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Product
Immunity Testing Systems
CIS Series
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The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
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Product
PCI Express 3.0 Test Platform with SMBus Support
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The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
EMC Test Systems
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The sum of EMC is not necessarily equal to its parts; any modular electronic device from a complete aircraft down to a mobile phone needs to meet EMC requirements for the device itself, even if all the individual modules are compliant. For the enormous range of types of modular device requiring EMC test, R&S offers extremely flexible and scalable EMC test systems; practically as modular as the devices under test.
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Product
Stator Test Systems
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Automation Technology's STS-3800 has become the "gold standard" in Stator Testing Equipment. The STS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems, it is backed by the industry leading two-year limited warranty. The STS-3800 offers the most comprehensive testing of stators and fields available.
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Product
Universal Test System
LS6601A
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LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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Product
Relay Test System
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Relay test products that combine a flexible hardware architecture with advanced test software. Relay tests can be constructed within minutes and displayed using a very simple interface, making the system ideal for low-cost production applications.
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Product
Optics Test Systems
F Number Meter
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Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
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Product
Functional Test
xUTS
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Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Brake Test Systems
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Worldwide, high-speed transport is getting more important. Only through continued improvement and expansion of braking systems, will suppliers all around the world provide a solid foundation for safe traffic. HORIBA has been successfully making brake test stands for more than 90 years.
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Product
Vibration Test Systems
G-9 Series
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The G-9 Series Vibration Test Systems, featured by high eccentric moment and a large loading table supported by the unique rigid lateral suspension structure, are suited to transportation tests for relatively large specimens; packaged goods and electric apparatus. In addition, the unique structure enables horizontal tests of relatively heavy specimens without conventional horizontal slip tables.
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Product
WEIGHING SYSTEM TESTING
1006
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The Tester 1006 has a simultaneous control function of up to 4 load cells in any weighing system, upload and download function for programming the DAT and MC 302 series instruments, but it can also be used as a Calibrator and Peak detector. It is very useful for the correct mechanical installation and for fault diagnosis. The Tester 1006 is supplied as standard with cable for connection to our junction boxes / sum mod. CEM 4 / C and CGS 4 / C. Simultaneous display of the signal of each individual load cell allows to control the entire weighing system, weight distribution, overloads, faulty cells and faulty connections. OUT OF PRODUCTION. Pavone systems provides a new version of Tester 1006: Tester 1008.
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Product
Materials Test Systems
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An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Product
Leak Test System
NorCom 2020
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The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.
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Product
Amplifiers And Linear ICs
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For the simplest to the most complex designs, our extensive portfolio of amplifiers and comparators enables you to develop low-risk solutions with minimal risk of a forced redesign. These devices are also backed by our client-driven obsolescence practice of continuing to supply a product for as long as possible and while demand for the product exists.
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Product
ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
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The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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Product
Optics Test Systems
Lens Test
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Optik Elektronik Gerätetechnik GmbH
LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.
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Product
Meter Testing System
ASTel
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Three-phase Meter Test Equipment of ASTeL 3.2x.x series system is a fully automatic system enabling simultaneous, multi-position calibration and legalization of electric energy meters. The automatics include power sources, reference standards, stand controllers, photoelectric scanning heads, separating transformers, and other elements of the system. All these elements are controlled through a Windows based executive program.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
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The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
Digital Logic ICs
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Renesas' general-purpose logic devices support the information equipment and computer fields, which demand small size and high performance. With a variety of power supply voltages, functions, and capabilities, these logic devices provide strong support for specialized applications such as bus switching, level conversion, and clock-related applications.
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Product
Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
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The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
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Product
Laser Diode Burn-in Reliability Test System
58604
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The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
VLF Test System
BAUR PHG 70 portable
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Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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Product
Resonant Testing System
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Originally designed to precrack specimens for fracture mechanics, the current versions offer much more possibilities due to a modular concept:*Bending up to 160 Nm*Tension/Compression up to 8 kN*Torsion
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Product
Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others. Combined with the most comprehensive suite of hybrid characterization techniques, the TI 990 TriboIndenter, TI 980 TriboIndenter, TI Premier Series, and TS 77 Select nanoindenters will keep your materials development at the forefront of technology.
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Product
The Compact AI GigE Vision Systems for the Edge with Intel Movidius Myriad VPU
EOS-i6000-M Series
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The ADLINK AI Plug-and-Play (PnP) Solution is a set of ADLINK AI edge hardware and data connectivity platforms that help our partners build and deploy AI solutions faster and simpler. With ADLINK Data River™ enabled at AI edge platforms, devices, AI inferences, and data integrations, the AI PnP Solution offers a crossplatform, flexible, scalable solution that delivers business value.
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Product
Vibration Test Systems
G-0 Series
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The G-0 Series Vibration Test Systems consist of all-round, rugged, high quality vibration generators energy-efficient solid-state PWM power amplifiers, ideally suited to any vibration tests requiring high reliability such as MIL, IEC and JIS standardized tests for aircraft, automobiles, electronic components, electric apparatus and aerospace equipment.
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Product
Automotive Test Systems
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Ono Sokki Automotive Test Systems - flow meter, non-contact speedometer, engine tachometer, crank angle detector, and more
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Product
Microtester Test Systems
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With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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Product
Multipurpose Mobile PXI DAQ System
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The mobile DAQ system achieves seamless integration among signal conditioning, data acquisition, and synchronization that benchtop instruments would not have achieved. By choosing this system over using benchtop instruments, United Technologies Research Center saved hundreds of thousands of dollars.
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Product
Dynamic Test System
3430-SW
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The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
