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Test Heads
1) interchangeable assembly connecting test signals between DUT and ATE. 2) representation of a human head. 3) provide network test access.
See Also: Heads, Test Probes
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HD Tester with VGA, Audio, Video, HD-TVI
M-HD-360A
Fuzhou Metricu Technology Co Ltd
Analog camera testHD-TVI camera test, HD-CVI camera test, AHD camera testDC12V 1A power outputVGA input, support 1920 x 1200P 60FPSAuto HD, auto recognize HD coax camera type and resolutionUTP cable test, detect the near-end, mid-end and far-end fault point of the network cable crystal head
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Bench Meters
A classic style multimeter with True RMS and phase rotation. This manual ranger covers the electrical parameters you need for HVACR and, with detachable test leads, works with our accessory heads to test non-electrical parameters too. The LT16A meter measures current, resistance, voltage, capacitance, frequency, continuity and more. Test leads store in the meter body along with the tilt stand and magnetic hanger. The body is constructed of durable ABS plastic and a blue backlight makes the large LCD even more visible.
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Head Expanders
By increasing the mounting area of the shaker, multiple items can be tested at the same time, decreasing total test cycle time. In addition, with Guided Head Expanders, payloads with large foot prints can be safely mounted and tested on the shaker, minimizing the risk of damage to the shaker suspension system. Although many head expanders are resonant below 1000 Hz, average or extremal control allows operation to 2000 Hz.
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Air Permeability Tester
TF164B
TESTEX Testing Equipment Systems Ltd.
Our Air Permeability Tester determines the resistance of fabrics (woven, knitted and non-woven textile materials) to the passage of air (air flow) under constant pre-set air pressure while firmly clamped in the test rig of selected test head/area.The specimen is loaded to the test area of the instrument easily by means of a pneumatic holder. By pressing down the holder to start the test. The air permeability tester is equipped with a vacuum pump to draw air through an automatic interchangeable test head with a circular opening. The pre-selected test pressure is automatically maintained, and after a few seconds the air permeability of the test specimen is digitally displayed in the pre-selected unit of measure on the touch panel after test the holder is released and the vacuum pump is shut off.
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Comprehensive Simulation of Master, Slave and End Nodes in A 2 B ® Networks
Infotainment Test Device ITD 1024
The complexity, cost and weight of audio systems are significantly reduced with the Automotive Audio Bus (A 2 B ® ) from Analog Devices Inc. Regardless of their hierarchical structure or use as master or slave, all A 2 B ® products must be adequately tested before use. This applies, for example, to HiFi amplifiers/loudspeakers, head units, eCall systems, microphones, vibration/noise suppression units, actuators or sensors.Our small and very compact infotainment test system ITD 1024 takes on this task for you: It comprehensively and extremely reliably tests all A 2 B ® signals and communication in all phases of the product development process - during development, for validation and in production.
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Mechanical Test Head Housing
a result of more than 10 years' experienceavailable with integrated manipulatorfully integrated docking and board lockingtest housing mechanics design as per customer specificationssuitable for individual and high-volume productionstandard and customized dimensionsno limitation in size and electrical power capacitiesquick and easy locking and unlocking process for board changelarge application space load boardoptional number of channel boards as per customer specificationsfamily/DUT board connection achieved by high-end double-ended spring probes - 50 Ohmhigh-end cooling fansfacilitated adaptation with all available manipulator solutionsdocking design in compliance with customer internal docking standards/dimensionsdocking force as per customer specificationscenter of gravity fully compensated
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Optical Power Meter with Optical Head
GM8012 + 2 X GM8300X
The UC8820 + 2 X UC8820X optical power meter with optical head offer superior performance for the test of DWDM components, AWG & PLC components, optical amplifiers, and other general purpose of fiber optical test and measurement applications. It is special design for volume production line application.
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XCITE 1100 Field Test Series
The Xcite 1100 Field Test Series uses the same Exciter Heads and Master Controller as the 1100 Laboratory Series but replaces the 5 GPM 3-Phase Hydraulic Power Supply with a field portable 1.2 GPM Single Phase Power Supply. While providing the same 3000 PSI pressure, the field test unit is switch selectable from 110 V (20 A) to 220 V (10 A) single phase power.
