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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Digital Acquisition Card
PI-41000
The PI-41000-4G is a CompactPCI® bus based instrument card that allows the user to capture up to 32-bits of digital data into an on-board memory at clock rates up to 120 MHz. The inputs are software configurable to provide one 32-bit wide channel, one 16-bit wide channel with double depth or two 16-bit channels. When configured with a single 16-bit input, the card will capture at up to 120 MHz. When configured with two 16-bit inputs or as a single 32-bit input, the card will capture at up to 80 MHz. Each digital data channel requires three timing signals, frame, line and pixel to accommodate the data capture. When operating in a two channel mode, clocks from channel A can be used to provide timing to channel B. For wider words or multiple channels, more boards can be used in parallel.
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FLIM Upgrades for Nikon
A1 / C1 / C2
*bh FLIM Embedded in Nikon NIS-Elements Software*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Excitation by bh ps Diode Lasers*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Excellent Timing Stability*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Detection Wavelength Range from 360 nm to 700 nm
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8 Channel 250 MHz 12-bit ADC/Digitizer
SIS3320-250
8 channel 6U VME digitizer/transient recorder with a sampling rate of up to 250 MHz (for the individual channel) and 12-bit resolution. The board has a width of one VME slot (4TE). The boards multi event and readout in parallel to acquisition functionality make the card the choice for many demanding digitizer applications.
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Ball Pressure Test Apparatus
CX-Q03
Shenzhen Chuangxin Instruments Co., Ltd.
The Ball Pressure Apparatus is used to check the integrity of dielectric materials by exerting 20N force. The BPA10 is called out in IEC 60335, 60950, 61010, UL, CSA and European Norms. It is used to check the integrity of dielectric materials by exerting 20N force. The Ball Pressure Apparatus is made of stainless steel for long life. Since accelerated life procedures are used for this oven test, more than one apparatus may be useful for parallel testing.
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Switch Mode Power Supplies-Water Cooled
The MSW Rectifiers are based on Switch Mode Technology. This reliable technology assures excellent quality DC currents with a ripple of < 3% and a control accuracy of less than 1%.The MS-Series features constant voltage and current control with easy, quick installation and maintenance. Modular versions easily increase the output by means of series or parallel connection. All models have DC short circuit protection. With forced air-cooled models, the cooling air quantity is controlled in relation to the load reducing contamination and noise levels.
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High Speed DC Electronic Load
6330A series
The 6330A family offers 8 types of modular loads with power ranging from 30 watts to 1200 watts, current from 0.5mA to 240A, and voltage measurement from 0.5mV to 500V. Each load is isolated and floating, programmable in dual current range and measuring voltage range, and capable of synchronizing with other modules for control operating. The load can be operated in constant current, constant voltage, and constant resistance. With Synchronic parallel control capability, 6330A series loads allow users to parallel and synchronize more than one load together from an internal loading control signal. This feature provides synchronic dynamic loading test for multi-output power and high power test solution. Real time measurement of voltage, current, is integrated into each 6330A load module using a 16-bit precision measurement circuit. The user can perform on line voltage measurement and adjustment, or simulate short circuit test using the simple keypad on the front panel.
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Non-isolated Digital I/O ISA DAQ Cards
PCI-bus non-isolated digital I/O cards for parallel data transfer, TTL DIO, DTL and CMOS DIO logic signal sensing.
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Earth Ground Clamp
1630-2
The 1630-2 FC clamp measures earth ground loop resistances for multi-grounded systems using the dual-clamp jaw. This test technique eliminates the dangerous and time-consuming activity of disconnecting parallel grounds, as well as the process of finding suitable locations for auxiliary test stakes.
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Analog Meter
PR-A Series
The PR-A Series of series-regulated CV/CC power supplied were designed to provide a compact power supply package with high performance, and ensure excellent reliability as well as excellent design. Four types are available, three 18V types and one 36V type. Whether used individually or connected in series or parallel for greater capacity, the PR-A Series are housed in a compact rack-mount package and can be used on the bench top as well.
