ATE
ATE systems are used to test semiconductor devices, printed circuit boards, and electronic systems during manufacturing. AI prompted RL created', prevails upon the UUT to demonstrate It's fulfillment of test requirements.
See Also: Automatic Test Equipment, ATS, Functional ATE, Combinational ATE, Semiconductor Test, PXI Switching, PXI Chassis, PXI Matrix, Automated Test Equipment, Automated Test Systems
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ATE Test Probes
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For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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ATE Development
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Aero Engineering Support Group
ATE Development Aero Engineering Support specializes in designs and manufacturing of a wide variety of Automatic Test Equipment (ATE) of support for military avionics, commercial avionics, industrial sector, etc. AESG is committed to providing industry leading equipment that are designed to be scalable and expandable ATE capable of providing reliable functional test solutions for any electronic assembly or Circuit Card Assembly. New from Aero Engineering Support is the A2500 system, providing:
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Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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RWR ATE MKII
MS 1111
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Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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ATE Connecting Solutions
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C.C.P. Contact Probes Co., LTD.
Customized pogo towers with high frequency capability.
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ATE Integration
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Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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Product
ATE Computer
MS 1201
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This system used for multi-purpose applications such as data acquisition and Automatic Test Equipment. ATE Computer has ISA Bus based eleven slots with inbuilt power supply. Micro Processor board or USB Controller is used to drive the back plane.
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RF ATE Tester
ADIVIC MP5800/MP5806
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MP5800 seamlessly upgrades your existing Chroma 3380, 3650 to RF ready ATE test solution, user friendly debug tools, IOT turnkey test solution.
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RFIC ATE System
RI 7100A
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The RI 7100A, which RI has shipped for over 10 years, has proven itself as the most advanced, reliable (> 4500 hours MTBF) and cost effective RFIC ATE System available. "Our recipe for high performance microwave test has always been dependent on an extremely elegant RF signal path while maintaining the most advanced microwave calibration software," said RI President, Mark Roos.
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Automatic Test Equipment (ATE) Automatic Electrical Measurement Platform
i7000 Series
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Automatic Test Equipment (ATE) Automatic Electrical Measurement Platform by ADSYS
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Product
ATE For ADC Module
MS 1527
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The Semi-ATE is used for testing the analog ADC. It shall carry out the functional test on ADC analog module. The ATE shall have all necessary IO signals on the connector end. The semi-ATE can carry out the functional tests on ADC analog module with host PC or laptop. It provides +15V, -15V, +5V & -5V to module and +2.5V high precision reference voltage. It can able to control keysight N6700B Power supply mainframe using RS422 interface.
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RF ATE
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IFF-7300S Series IFF/Crypto/TACAN Automated Test System. IRIS 2000/IRS 1200 ATE Software Revision Service. RF Expansion Module (RFEM).
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ATE System Power Supplies
N8700 Series
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The Keysight N8700 Series ATE system power supply delivers high current with low noise in a compact two unit package. Airflow moves front to back, so no additional space is required above or below the power supply in your automated test equipment (ATE) rack. This series of programmable power supplies sources up to 3300 or 5200 W. Get output voltages from 8 to 600 V and 5.5 to 400 A.
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ATE System Power Supply, 300 V, 5 A, 1500 W
N5771A
Power Supply
The single output, 1500W N5771A provides universal AC input, GPIB, LAN, USB, LXI compliance, and analog/resistance control of output voltage and current.
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ATE Development Services
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Automated Testing Engineering and Automated Test Equipment (ATE) provide a faster, more efficient way to test your product. With the help of LabVIEW and Modular Instruments, our engineers create test and measurement systems for all areas of product design and manufacturing.Whether you are in early stage R&D prototype testing, and design validation, or providing a solution for quality control and life testing our engineers can work with you to design fully customized automated Test Systems using entirely off-the-shelf products to ensure you deliver quality product on time.
