ACE1553-3U-x-DS is a member of AIM’s new family of compact PCI-Express/PXI-Express modules for analyzing, simulating, monitoring and testing MIL-STD-1553A/B databuses providing 1 or 2 dual redundant bus streams.
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PXIe-8399, Gen 3, x16, 2-Port PXI Remote Control Module
784180-01
PXIe, Gen 3, x16, 2-Port PXI Remote Control Module—The PXIe-8399 enables control of a PXI Express chassis from an external host, such as a desktop PC, rackmount controller, or a separate master chassis. Using a Gen 3 x16 PCI Express link, the PXIe-8399 provides up to 16 GB/s of data transfer between the chassis and host over a copper cable connection. An additional port allows daisy-chaining for multi-chassis configurations.
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Application Software for Electronic Test & Instrumentation
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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6TL22 Off-Line Testing Platform
H71002200
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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PCIe Gen3 x8 FMC Module
VITA 57.1 FMC HPC ConnectorPCIe Gen3/Gen2/Gen1 x8 Slot (upto 64Gbps)Single module supports both PCIe Root Port & EndpointM.2 Key-M NVMe slot with PCIe Gen3 x2 interface & SATA3.0 interfaceMIPI DSI & CSI Connector through LVDS IOs32Kb-EEPROM
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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VR/AR/MR Calibration Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