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Electrical Testers
Actron is an industry leader in electrical testers for your car or home repair projects. Pick your choice of Actron’s digital multimeters to help pinpoint problem areas and determine which components need repair or replacement. Find shorted and open wiring with the help of our circuit testers. Troubleshoot fuel injectors, solenoids, and digital sensors with the Actron Automotive Logic Tester. Use Actron IR thermometers to check AC systems, brakes, catalytic converters, cylinder heads, and overheating electrical components. Use the Actron Videoscope to inspect hard to reach areas. Measure and set spark plug timing on older vehicles, tractors, lawn mowers and more using Actron timing lights. Find bad batteries and faulty charging systems with Actron Battery Load Testers. Our Remote Starter Switches allow one person to conduct tests while cranking or starting the engine.
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Temperature Forcing System
ETF-SERIES
Precise Temperature Accuracies with Reliable Test Results Temperature Limits: -40/-60 °C to 30 °C Temperature Accuracies: ±2-3°C Temperature Rate of Change: 20-25 deg /min (Non-linear) Maintenance Free Access to The System Self-Sufficient System Compact with small footprints suitable for any space constraint laboratories Low decibel system Suitable for testing electronic chips / devices Environmentally friendly refrigerants Efficient heating Microprocessor based single set point PID temperature controller with data logging Flexible hose up to 2.5-3.0m Interchangeable heads according to chip size. Inbuilt electrical control panel with switchgear system
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Exciter Head
The Exciter Head, with its force and displacement transducers, generates and measures the force or torque to the structure being tested and provides feedback signals for control of the test variables.
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Audio + Vision Generation and Monitoring
Test Chest 3G (Multi Function Test)
Quick and very easy to use, the amazing Test Chest boasts instantaneous Audio + Video generation and Monitoring. NO tedious boot-up means Test Chest is “First out of the blocks” every time by 10s of seconds, and it’s intuitive touch-screen speeds Engineers to the required function, saving precious time and giving their investigations a real head start. 10bit precision signal generation is standard with Test Chest, as are the analysis utilities which are displayed on it’s superb 5” high resolution touch screen Monitor screen, and stereo sound too (when present).Ease of use and protection whilst in service are serious matters, so Test Chest is fitted with ‘Ez-Grip’ resillent rubber end sleeves; these assist grip, and provide additional protection against everyday knocks and bumps. During transportation your Test Chest’s tough extruded alloy housing is cradled within a customised go-anywhere foam lined ABS Carry-case for complete protection.
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Inspection Instrument for Indicators
i-Checker
The i-Checker is specially designed to calibrate measuring accuracy of dial indicators, dial test indicators, and other electronic comparison gage heads with a stroke of up to 100mm (4").±(0.2+L/100)µm indication accuracy. Directly inspects an indicator with a stroke of up to 100mm (4"). The dial test indicator, bore gage and lever-type inductive head can be inspected with optional accessories. Adjustment of the measurement position is very easily accomplished because of semi-automatic measurement and full automatic measurement functions. Creates and prints out the simple inspection certificate. Saves inspection result as CSV file for reusable inspection result by any kind of software.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Spring Loaded Contacts
ATE Probes, Pogo pins and Contact Pads. Gold-plated, spring-loaded, capable of thousands of cycles. Probes for Automated Test Equipment (ATE). Various height SMT contact pins. Flat SMT contact pads. Spring loaded contacts consist of a plunger (or head), barrel (or body), and a fully encapsulated fine spring, to provide the spring force required to maintain positive contact. All have a high durability, exceeding 10,000 mating cycles.
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Test Head Manipulators
Cobal 250
The Cobal 250 offers the best-in-class range of motion for universal manipulators with seven degrees of motion. Separate linear movements make it easier for the operator to dock, undock, and redock the test head in seconds. In combination with inTEST EMS docking, the Cobal 250 is compatible with testers for both Wafer Sort and Final Test, minimizing the time and cost when moving a tester between Sort and Final Test.