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Device Power Supply (DPS) & Parametric Measurement Units (PMU) ATE
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Analog Devices’ parametric measurement units (PMUs) and device power supply (DPS) products offer a flexible range of voltage and current source/measurement capability to meet the needs of a wide range of cost-sensitive test applications. With a proven track record, Analog Devices’ PMU and DPS products serve a wide variety of precision test application requirements, such as measurement and control for voltage and current. Analog Devices’ DPS and PMU products are equipped with unique precision measurement and control capability for today's demanding ATE solutions.
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ATE Test & Engineering Services
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We can provide a limited scope project or a full turn key solution where we analyze a data sheet and provide a full test plan. Our wide range of ATE test equipment and experienced team can support first silicon debug to release to high volume production for a wide range of products, from Digital to RF, including wafer sort and packaged part testing. Test platforms include Verigy, Teradyne, Advantest.
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ATE Solutions
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Our custom, application-specific ATE Test Solutions offer a full test suite with Test Systems hardware, software, and support services.
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ATE / Bench Calibrators & Multimeters
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Time Electronics offer a range of precision calibrators and digital multimeters that can be used in the lab or in automated testing applications. These programmable instruments are designed for precision, performance, and functionality, making them ideal for automatic testing and fault diagnosis. Each designated ATE calibrator is rack mountable for straightforward integration into user systems.
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Product
Link simulation to ATE conversion
VCD2ATE
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VCD2ATECost effective link simulation to ATE conversionDirect conversion from event driven design simulation dump (VCD/EVCD) to specific tester program files. VCD/eVCD to tester conversion Simple and cost effective conversion solution Simple cycle definition in excel High Performance Fast run time Handles very large files >6Gb
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Semiconductor ATE Systems
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Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.
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RF/Microwave ATE Systems
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Over two decades ago, In-Phase Technologies founded our company for the purpose of designing and producing reliable high quality RF and microwave Automated Test Equipment (ATE). We continue that tradition today, providing the best, world-class automated test equipment. Our system designs bring together the right combination of Commercial Off the Shelf (COTS) test equipment, custom designed and built Interface Test Adapters (ITAs), lightning fast and accurate measurement software, and the optimum user interface to make all of this technology easy to use.
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Pin Electronics (PE)/ Pin Drivers ATE
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Analog Devices integrated pin electronics (PE) support speeds up to 2.5Gbps at high accuracy and low power, all manufactured on ADI's proprietary fab processes, providing unmatched test solutions needed for cost-sensitive, test applications.
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Product
PXI 4 Slot BRIC 44x16 2-pole (4 sub-cards)
40-562A-022-44X16
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Track and Hold Data
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Track and hold amplifiers are used to expand the bandwidth and/or high-frequency linearity of high-speed A/D conversion and signal acquisition systems. Track and Hold Amplifiers can be used in various applications including RF ATE Applications, Digital Sampling Oscilloscopes, RF Demodulation Systems, Digital Receiver Systems, High Speed Peak Detectors, Software Defined Radio, Radar, ECM & ELINT Systems and High Speed DAC De-Glitching.
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Electric Vehicle Test Solution
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As the automotive industry advances power conversion and battery technologies, Chroma has been actively working to improve electric vehicle (EV) testing performance and cost by developing flexible automated power conversion test platforms and regenerative battery test systems. Chroma ATE is a world leading manufacturer of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and turnkey test and automation solutions. Chroma’s Automated Test Systems for Electric and Hybrid Electric Vehicles consist of standard test platforms that are combined into one expandable test system that can test most power components in an EV’s power system. Compared to specialized test equipment developed for a single EV model or application, Chroma’s systems provide greater flexibility.
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PXI 2 Amp MUX, Dual 32-Channel 1-Pole
40-635-005
Multiplexer Module
The 40-635 2 Amp Multiplexer module is available in 9 standard configurations as well as 9 half density configurations, all using high quality electro-mechanical signal relays allowing each channel to switch current up to 2A and voltage up to 300VDC/250VAC. The module is suitable for signal routing in ATE and data acquisition systems. Connections are made via a front panel 78-way D-type connector.
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PXI 8 Slot BRIC 460x4 1-Pole (5 sub-cards)
40-560A-121-460X4
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high-performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
