3D X-ray
produces three dimensional images inspecting target object's surface and below.
-
product
3D Micro Coordinate Measurement Machine and Surface Roughness Measurement Device
InfiniteFocusSL
With the InfiniteFocusSL you are able to measure form and roughness of your components with only one system. In addition, color images with high contrast and depth of focus are achieved. The robust frame and the intelligent illumination technology provide fast and high-resolution measurement in the laboratory and a production near environment. The measurement system is particularly attractive due to its cost effectiveness, measurement speed and usability. The long working distance in combination with the above average measurement field allows a wide range of applications. Measurements are achieved within seconds, and features, such as a coaxial laser for quick and easy focusing, enhance its usability.
-
product
X-ray and CT Inspection Systems
YXLON X-ray and CT systems come in many different configurations. We've developed a Product Finder to help narrow your search for the system that best meets your needs. Can't find what you're looking for? Our specialists will customize a system to your exact specifications. Contact us today for more information.
-
product
3D AOI Series
MV-6 OMNI
- Exclusive 15MP / 25MP CoaXPress Camera System- OMNI-VISION® 3D Digital Tri-Frequency Moiré Technology- Leading-Edge 12 Projection Blue DLP Technology- Precision Compound Telecentric Camera Lens- Eight Phase Color Lighting System- 10MP / 18MP SIDE-VIEWER® Camera System- Programmable Z-Axis Multi-Focus System- INTELLI-PRO® Automatic Programming Software- Multi-Functional AOI-SPI Fusion Technology- INTELLISYS® Industry 4.0 Intelligent Factory Automation System
-
product
Benchtop X-ray diffraction (XRD) instrument
MiniFlex
New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
-
product
3D Measurement
PSD-Array
The PSD array consists of 16 parallel one-dimensional PSD elements on the same chip. By utilizing the triangulation technique the reflection of a laser line or multiple laser spots onto the PSD array will provide information about the contour of the illuminated object. The possibility for simultaneous readout of the 16 elements together with the fast response of each element makes the PSD array suitable for applications like high speed 3D contour measurements and measurements of parallel, moving objects such as cantilevers.
-
product
Simultaneous Wavelength Dispersive X-ray Fluorescence Spectrometer
Simultix 15
Multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system, the Simultix 15 high-throughput WDXRF spectrometer. Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity.
-
-
product
Real Time X-Ray Imaging
GO-SCAN C-VIEW
Go-Scan C-view is a light weight ruggedized real time X-ray imaging system specifically designed for hand-held inspection such, among other, Corrosion Under Insulation (CUI) inspection. It includes a high speed and high resolution CMOS imager and a battery-operated 70kV x-ray tube designed for portable field operation. The video imaging system captures images and displays them on a hand held display in real-time.
-
product
X-Ray Detector
Cmosaix CMX4343
The technology used for the Cmosaix CMX4343 x-ray detector is based on a large array of CMOS cameras and sophisticated mathematical algorithms that produce superior X-ray imaging and enable new applications that were not possible before, at a fraction of the cost of existing technologies.
-
product
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
-
product
X5 Pack X-Ray Inspection
Designed to be integrated into line with built-in automatic reject and available in 300, 500 and 600 mm belt width models, the X5 Pack is perfect for a variety of unpackaged and packaged products.
-
-
product
HDI 3D Scanners
Quickly capture high resolution digital 3D scansaccurately from objects in the physical world. The High Definition Imaging (HDI) 3D scanners use structured-light technology for capturing high-resolution digital 3D scans from real world objects. These systems are great for companies, manufacturers, academic institutions, visual effect studios, and research labs that need 3D scan data for visualization and measurement applications including: 3D modeling, documentation/archiving, reverse engineering, scientific measurement, computer-aided inspection, rapid prototyping/3D printing.
-
product
3D Surface Texture Analysis Software
TrueMap 6
Rendering styles: solid, wireframe, wireframe + pointsFull control of surface lighting, including direction, and ambient shadingRendering options including side walls, grid lines, and countour linesEdit the z exaggeration to help visualize surface deviationsRender the axes labels relative to the surface mean, maximum, minimum, or unchanged from the values stored in the fileRender the surface using a gradient to represent the surface heights, or use a solid color, or even use the true color values from the data file if they are availableMultiple options for gradients and even an optimization feature to use the height distribution
-
product
3D Image Processing Software
EyeVision
EyeVision is the base for numerous measurement and inspection tasks in image processing. Features are: Creation of inspection programs with drag and drop function. EyeVision supports all hardware platforms such as; Smart Cameras, Vision Sensors, PC & Embedded support.
