Data Test Sets
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Air Data Test Sets
For calibrating altimeters, airspeed indicators, rate-of-climbindicators and other avionic instruments.
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Air Data
Testing altitude and airspeed components in commercial and military air data applications are critical for the safety and performance of an aircraft. Mensor air data test set and indicators provide the high accuracy necessary for these applications. Air Data Test Sets control altitude /altitude rate and airspeed /airspeed rate, for testing altimeters and airspeed indicators or air data computers in a dynamic way that simulates actual flying conditions. Air data Indicators measure Altitude /Altitude Rate and Airspeed /Airspeed Rate for applications where conditions are externally controlled.
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Air Data Calibration
Fluke calibration offers digital pressure monitors, air data calibrators and laboratory standards for air data pressure range calibrations. Each of these systems feature pressure ranges, measurement units and features specific to calibrate air data test sets and RVSM compliant air data instruments. Models include 2468 Ruska and ADCS-601 DHI primary level standards; 7750i Ruska air data controller/calibrator and RPM4-AD DHI reference pressure monitor.
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915MHz Data Link Test Set
Kratos Defense & Security Solutions, Inc.
The 915MHz Data Link Test Set (DTS) is a portable, industry leading test instrument used for verification of Data Link Subsystem Replacement (DLS-r), Army Ground Station Unit (GSU), and other 915MHz Gulf Range Drone Control Systems (GRDCS) communications equipment in compliance with the GRDCS Data Link Format Specification.
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Laboratory Air Data Test Sets
DMA is a leading manufacturer of Air Data Test Set models for laboratory use achieving the highest accuracy and resolution. The MPS46 is digitally controlled through a keyboard, it uses very high accuracy pressure sensors, with a special characterisation for maximum accuracy (for static channel < 2 feet at sea level). Pressure resolution of 0.2 Pa. is also achievable. The intuitive user interface with touchscreen display ensures that all the functions are controlled with a minimum of key presses . The ADTS can be used in avionics ATE systems (rack height only 2U) for automated pitot-static testing through RS232, USB, Ethernet or GPIB/IEEE488. An internal pump or external rack mounted pump unit can be supplied as an option.
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Air Data Test Set System
B511
The BRAT Option B511 is an option to the BRAT Test System utilizing Commercial-Off-The-Shelf (COTS) equipment. The system is used to augment the existing BRAT capabilities to test rate of change of altitude or pressure.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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PXIe-8267, 4 TB, M.2, PXI Data Storage Module
785308-01
PXIe, 4 TB, M.2, PXI Data Storage Module - The PXIe-8267 PXI Express high-speed data storage module features large-capacity, high-throughput storage in a single PXI Express slot. With M.2 solid-state drives, the PXIe-8267 is ideal for stream-to-disk or stream-from-disk applications requiring sustained, reliable data throughput such as high-speed signal intelligence, RF record and playback, and multi-sensor data acquisitions systems.
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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PXIe SSD Storage Unit
DM-4M.2-3U
The Big River™ DM-4M.2-3U PXI Express storage unit provides up to 3.8TB* of M.2 SSD storage capacity. With a PCIe x8 Gen3 host interface, the DM-4M.2 delivers high-speed data rates for sequential writes of 3.25GB/s** and sequential reads of 3.41GB/s** to PXI Express based systems. The single slot design of the DM-4M.2 increases the availability of valuable chassis space, allows for maximum storage flexibility. The DM-4M.2 complies with PCIe Gen3 protocol standards. The product is commonly used in the industrial control, test and measurement fields. The DM-4M.2 operates under Windows, Linux, Unix, Solaris and VxWorks.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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PXI Data Storage Module
Offered in several sizes and options, the PXI Data Storage Module is ideal for applications that need to record high-speed data, easily move data between multiple test setups, or supplement the PXI system controller’s storage capacity.
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Windows Driver & SDK for ADLINK USB DAQ Series Data Acquisition Modules
UD-DASK
ADLINK DASK drivers are the device drivers for custom data acquisition applications for Windows. The DASK driver libraries provide API sets for ADLINK PCI ExpressR, PCI, CompactPCI, PXI and USB data acquisition cards, to access full hardware functionalities, such as buffered/double-buffered data acquisition, pattern generation, digital input/output and etc. For novice users, the built-in CodeCreator utility helps you create your first program in just a few minutes.
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HDD-8261, 4 TB, 6-Drive, PXI Data Storage Module
784191-01
4 TB, 6-Drive, PXI Data Storage Module - The HDD‑8261 in-chassis PXI Express high-speed data storage module features an onboard PCI Express SATA controller. The module fits into a PXI Express chassis, and it occupies only three PXI slots. With the HDD‑8261, you can choose between hard-disk drives (HDDs) or solid-state drives (SSDs) for increased ruggedness. It is ideal for field testing or signal recording applications. You can use this module to not only stream high-speed data, but also to easily move data between multiple test setups or supplement the PXI system controller’s storage capacity.
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Data Acquisition DSP Based 16 Channel
CPCI-AD8-opt8
The CPCI-AD8/16 module provides a 3U high performance data acquisition subsystem. There are (8) eight or (16) sixteen 100/200 KSPS ADC’s for maximum performance. The Local DSP can be used to simply move data samples to the CPCI bus or can provide processing functions such as limit checking, FFT’s, digital filtering, etc. Software can be downloaded to the DSP via the CPCI interface.
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16-CH 16-Bit 250 kS/s Low-Cost Multi-Function DAQ PCI Express Cards
DAQe-2213/2214
ADLINK DAQe-2213/2214 can sample up to 16 AI channels with different gain settings and scan sequences. It makes them ideal for dealing with analog signals with various input ranges and sampling speeds. These devices also offer differential mode for 8 AI channels in order to achieve maximum noise elimination.
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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4-CH 16-Bit 2MS/s Simultaneous-Sampling USB DAQ Module
USB-1210
The USB-1210 is a 16-bit high-speed USB 2.0-based DAQ module equipped with 4 analog input channels providing simultaneous sampling at up to 2MS/s per channel. The USB-1210 delivers high accuracy and excellent dynamic performance at maximum sampling rates, and flexible trigger functions. In addition, onboard 64M samples FIFO ensures no data loss during acquisition even when CPU or system loading is heavy.The USB-1210 is USB bus-powered and equipped with removable screw-down terminals for easy device connectivity. The attached multifunctional stand can be used for desktop, rail, or wall mounting. Suitable for high-speed data acquisition, laboratory and medical research, the USB-1210 provides a reliable measurement solution at an affordable price.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Asynchronous System Level Test Platform
Titan
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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3-Axis Non-Robotic Automated Testing System
AT3
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Test Fixture
N1295A
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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HV Test System up to 20000 Volt
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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NTS Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
