ATE
ATE systems are used to test semiconductor devices, printed circuit boards, and electronic systems during manufacturing. AI prompted RL created', prevails upon the UUT to demonstrate It's fulfillment of test requirements.
See Also: Automatic Test Equipment, ATS, Functional ATE, Combinational ATE, Semiconductor Test, PXI Switching, PXI Chassis, PXI Matrix, Automated Test Equipment, Automated Test Systems
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Product
ATE Computer
MS 1201
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This system used for multi-purpose applications such as data acquisition and Automatic Test Equipment. ATE Computer has ISA Bus based eleven slots with inbuilt power supply. Micro Processor board or USB Controller is used to drive the back plane.
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Product
ATE Products
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Microtest ATE portfolio presents special patented solutions to reduce the cost of test.Our innovative ATE offers high multi-site efficiency, zero footprint and lower power consumption.We’re able to drastically reduce the engineering phase time also for special solutions tailored on customers’ needs.
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Product
ATE Parts
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Comware Technical Services, Inc.
We have thousands of parts in stock including hard to find legacy system components. For the best pricing, service and quality look to Comware for replacing your GenRad, Teradyne , Agilent and TRI system parts and modules.
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Product
ATE Test & Engineering Services
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We can provide a limited scope project or a full turn key solution where we analyze a data sheet and provide a full test plan. Our wide range of ATE test equipment and experienced team can support first silicon debug to release to high volume production for a wide range of products, from Digital to RF, including wafer sort and packaged part testing. Test platforms include Verigy, Teradyne, Advantest.
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Product
Automated Discrete Semiconductor Tester (ATE)
5300HX
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The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
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Product
Docking / ATE
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The iDock Series is a series of connectors ideal for use with automatic machine handlers in production testing. Floating bushings allow up to .04" of re-alignment. Use with a combination of various I/O modules and a max of 5,952 signal contacts simultaneously. The iDock series is rated up to 100,000 cycles.
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Product
ATE Test Probes
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For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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Product
ATE / Bench Calibrators & Multimeters
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Time Electronics offer a range of precision calibrators and digital multimeters that can be used in the lab or in automated testing applications. These programmable instruments are designed for precision, performance, and functionality, making them ideal for automatic testing and fault diagnosis. Each designated ATE calibrator is rack mountable for straightforward integration into user systems.
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Product
Generic RF ATE Test
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The Generic RF ATE is developed to test the Radar and Radar Subsystems. The ATE is primarily built using an instrumentation control, precision RF routing systems and rack mounted test instruments. Generic RF ATE system enables measurement of parameters of Radar equipment such as Local Oscillators, Waveform Generators, Up and Down Converters, Analog Receivers, Array Group Receiver Units, TR Modules. The ATE is configured to test the Radars upto 18GHz frequency range.
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Semiconductor ATE Systems
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Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.
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Inbuilt External Controller ATE with Touch Screen Features
QT 200NXT
External Controller
Qmax Test Technologies Pvt. Ltd.
QT 200 nxT is a ultra modern stylish Inbuilt external controller ATE with touch screen features, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software. The vast library support helps you to functionally test host of different IC families. Other features like user-friendly Windows based software, add-on utilities like oscilloscope, RCV meter circuit tracer, etc. makes it a favorite and makes very effective for repairing PCBs without schematic/ circuit diagrams. All these tests are carried out using simple BUT Interface like multipin test clips, probes or custom test fixture
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Product
Link simulation to ATE conversion
VCD2ATE
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VCD2ATECost effective link simulation to ATE conversionDirect conversion from event driven design simulation dump (VCD/EVCD) to specific tester program files. VCD/eVCD to tester conversion Simple and cost effective conversion solution Simple cycle definition in excel High Performance Fast run time Handles very large files >6Gb
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Product
VNAs for Automated Test Equipment (ATE)
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With our USB VNAs your automated test equipment works as one software system running on a single computer. We can customize the analyzer module to fit in your system, provide extra frequency range coverage as compared to our standard VNA models should you need it in your specific application or characterize the expected performance outside the frequency limits of our standard VNAs.
