Test Heads
1) interchangeable assembly connecting test signals between DUT and ATE. 2) representation of a human head. 3) provide network test access.
See Also: Heads, Test Probes
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Motorised and Automated Probe Heads
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Motorised heads enable automated, repeatable re-orientation of probes to allow access to features on all faces of the part, improving the capability of the CMM and maximising productivity.
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Product
Test Port Cable, 1 Mm
11500I
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Connect test ports to devices, fixtures, or probe tips with this 8.8-cm cable featuring a return loss of 17 dB minimum.
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Product
Modular Functional Testing Platform
OTP2
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Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Product
110 GHz, 1.0 Mm (m-f) Test Port Cable 10 Cm
11500JK10
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Connect test ports to devices, fixtures, or probe tips with this 10-cm cable
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Product
Channeling Decoder, Nav/Comm/Control Head
RCD200
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Designed to provide the Avionics shop a simple and expeditious method for testing general aviation radio tuning. Provided are front panel mounted LED's as well as a digital display to provide the quickest code recognition while testing. With this simple method of testing you will soon find yourself testing all your radios and finding those troublesome intermittents. This unit also decodes altitude and ARC 1000 serial data. Click on picture for larger view.
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Product
Optical Power Meter with Optical Head
GM8012 + 2 X GM8300X
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The UC8820 + 2 X UC8820X optical power meter with optical head offer superior performance for the test of DWDM components, AWG & PLC components, optical amplifiers, and other general purpose of fiber optical test and measurement applications. It is special design for volume production line application.
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Automated Test Systems
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WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
Probe Head
cViper
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cViper™ is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.
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Product
High-Flow Dual Head Pump
ReaXus PR Class
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The rugged PR Class consists of dual-headed positive displacement piston pumps that provide high accurate flows and excellent pressure capability for a variety of uses. Standard fluid path materials are Stainless Steel, PEEK, and optional Hastelloy. The pumps are designed for a wide range of Preparative and Semi-Prep Chromatography as well as SMBC (simulated moving bed chromatography) and many process and industrial applications. With 100 mL/min and 300 mL/min versions reaching pressures up to 4,000 psi the pumps will meet the most demanding LC and process needs.Features include an integrated Prime-Purge Valve interactive keypad control and complete PC control and status through RS-232 and Micro USB 2.0 ports. The PR Class provides the flow rates and pressures required for high throughput separations.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
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Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
PXI Semiconductor/IC Test System
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A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Kelvin Test Contactor/Probe HEad
cPython
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cPython™ Kelvin contactors and probe heads provide superior electrical and thermal performance with significant cost savings. This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors.cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions. These robust probes provide hundreds of thousands of insertions or touchdowns, and a bandwidth up to 26 GHz.
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Product
Optical Head Interface
N7749C
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The N7749C optical head interface can control two or four 8162-C series optical power meter heads. Readout is supported over LAN and USB interfaces with a built-in web-browser GUI and the SCPI command set common to Keysight optical power meters.
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Product
Remote Radio Head
CMPHEAD
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The separate one-box tester and the R&S®CMPHEAD30 RRH concept allow short RF cable lengths for an optimal link budget in radiated test environments. This approach enables testing of fully assembled FR2 devices and RFICs with both IF and mmWave RF interfaces. The multi-band R&S®CMPHEAD30 covers all important FR2 bands
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Digital Test Instruments
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Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Laser Head Cable, 7 m
10881E
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Provide reliable power with this spade lug that connects the laser head to multiple laser boards.
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Product
Thermopile Laser Power Measuring Heads
HP Series
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The HP25S head is specially designed for portable applications through the use of a smaller heat sink. This gives the head smaller dimensions but means that high powers are only possible for a short time.?
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SoC Test System
V93000 SoC / Smart Scale
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Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Scan Heads
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Blackbird offers a selection of versatile scan heads to help you optimize your process. Our sales team will be happy to assist you in choosing the perfect model for your needs.
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Product
Constant Pressure Dual Head Pump
ReaXus CP Class
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The high performance CP Class consists of dual-headed, positive displacement piston pumps with constant pressure control, covering a wide range of flows, with pressures up to 25,000 psi. Standard fluid path material is Stainless Steel. Other available features include Hastelloy fluid path with jacketed pump heads for temperature controlled processes.The CP Class pumps are widely used for Liquid Chromatography Column packing for 4.6 mm columns, as well as many process applications. The constant-pressure feedback loop automatically adjusts solvent flow to maintain constant system pressure and allows the user to select a wide range of process parameters, including desired pressure set point, ramp rate, and upper flow rate limit.The CP Class is available as standalone units, and also with the Teledyne SSI Column Packing System (called Pack-in-a-Box). Features include:20 mL packing reservoir assembly4.6 mm pre-column assemblyTwo (2) 4.6 mm x 150 mm columns10 gram bottle of C18 stationary phaseBracket assembly to mount packing reservoir to pumpQuick-set disk to allow full control of the packing process through a computerTubing, cables and other necessary fittings for connectionsWith 5 mL/min, 24 mL/min, and 100 mL/min versions, the CP Class will meet most Liquid Chromatography Column packing and process needs.
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Product
7-Meter Laser Head Cable
10882B
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The 10882B 7-meter Laser Head Cable is used to connect the 5519A/B Laser Head to the E1735A USB Axis Module for the 5530 Laser Calibration System.
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
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The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
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Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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RSE Wireless EMC Spurious Emission
TS8996
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The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Wrench Heads
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Mountz offers a range of imperial and metric wrench end fittings for various the Mountz wrench handles. Open ends, box head ends, flare ends, ratchets and blank ends can be supplied in metric or imperial to suit almost every application. Other sizes may be available. For sizes not displayed please contact Mountz Inc.
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Hydrostatic Head Pressure Tester
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Sataton Instruments Technology CO., Ltd
Hydrostatic head pressure tester is designed to determine the resistance to water penetration of materials by hydrostatic pressure method. By measuring the opposition to the passage of water through the tested specimen, the tester is to provide standard testing conditions for operator to note the test terminal point. The tester is primarily intended for ducks, tarpaulins, tentings, waterproof materials and other materials which are used for impermeable application, such as chemical protective clothing or medical protective clothing.
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Constant Pressure Dual Head Pump
ReaXus HF Series
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The HF Series pumps are specifically designed to meet the requirements of Preparative Liquid Chromatography (HPLC) and high pressure Process/Metering applications. The Stainless Steel fluid path will withstand the toughest applications.
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Doppler Sensor Heads
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Designed for long range motion/speed/directional detection where the sensitivity is essential.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
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Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
