Unit Under Test
assures a constituent's interoperability in a system.
See Also: UUT, EUT, System Under Test, Device Under Test
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
Test Fixture, Axial And Radial
16047A
Test Fixture
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
Electronic Control Unit Functional Test
Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Product
Two-Quadrant SMU For Battery Drain Analysis, 20 V
N6781A
Source Measure Unit
The Keysight N6781A is a source / measure unit (SMU) designed specifically for the task of battery drain analysis. Whether the device under test (DUT) is an eBook reader, MP3 player, mobile phone, or pacemaker, the N6781A’s seamless measurement ranging, programmable output resistance, and auxiliary DVM combine the best set of advanced features on the market for battery drain analysis. When used with the 14585A Control and Analysis software, the N6781A becomes an even more powerful battery drain analysis solution, offering additional insights into your measurements. Learn more about the 14585A Control and Analysis software.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
TestStand
test
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
PXI Fault Insertion Switch, 7-Channel, Two Fault Buses, 20 A, Hardware Interlock
40-194A-002-HI
Fault Insertion Unit
The 40-194A-002 is a 7-Channel Fault Insertion switch with hardware interlock and two fault buses, designed for the simulation of fault conditions in automotive systems. As well as high current handling of 20A, very low currents can also be switched.
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Product
SoC Test System
V93000 SoC / Smart Scale
Test System
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
Digital Source Capture Unit
DIO2
Capture Unit
The DIO-II module is a multimode digital source and capture unit. In Low Speed Mode it provides a 20-bit parallel or 24-bit serial I/O capability running at speeds up to 50 MHz. In High Speed Mode, the DIO-II provides a 16-bit parallel I/O capability up to 200 MHz. In both Modes, the Clock is generated by a low jitter PLL source that is capable of generating clocks from 320 kHz up to 1 GHz.
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Product
Compact EMS/EMI Test Platform
CEMS100
Test Platform
Setting up an EMS/EMI test system is a very complex process requiring significant investment. The steps involved include custom planning, design, installation and configuration of various components and standalone instruments as well as the RF shielded anechoic chamber. Rohde & Schwarz offers the standardized R&S®CEMS100 test platform that is the company's first flexible, reliable and cost-effective off-the-shelf solution for radiated EMS measurements in line with IEC/EN 61000-4-3.
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Product
50 µs Pulse Medium Current Source/Measure Unit (MCSMU)
B1514A
Source Measure Unit
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
PXI 30A Fault Insertion Switch 6-chan 2-bus
40-191-012
Fault Insertion Unit
The 40-191-012 is a PXI fault insertion switch using solid state switching elements and is capable of carrying 40A on single channel or 30A on all channels at the same time and provides a robust solution to high current fault insertion.
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Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
Ethernet/AFDX/BroadR-Reach PCI Fault Insertion Switch - 4 Channel
50-201-004
Fault Insertion Unit
This high bandwidth differential PCI fault insertion card is designed to simulate common faults on high speed two wire communication interfaces such as Ethernet. This card supports 4 or 8-channels of two wire serial connections and can be used for simulating faults on Ethernet, AFDX, Broad R-Reach, 100BaseT and 1000BaseT interfaces. Any wire can be set to an open circuit, shorts can be applied across the wire pair, or to the adjacent pair. Fault connections can be made to one of four external signals via two fault buses, typically simulating connections to a supply voltage or ground.
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Product
PXIe-4147, 4-Channel, ±8 V, 3 A Precision PXIe Source Measure Unit
786888-01
Source Measure Unit
PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing engine, you can synchronize SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4147 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
PCB Test System
Circuit Wizard - CW409
Test System
Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
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Product
PXI Digital Test Instrument
PXIe-6943
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Product
Precision Source/Measure Unit, 1 Ch, 10 FA Resolution, 210 V, 1.5 A
B2910BL
Source Measure Unit
The Keysight B2910BL Precision Source / Measure Unit (SMU) is a 1-channel, compact and cost-effective bench-top SMU with the capability to source and measure both voltage and current. It is versatile to perform I/V (current vs. voltage) measurement easily with high accuracy. Integration of 4 quadrant source and measurement capabilities enables I/V measurement simply and easily without configuring multiple instruments.
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Product
USB Source Measure Units
Source Measure Unit
The U272xA is a 3-channel USB SMU that can operate in a 4-quadrant operation. It can function as a standalone module or used as a modular device, allowing expansion and compact solution when used with the other modules in the USB Modular Instruments and DAQ family.
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Product
PXI Single Bus 74-Ch 2A Fault Insertion Switch
40-190B-001
Fault Insertion Unit
The Single Bus, 74 Channel PXI Fault Insertion switch is part of our family of 2 Amp fault insertion solutions, The range includes modules with 74, 64 or 32 channels and single or dual fault buses. This version has normally closed through relays, so in the default state, there is a path between input and output for all signal channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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Product
Fixturing Kit
10744A
Test Fixture
The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
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Product
PXI-2510, 68-Channel, 2 A PXI Signal Insertion Switch Module
778572-10
Fault Insertion Unit
68-Channel, 2 A PXI Signal Insertion Switch Module—The PXI‑2510 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXI‑2510 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