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Wattmeter
PowerMaster II for SO2R
The Power Master II wattmeter has the ability to have two couplers connected to it, and it has provision to allow switching very easily between the two couplers through only two button presses on the front panel.When operating SO2R, you do not want to have to toggle from one coupler to another. We make matched couplers available for SO2R users and due to the nature of these couplers being high impedancedevices, we can actually connect the two coupler inputs in parallel and instead of toggling between the two couplers, they will both be connected and active at the same time. The first step is to disconnect all connections to the rear panel of your Power Master II and remove the two #6-32 philips screws on either side of the cabinet.
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InGaAs Optical Power Head
81624C
The new 81624C optical power head provides a 5 mm detector area and allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The 81624C accepts parallel beams with up to 4 mm diameter, standard SM fiber and MM fiber with max. 100 μm core diameter, NA ≤ 0.3. A wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
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2-Slot BRIC, 256x4, 1Pole, PXI Matrix (2 Sub-cards)
40-559-201-256x4
This range of BRIC ultra-high-density large PXI matrices are available in 2, 4 or 8-slot PXI sizes to suit all high-performance matrix requirements and are constructed using Pickering Electronics' 4mm x 4mm instrumentation quality reed relays. With their high level of switching density, these PXI matrices allow a complete Functional ATE system to be housed in a single 3U PXI chassis and allow the use of much lower cost 8 or 14-slot chassis. The 40-559 matrices can be used in many industries; typical applications include automotive ECU and semiconductor package testing. Dual analog busing for the narrower matrix options, enable completely separate matrices within a single module for parallel testing.
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GPGPU Processor
VPX6-4955
Curtiss-Wright Defense Solutions
The VPX6-4955 delivers incredible processing power from not one, but two NVIDIA Quadro Turing TU104 GPUs, providing a remarkable 6144 CUDA cores for parallel processing and a 50% improvement in performance per CUDA core compared to the previous Pascal generation.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Motor/Gasoline Engine RPM Detector
OM-1500/1200
The OM-1500/1200 motor/gasoline engine RPM detector is designed for rotation measurement of a gasoline engine and an EV/HEV motor. It detects magnetic flux leakage from the motor itself or the engine’s ignition coil.This easy to use and durable detector can measure engine rotation by attaching in parallel with the ignition coil. When the EV/HEV motor rotation is measured, attach the OM-1500/1200 perpendicular to the motor rotating shaft.It is used with the engine tachometer by Ono Sokki (GE-2500, AR-7240B, CT-6520B, HT-6200, SE-1620, FT-2500, FT-7200).
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Powered VXS Crates
VXS - "VME-bus switched serial" is the new ANSI / VITA 41 standard which combines the 32-bit parallel VME-bus with high speed switched serial interconnect fabrics in order to increase the data transfer bandwidth to several GB/s.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Test System
LPDDR4 and LPDDR3
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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EV1018 Test System
The EV1018 test system leverages AXIe and PXI/PXIe standards to provide high-end semiconductor ATE performance in a compact, low-cost, industry standards based form factor. With support for a wide range of digital, analog and RF instrumentation, the EV1018 is perfectly suited for post-silicon validation and characterization as well as multi-site production test of consumer digital and wireless devices. Low latency, high speed PCI/PCIe infrastructure, combined with industry leading settling times, give the EV1018 exceptionally fast test times and high parallel test efficiency.
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Low-power, High-performance FPGA
iCE40 LP/HX
*Available in three series with LUTs ranging from 384 to 7680: Low power (LP) and high performance (HX)*Integrated hard I2C and SPI cores that enable flexible device configuration through SPI*Match your preferred display to your application processor with interfaces such as RGB, 7:1 LVDS and MIPI DPI/DBI*Multi-source your image sensors by implementing flexible bridges supporting common interfaces such as HiSPi, subLVDS, LVDS and Parallel LVCMOS*Up to 128 kbits sysMEM™ Embedded Block RAM*Industry’s broadest range of 0.35 mm - 0.40 mm pitch BGAs fit in space-constrained applications
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4-Port In-System Programmer for Cypress
MPQ-PSoC
Supports Cypress PSoC/3/5 and enCoRe II/III/V device families Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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Power Supplies
Our short-circuit-proof, single or triple-phase power supplies for automation are approved according to CE/TÜV, UL and CCC. Different voltages of 12 V, 24 V and 48 V can be selected. The most important features: top-hat rail assembly, status display, regulatable output voltage, parallel connection, ready and alarm output. Output power of 18 to 960 W. Protection class IP20.
