X-ray Fluorescence
measure of irradated sample's fluorescence radiation revealing it's elemental composition.
See Also: XRF, X-ray Fluorescence Spectrometers
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Product
Fluorescence Lifetime Spectrometer
S-FL
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The technique of Time Correlated Single Photon Counting (TCSPC) has been developed and introduced more then 25 years ago. The technique is now widely accepted to be the most sensitive fluorescence detection technique with the inherent temporal resolution required for fluorescence decays.
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Product
High Range UV Fluorescence SO2 Analyzer
Model N100H
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Teledyne Advanced Pollution Instrumentation
The Model N100H instrument uses the proven UV fluorescence principle, combined with a state-of-the-art modular architecture, and intuitive operating software to provide accurate and dependable measurements of high range SO2 gas. The instrument includes interferent rejection, providing a simple and precise solution for a broad range of continuous emission monitoring systems (CEMS) and stack testing applications.
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Product
Fluorescence Microscopes
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Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology. Our confocal systems enable cell biologists to study function and structure using live-cell imaging in cell cultures and invertebrate model organisms at speeds and durations previously not possible. Bruker’s super-resolution microscopes are setting new standards with quantitative single molecule localization which allows for the direct investigation of the molecular positions and distribution of proteins within the cellular environment. Our latest addition, Luxendo light-sheet microscopes, are revolutionizing long-term studies in developmental biology and investigation of dynamic processes in cell culture and small animal models.
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Product
X-ray Inspection Performance
MXI Quadra 7
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Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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Product
X-ray Non-Destructive Testing (NDT) System
DynamIx HR / Series 5
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High precision 12-bit 50µm reading allows inspection of minute image details. Wide dynamic range resulting in wide allowance of X-ray exposure value.
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Product
High Energy Industrial CT X-Ray Inspection System
MeVX Series
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The most advanced industrial DR & CT systems in the world are now available with Linear Accelerators. Offered with energies up to 9MeV, the MeVX series of systems provide the same ease of use as our low energy systems in a high energy format. Utilizing our current efX software platform along with the superior service, support & training that we are known for puts these systems in a class of their own.
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Product
Industrial CT- And X-Ray Solutions
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To examine things, to get to the bottom of them, to get to their core – this desire has always driven science, research, and development. X-ray technology from ZEISS has provided perfect insights for years in these and other areas. When it comes to quality and process control, it reveals what would otherwise remain hidden from even the most watchful of eyes – without destroying the part.
