-
Product
Fatigue Rated Low Profile Cells
-
Fatigue rated load cells are specifically designed for component durability and fatigue test machines where highly cyclical loading is present. These rugged load cells are extremely resistant to extraneous bending and side loading forces. They are used for material testing, component life cycle testing and structural testing. All fatigue rated load cells are guaranteed against fatigue failure for 100 million fully reversed cycles.
-
Product
3 Position Plug Socket Switch Life Tester
CZKS-3
-
It is designed according to terms and conditions of IEC60884-1, IEC60669-1, GB2099.1-2008 and GB16915.1-2003, for life test of plug and socket and switch products of household and similar use appliances.The device can connect with matched load cabinet, in order to conduct a test of electrical life, normal operation and breaking capacity. The equipment provides some clamps. It can test plug and socket production, wall switch, rocker switch, dial plate switch and button switch.
-
Product
Aging and Life Test Rack
SY2036
-
SY2036 Aging and life test rack is fully designed according to the IEC standard, and can also be designed based on the customer request. SY2036 can test LED, CFL, HID Indoor lamp and Outdoor lamp. Input Power supply: AC220V, 50/60HZ, 12KVA Min (110V is option) • Built-in transformer: 0-250V 5KVA and 0-300V 5KVA (Other power is option) • Maximum power for EUT: 5KVA and 12A (Other power is option) • EUT and Number: 112pcs B22, 112pcs E27. 36pcs T5/T8/T12 Tube. 32pcs LED panel (Other EUT can be designed according to customer request) • ON/OFF test: Can be set on the touch screen with program • Test number: 0~99999（Adjustable）
-
Product
Temperature/Humidity Vibration Test Systems
EHVC SERIES
-
The EHVC Series is designed for highly accelerated life testing, the demand of which from customers is increasing today. This is a joint system of the AGREE chamber and thermal shock chamber that we have manufactured and makes the temperature rate up to 20℃/min feasible with a compressor only. With this feature, the highly accelerated life test such as AGREE tests, most thermal shock tests can be performed with one unit.
-
Product
LT-500A Aging-Life Test System For LED Luminaires
-
Hangzhou Everfine Photo-E-Info Co., LTD
LT-500A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
-
Product
6-12V Circuit Tester
TE6-0704
-
Hangzhou Tonny Electric & Tools Co., Ltd.
Do-it-yourself quality. 6-12 volt tester. Tests circuits with power on. Reliable and economical. Tests circuits, lights and fuses. Lights for easy visibility. Durably designed for a long service life . For testing 6-12 volt systems for wire breaks, shorts, fuses, lamps, relays, armatures and more. Suite able for a broad range of household, car, trucks, boats, trailers, vans, motorcycles, industrial and commercial uses.
-
Product
OLED Life Time Test System
-
A system for measuring measurement items (brightness and so forth through Voltage, Current, and Photodiode) and their lifetime in intervals of set time, while supplying power to multiple (32 Channel) OLED panel stably.
-
Product
Non-Nitrogen HALT Chamber
-
An advanced environmental test system that performs Highly Accelerated Life Testing (HALT) without relying on costly liquid nitrogen (LN2) for rapid cooling.
-
Product
High Accelerated Life Test Chamber
-
Guangdong Test EQ Equipment co., Ltd.
- Rapid Temperature Cycling: Achieves rates up to 100°C/min for accelerated stress screening hass.- Multi-Axis Vibration: Combines pneumatic (6-DOF) and electrodynamic vibration for multi-stress accelerated life testing halt simulations.- Precision Control: halt process ±0.5°C temperature uniformity and real-time monitoring.- Customizable Profiles: Supports stress levels user-defined stress protocols (step-stress, dwell times).- Durability: Robust construction with corrosion-resistant materials
-
Product
Laser Diode Testing
-
The low power series of burn-in and life test systems are designed to test the reliability of low power laser diodes up to 1 Amp in current. The modular design means they can test up to 2,048 lasers, however due to the flexibility of the system, it can be adapted to suit both low volume R&D environments and high volume production environments.
-
Product
Power Cycling Semiconductor Life Test System
ITC52300
-
The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
-
Product
HV Test bench
-
It is a deeply customizable test bench which is suitable to generate frequency and amplitude controlled voltage. This test bench could be used for life test or quality test on samples or devices. It can be configured both for sinusoidal test (STANDARD version) and both for square wave or pulse test (TechSQUARE). It includes safety systems for avoiding overload and incorrect use.
-
Product
Stability Chambers
-
Lunaire Environmental is a leading manufacturer of steady state and shelf life testing chambers and walk-in rooms which provide constant climate testing and meet ICH guidelines. These steady state chambers and rooms are perfect for long-term material testing on packaged products in controlled temperature storage. Lunaire steady state climatic test chambers are also ideal for research facilities and laboratories because they simulate wide range of temperature, and temperature and humidity environments. Click here for an overview brochure on Tenney and Lunaire equipment offerings.
-
Product
Stability and Shelf Life Test Chambers / Rooms
-
Steady state environmental temperature and humidity walk in rooms for pharmaceutical, medical, electronics, personal care, research and development and consumer products applications. Meets all ICH guidelines. Flexible sizes. For stability and shelf life testing, package testing, accelerated aging, drying, burn in, reliability testing, controlled temperature storage, incubation, and cold room applications.
