ATE
ATE systems are used to test semiconductor devices, printed circuit boards, and electronic systems during manufacturing. AI prompted RL created', prevails upon the UUT to demonstrate It's fulfillment of test requirements.
See Also: Automatic Test Equipment, ATS, Functional ATE, Combinational ATE, Semiconductor Test, PXI Switching, PXI Chassis, PXI Matrix, Automated Test Equipment, Automated Test Systems
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RF/Microwave ATE Systems
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Over two decades ago, In-Phase Technologies founded our company for the purpose of designing and producing reliable high quality RF and microwave Automated Test Equipment (ATE). We continue that tradition today, providing the best, world-class automated test equipment. Our system designs bring together the right combination of Commercial Off the Shelf (COTS) test equipment, custom designed and built Interface Test Adapters (ITAs), lightning fast and accurate measurement software, and the optimum user interface to make all of this technology easy to use.
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Automated Discrete Semiconductor Tester (ATE)
5000E
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Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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ATE System Integration
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Cyth Systems is a Systems Integration Company specializing in Automated Test (ATE), Embedded Controls, and Machine Vision. Our skilled and experienced team uses their natural talent for problem-solving to create solutions in a wide range of industries. We build our solutions starting with the National Instruments (NI) platforms including LabVIEW and PXI, and by adding best-in class sensors and components.
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Satellite ATE
MS 1123
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Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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6000 Series ATE（AC Source）
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Voltage output has totally six ranges，maximum up to 500V，convenient for 300V above the voltage regulation test
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ATE Design & Build
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PXI has become the de-facto standard for housing the high performance modular instrumentation required to meet the demands of testing today's high performance products. Based on the PCI bus, PXI (PCI Extensions for Instrumentation), this platform is used in most of our new ATE designs.
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ATE & Test Systems
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Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Avionics ATE Power Subsystem
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AMETEK Programmable Power, Inc.
*Provides eight channels of programmable DC power with output isolation function*Output disconnect function*Total control via Ethernet within power supply.*Mounted in custom in transportable shock-mount case.
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9U ATE Rack
MSMI 1014
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- Capable of handling up to 2688 IO signals- Capable of handling up to 1344 Power signals- Portable and Rack mountable- Suitable for more depth PCBs (up to 410mm)- Fourteen PCBs can be accommodated with Fascia plate of 30 mm width
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ATE Integration
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Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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ATE Connecting Solutions
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C.C.P. Contact Probes Co., LTD.
Customized pogo towers with high frequency capability.
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Product
Generic RF ATE Test
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The Generic RF ATE is developed to test the Radar and Radar Subsystems. The ATE is primarily built using an instrumentation control, precision RF routing systems and rack mounted test instruments. Generic RF ATE system enables measurement of parameters of Radar equipment such as Local Oscillators, Waveform Generators, Up and Down Converters, Analog Receivers, Array Group Receiver Units, TR Modules. The ATE is configured to test the Radars upto 18GHz frequency range.
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High Performance VXI Chassis for Military ATE Systems
1261B Series
Chassis
The 1261B high-performance VXI chassis serves as the standard for most military ATE systems. All 1261B chassis include full-power protection features such as overvoltage and overcurrent protection, and also incorporate a quick-check diagnostic connector to verify performance of power supply voltages, currents and specific VXI signals.
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Solar ATE
MS 1534
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The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.
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ATE / Bench Calibrators & Multimeters
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Time Electronics offer a range of precision calibrators and digital multimeters that can be used in the lab or in automated testing applications. These programmable instruments are designed for precision, performance, and functionality, making them ideal for automatic testing and fault diagnosis. Each designated ATE calibrator is rack mountable for straightforward integration into user systems.
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Compact Semiconductor ATE
QST286
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Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST286 is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features makes it ideal for high throughput production testing of wide range of low pin count medium power ICs as listed below but not limited to Optocouplers, Isolators, LEDs, Photo diodes, Photo transistors, Photo sensors, Photo detectors , Analog Mux , Relays and more.
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USB Controlled Multi-Function DAQ For ATE Education And ATEasy Training
GT98901 Series
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The GT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all of which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol. Power for the board is provided via the USB interface, providing a totally self-contained assembly which can provide users with a simple yet complete vehicle that replicates many of the stimulus and measurement functions associated with ATE systems. When combined with Marvin Test Solutions' ATEasy® Test Executive and Test Development environment, the GT98901 is the ideal product for creating and supporting ATE training and education applications.
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RFIC ATE System
RI 7100A
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The RI 7100A, which RI has shipped for over 10 years, has proven itself as the most advanced, reliable (> 4500 hours MTBF) and cost effective RFIC ATE System available. "Our recipe for high performance microwave test has always been dependent on an extremely elegant RF signal path while maintaining the most advanced microwave calibration software," said RI President, Mark Roos.
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Cost-Effective ATE System
PRO RACK ATE
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Qmax Test Technologies Pvt. Ltd.
Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.
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Automated Discrete Semiconductor Tester (ATE)
5300HX
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The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
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ATE Development Services
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Automated Testing Engineering and Automated Test Equipment (ATE) provide a faster, more efficient way to test your product. With the help of LabVIEW and Modular Instruments, our engineers create test and measurement systems for all areas of product design and manufacturing.Whether you are in early stage R&D prototype testing, and design validation, or providing a solution for quality control and life testing our engineers can work with you to design fully customized automated Test Systems using entirely off-the-shelf products to ensure you deliver quality product on time.
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Automatic Test Equipment (ATE) Module Products
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Automatic Test Equipment (ATE) Module Products by ADSYS
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PXI 4 Slot BRIC Solid State 96x8 1-Pole (3 sub-cards)
40-563A-021-96X8
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance PXI matrix requirements and are constructed using solid-state switches. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI 4 Slot BRIC 92x16 1-Pole (4 sub-cards)
40-560A-021-92X16
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high-performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI 8 Slot BRIC 270x8 1-Pole (9 sub-cards)
40-561A-121-270X8
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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High-Power LXI Matrix Modules
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Pickering's high-power LXI matrices are a single pole module available in a variety of configurations and are suitable for power signal routing in large automatic test equipment (ATE) systems. They are available with a selection of X and Y sizes as well as partially populated configurations.
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PXIe Microwave Signal Generator
LSX2091X
Microwave Signal Generator
The LSX2091X is a 20GHz Single Channel PXIe Microwave Signal Generator that offers industry leading performance, in a modern modular 2 slot PXIe format that can be used on the desk, embeded in a system or or easily scaled up to multiple channels ATE systems.
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PXI 4 Slot BRIC 138x16 1-Pole (6 sub-cards)
40-560A-021-138X16
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high-performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