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Tabletop Mask Aligner
Model 200
The OAI Model 200 Mask Aligner is a cost-effective high performance mask Aligner that has been engineered with industry proven components that have made OAI a leader in the photolithography capital equipment industry. The Model 200 is a tableop mask Aligner that requires minimal cleanroom space. It offers an economic alternative for R&D, or limited scale, pilot production. Utilizing an innovative, air bearing / vacuum chuck leveling system, the substrate is leveled quickly and gently, for parallel photo mask alignment and uniform contact across the wafer during contact exposure. The system is capable of one micron resolution and alignment precision.
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BiGEN Power Supplies
BiRa Systems and TDK-Lambda collaborated to develop and support an accelerator laboratory family of programmable DC power supplies. The BiGEN family of power supplies provides many features including EPICS compatibility, interlock monitoring, precision current regulation, and air filter kits to fit the harsh accelerator environment. The BiGEN family of power supplies was based on the TDK-Lambda Genesys™ power supplies which can be configured in parallel and series for additional output power.
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Battery Capacity Tester
BLU-C Series
BLU-C is the latest solution from DV Power for conducting a comprehensive battery capacity test. This universal instrument is applicable to any battery string, such as lead-acid, Li-Ion, Ni-Cd, and others, with voltages up to 800 V DC.BLU-C tester simplifies battery testing in multiple ways. The instrument provides monitoring of discharge parameters (graphically and numerically) in real-time on a 7-inch touch screen display. The instrument also enables measurement and monitoring of cell parameters (voltage/intercell voltage/temperature), which makes it a complete stand-alone discharge test system.The capacity tester is compatible with DV-B Win software. Because of that, the user can view detailed numerical and graphical presentations of key parameters, and create reports in various formats.The capacity test is performed in a user-friendly way according to battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22 and other.The battery tester enables setting the discharge current up to 300 A, with 0,1 A resolution. If higher currents are required, BLU-C units can be connected in parallel, or BXL additional load units can be used.The user can select one of three discharge modes: Constant current, Constant power, Constant resistance. Additionally, different battery duty cycles can be simulated using user-selectable discharge profiles.Testing can be carried out without disconnecting the battery from the equipment it supplies.
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Digital I/O Card
PCI-DIO-120
The PCI-DIO-120, PCI-DIO-96 and PCI-DIO-72 are parallel digital input/output cards designed for use in PCI-Bus computers. The same printed circuit board is used for all three models and is populated for 120 bits, 96 bits and 72 bits respectively. The card is 12.2 inches (310 mm) long and may be installed in any 5-volt PCI slot in IBM and compatible computers.
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IP Parallel IO
IndustryPack compatible IP-Parallel-IO with counter and timer design adds up to 48 digital parallel IO lines to one IP slot of your carrier board.
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Fixed Mount Strobes
Our fixed mount stroboscopes are designed for installation in applications requiring continuous stroboscopic visual inspection. The MVS is available with xenon or LED light output with adjustable pulse width and focal distance for optimized target illumination. Connect your existing trigger signal or the optional Frequency Controller with LCD. Connect multiple units together in parallel for applications with wide illumination area requirements. Use the optional Audio Interface Box and microphone to create stunning audio driven visual effects.
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TestStation Multi-Site Inline
TestStation Multi-Site Inline is the most productive, lowest cost in-circuit test solution. This "zero-footprint" inline test system provides true 2x-4x parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