-
Product
Low Temperature Operating Life (LTOL) Test
LTOL
-
LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
-
Product
Turn-Key Short Circuit Laboratories
-
For low and medium voltage switchgear including :*Circuit breakers*Contactors*Disconnect switches*Fuses*Miniature circuit breakersApplied tests for low and medium voltage switchgear :*Dielectric withstand test*Impulse withstand test*Breaking capacity test*Mechanical life testElectrical life test*Over load performance test*Short circuit breaking capacity test**Short time short circuit impulse current test*Temperature rise test*Operation performance testTests for low & medium voltage panels :*Short time short circuit impulse current test*Dielectric test*Impulse withstand voltage test*Temperature rise test
-
Product
NTS Platform
Test Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
-
Product
Digital (1kV up) H.V. Insulation Testers
6212A IN (Ranges: 0.5kV to 10kV 0.5kV increment steps)
-
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● 2 ×16 characters; large intelligent LCD module.● 20 Insulation test voltages 500V, 1kV, 1.5kV, 2kV, 2.5kV, 3kV, 3.5kV, 4kV, 4.5kV, 5kV, 5.5kV, 6kV, 6.5kV, 7kV, 7.5kV, 8kV, 8.5kV, 9kV, 9.5kV, 10kV.● Ener-Save™ feature to extend battery life.● Bargraph indicates test voltage; rise and decay can be observed.● Visual and audible warning if external voltage is present(>500Vac or Vdc.)● Insulation resistance; auto-ranging on all ranges.● Overload protection.● Low battery indicator (read time battery voltage measurement).● Measures insulation time duration of the test.● Low battery consumption.● Better than 10% accuracy on all ranges.● Auto-off.
-
Product
Digital (1kV up) H.V. Insulation Testers
6213A IN (Ranges: 0.5kV to 10kV 0.5kV increment steps)
-
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● 2 ×16 characters; large intelligent LCD module.● 20 Insulation test voltages 500V, 1kV, 1.5kV, 2kV, 2.5kV, 3kV, 3.5kV, 4kV, 4.5kV, 5kV, 5.5kV, 6kV, 6.5kV, 7kV, 7.5kV, 8kV, 8.5kV, 9kV, 9.5kV, 10kV.● Ener-Save™ feature to extend battery life.● Bar-graph indicates test voltage; rise and decay can be observed.● Visual and audible warning if external voltage is present (>500Vac or Vdc.)● Insulation resistance; auto-ranging on all ranges.● Overload protection.● Low battery indicator (read time battery voltage measurement).● Measures insulation time duration of the test.● Low battery consumption.● Better than 10% accuracy on all ranges.● Auto-off.● Calculates Dielectric Absorption Ratio (DAR) automatically.● Calculates Polarization Index (PI) automatically.
-
Product
RF-Ready DC Fixture
-
The RF-Ready DC fixture provides space for mounting RF input and output matching circuits. Hence, it is possible to tune up the assembly at a remote test station, such as a network analyzer, to peak performance and then run the life test with DC stimulus. The matching structures also allow incorporation of more complex stabilization structures.
-
Product
HALT Test Service
-
HALT, Highly Accelerated Life Test is a system design validation tool for maximum robustness verification. In a step stress approach a system under functional test and operational conditions is check for functional and destruct limits.
-
Product
Accelerated Product Life Cycle
-
Delserro Engineering Solutions
Under normal conditions it may take years to gather failure data on the life cycle of new products. Through accelerated life testing the overall time to failure can be reduced to weeks by increasing the frequency of the field loads and by removing insignificant stress components. In addition, life cycle testing on a product can be reduced or accelerated dramatically by increasing the stress levels to higher than normal. Putting a product through Accelerated Life Testing can reduce test time from weeks to days while still achieving satisfactory results saving both time and money.
-
Product
Electric Vehicle Battery Cell Tester
MCV
-
The MCV is a low-current life cycle test system for development of primary and rechargeable batteries in various chemistries. Operating from a common microprocessor, multiple circuits in the MCV module can run individual test programs. Additionally, the MCV is designed and built for ease of maintenance and service. The modular construction means that most subassemblies, large or small, remove easily for service outside the cabinet and fast replacement.
-
Product
Testing & Measurement Services
-
Delserro Engineering Solutions
Delserro Engineering Solutions is your complete source forHALT/HASS, Accelerated Life Testing, Environmental Testing, Lead Free Solder Joint Reliability Testing, Linear andNon-Linear FEA, Computational Fluid Dynamics (CFD)
-
Product
ATE Development Services
-
Automated Testing Engineering and Automated Test Equipment (ATE) provide a faster, more efficient way to test your product. With the help of LabVIEW and Modular Instruments, our engineers create test and measurement systems for all areas of product design and manufacturing.Whether you are in early stage R&D prototype testing, and design validation, or providing a solution for quality control and life testing our engineers can work with you to design fully customized automated Test Systems using entirely off-the-shelf products to ensure you deliver quality product on time.
-
Product
Laser Diode Life Test
-
Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
-
Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
-
Product
Research & Electronic Test Products
test
he CAL-AV Research & Electronic Test Product line includes Explosive Test Site Range Instrumentation, Illuminated Laser Warning Signs and Special Projects.. Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
-
Product
Infotainment Test for Automotive Applications
test
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
-
Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