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Final Test Manipulators
for test heads up to 250 kg / 550 lbsfinal test dedicatedhandler docking prolowest possible floor loadeasy motion in z-direction to facilitate docking processforce feedback control feature ensuring operator safety and protecting equipment during set-upactive cable managementdurable and robust designoptimized footprint for various test heads580 mm linear in/out motion for handler service access160 mm linear side-to-side feature270 column pivoting featurenumerous additional, unique features for individual set-up requirements
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Wafer Probe Loadboards/PIB
DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Manikins for realistic simulation of the acoustic properties of a human
Head & Torso Simulators
If you need to carry out realistic in-situ measurements of headphones, telephones or hearing aids, you need a Head and Torso Simulator such as the B&K ‘HATS’ – Type 4128D or GRAS’ Kemar to complete your test setup. These manikins have built-in ear and mouth simulators that provide a realistic reproduction of the acoustic properties of an average adult human head and torso. They are commonly used for tests on telephone handsets, headsets, audio conference devices, microphones, headphones, hearing aids and hearing protectors. Please contact your sales engineer or email sales@listeninc.com for more information.
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Welding Resistance Tester
WRT
The Welding Resistance Tester is used in battery assembly lines to detect defective intercell connections. It is equipped with a 5-channel test head for car and truck batteries. It features 1-20 O DC resistance ranges and a multi-line LC display for OCV, CCV, and DCR measurements for 5 intercell connections.
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DDR4 Pro 288-Pin DIMM Adapter
INN-8686-18-PRO
Your best option if you need to test a large volume of memory! The RAMCHECK LX DDR4 Pro 288-pin DIMM Adapter (p/n INN-8686-18-PRO) gives RAMCHECK LX users the power to test 288-pin DDR4 modules, including unbuffered (UDIMM), load-reduced (LR-DIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards. It includes the DDR4 Series adapter and DDR4 Pro DIMM test head.
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MEMS-Scanner Evaluation-Kit
The "QSDrive Scan Kit" evaluation kit enables small and medium-sized companies in particular to operate ResoLin components from the Fraunhofer IPMS in accordance with the specifications without the time-consuming in-house development of control electronics. The evaluation kit consists of a ResoLin component – a cardanic MEMS scanner with a linear axis and an optional, orthogonally oriented resonant axis – and control electronics that enable the components to be operated with an optimized trajectory supplied. The component is held by a scan head, which is also included in the scope of delivery and which, thanks to its special construction, can easily be integrated into common optical test setups. Depending on the design of the MEMS component, controlled operation of the component and synchronized operation of the resonant axis are also possible. The function is controlled by software that communicates with the electronics via USB.
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CPRI Interface Panel Kits for Connectivity Testing
RFS’ CPRI Interface Panels are used to test fiber connectivity between Optical Base Band Units (BBU) and Remote Radio Heads (RRH), allowing cell operations and system performance engineers to ensure the best performance without having to disconnect the fiber optical system or disrupt service. In addition, the CPRI panel enables easy RF over CPRI testing at the bottom of the tower, reducing the need for unnecessary tower climbs, thus minimizing maintenance cost and overall OPEX for customers. The RFS CPRI panel is bundled with RFS’ high-quality fiber optic jumpers, providing an end-to-end solution that includes HYBRIFLEX® fiber-to-the-antenna DC and F/O solutions.
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Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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AMIDA 3KS Tester
The AMIDA-3KS test system provides a lower cost, cost-optimized test solution for all consumer power management ICs and portable product components. The AMIDA-3KS tester provides 6 board slots in the test head for the required number of analog board channels, thus reducing the overall system procurement cost, making the cost-effectiveness of each board channel 2 times higher and more flexible. The customer's product testing time is greatly shortened.
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Taber® Rotary Abrasers
5135 & 5155
The Taber® Rotary Abraser is an industry standard used in wear and durability testing and is available with either a single test head or dual testing heads, which allows the user to test two different or identical materials simultaneously.
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Signal Integrity Test Products
RoBAT RCI
*TDR & TDT, Measurement Capabilities*Impedance, Skew, Backdrill measurements*Automated Optical Inspection*DC Electrical Test*Now available with 4 heads*24 port (1 port per channel) TDR/TDT unit*Future capabilities – Fully automated VNA test (4 port S-Parameter Measurement)