-
product
Industrial CT X-Ray Inspection System
X25
The X25 is quite possibly the most conveniently sized industrial CT system on the market. The system offers all of the same features as the larger systems while still maintaining the ability to fit through a standard interior door. The X25 is well suited for small to medium sized objects.
-
product
Digital Cabinet X-ray System
XPERT 80
Kubtec's XPERT 80 brings high quality imaging and ease of use to science and research. The XPERT 80's compact self-contained cabinet, with a high resolution x-ray source, provides the sharpest images for every application. Optional sources are also available for micro-focus and soft x-ray applications.
-
product
Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
-
product
3D Bundle
Cost effective bundle of eVision's 3D librariesIncludes Easy3D, Easy3DLaserLine, Easy3DObject and Easy3DMatch
-
product
X-Ray Systems
X-ray and radioactive devices developed by AET, are widely utilized for medical, industrial and research use. The Compact Pulse X-ray Source can accelerate electron beams in a high-gradient electric field, to produce X-rays. Dose Calibrators are utilized for radioactive examinations and treatments in the medical industry.
-
product
Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
-
product
Entry-level X-ray Inspection System
X-eye 5100 Series
100kV ~ 130kV Micro-focus Closed tube and high-definition Flat Panel Detector are installed and high-resolution image can be gained.Customer convenience is primarily considered in operation and maintenance of the product.Customization is available because it is specially designed to be add up any necessary functions depends on customer needs with reasonable prices.
-
product
X-ray Fluorescence Sulfur/Chlorine-in-oil Analyzer
MESA-7220V2
The MESA-7220V2 measures both sulfur and chlorine in petroleum based products using the Monochromatic Energy Dispersive X-ray Fluorescence (EDXRF) method. A monochromatic X-ray source is used in order to obtain an ultra-low noise background which affords the best detection limits for both sulfur and chlorine.The detector window size was increased to collect more fluorescent X-rays and thus achieve lower level ppm values. This provides excellent, repeatable performance at both low and high concentrations of both elements.By adjusting the angle of the graphite crystal, the excitation beam can be measured to excite sulfur in the sample, increasing sensitivity.
-
product
Universal 3D Measurement Software
Metrolog
Get a real performance accelerator for your 3D measuring devices and more.Not only does Metrolog X4 architecture benefit from current computer and OS technologies significantly increasing the performances and metrology software throughput, but it also simplifies your day-to-day measurement workflow.
-
product
3D Profile Sensor
Z-Trak2
Z-Trak™2 is a new family of 3D profile sensors built on Teledyne Imaging’s 3D image sensor technology, ushering in a new era of 5GigE 3D profile sensors for high-speed, in-line 3D applications.
-
product
X-ray Camera
Up until the introduction of SID-A50, X-ray inspection systems has been using detectors such as Image Intensifier (I.I.) and C-MOS Flat Panel Detectors, which needs to convert X-ray into optical light first, in order to visualize X-ray.These Indirect Conversion Method X-ray Detectors comes with multitude of issues. These problems include but not limited to; Low Sensitivity, Fuzziness, Time Degradation, Inadequate Life
-
product
3D Profilers
AEP Technology offers different kinds of 3D profilers. Rugged platform, advanced electronic equipment, clean test space, low carbon emission, low machine noise, high-end lens, etc., make our surface profiler unique in the imaging world. In addition to providing stand-alone contact 3D profilers and optical 3D profilers, we also provide the world's only cross-platform, dual-mode 3D profiler that is compatible with both tactile and optical profilometers.
-
product
X-ray Fluorescence, XRF Analysis Services
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
-
product
X-Ray Inspection System
MXI Ruby XL
Designed for the largest PCBs, Ruby XL allows 96 x 67 cm (37.9” x 26.4”) areas to be inspected non-destructively, with feature resolution up to 0.5 µm.
-
product
X-ray Diffraction and Elemental Analysis
D8 ADVANCE
The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.