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ATE Design & Build
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PXI has become the de-facto standard for housing the high performance modular instrumentation required to meet the demands of testing today's high performance products. Based on the PCI bus, PXI (PCI Extensions for Instrumentation), this platform is used in most of our new ATE designs.
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Product
ATE System Power Supply, 300 V, 5 A, 1500 W
N5771A
Power Supply
The single output, 1500W N5771A provides universal AC input, GPIB, LAN, USB, LXI compliance, and analog/resistance control of output voltage and current.
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Product
ATE System Integration
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Cyth Systems is a Systems Integration Company specializing in Automated Test (ATE), Embedded Controls, and Machine Vision. Our skilled and experienced team uses their natural talent for problem-solving to create solutions in a wide range of industries. We build our solutions starting with the National Instruments (NI) platforms including LabVIEW and PXI, and by adding best-in class sensors and components.
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Obsolescence Solutions for Legacy ATE
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Our obsolescence solutions, products, and services are used by the DOD and all major Mil/Aero companies to extend the life of their legacy ATE.
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Product
Pin Electronics (PE)/ Pin Drivers ATE
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Analog Devices integrated pin electronics (PE) support speeds up to 2.5Gbps at high accuracy and low power, all manufactured on ADI's proprietary fab processes, providing unmatched test solutions needed for cost-sensitive, test applications.
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Product
Redundant Strap down INS ATE Test Station
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Redundant Strap down Inertial Navigation System (RESINS) checkout test station comprises of cPCI chassis with various functional I/O modules like ADC, DAC, DIO, VFC, Relay matrix, MIL 1553, GPIB, Serial communication interfaces and Custom Built System interface adaptor.
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Product
ATE Self Test Fixtures
AL663
Test Fixture
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Product
ATE Connecting Solutions
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C.C.P. Contact Probes Co., LTD.
Customized pogo towers with high frequency capability.
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Product
Obsolete ATE, Replacement Systems
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No one likes saying goodbye to a faithful old friend but now that the economy is on the up, has the time finally come to replace your ageing Automatic Test Equipment (ATE) or Special to Type test system?
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ATE Core Configurations
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ATE Core Configurations streamline the design, procurement, and deployment of automated test systems with highly integrated mechanical, power, and safety system infrastructure. These off-the-shelf systems reduce lead times and simplify standardization and global deployment. Lower your total cost of ownership for your test systems with ATE Core Configurations.
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Automatic Test Equipment (ATE) Module Products
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Automatic Test Equipment (ATE) Module Products by ADSYS
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Product
Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
Test-Stand Software for TD6 Controller for QMax ATE
TD6 TestStand Software
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Qmax Test Technologies Pvt. Ltd.
The TD6 TestStand will enable the users to sequence and execute their own test programs. The user can browse his/her test program and add it to the TD6 TestStand component. The test program can either be in the form of DLL ( Dynamic Link Library ) or EXE ( Executable ). And, the user can add any number of steps. As of now, we will support only the .Net based test programs. Each and every individual assembly or exe added in the TestStand component will be considered as a single step. All such steps on the whole added in the TestStand component will be considered as 'Sequence'. The same is priced at Rs. 8,42,520.00 plus GST @18% extra. For further details, pls contact sales@qmaxtest.com
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Automated Discrete Semiconductor Tester (ATE)
5000E
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Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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ATE Solutions
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Our custom, application-specific ATE Test Solutions offer a full test suite with Test Systems hardware, software, and support services.
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Product
ATE For ADC Module
MS 1527
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The Semi-ATE is used for testing the analog ADC. It shall carry out the functional test on ADC analog module. The ATE shall have all necessary IO signals on the connector end. The semi-ATE can carry out the functional tests on ADC analog module with host PC or laptop. It provides +15V, -15V, +5V & -5V to module and +2.5V high precision reference voltage. It can able to control keysight N6700B Power supply mainframe using RS422 interface.
