Data Test Sets
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Air Data Test Sets
For calibrating altimeters, airspeed indicators, rate-of-climbindicators and other avionic instruments.
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Laboratory Air Data Test Sets
DMA is a leading manufacturer of Air Data Test Set models for laboratory use achieving the highest accuracy and resolution. The MPS46 is digitally controlled through a keyboard, it uses very high accuracy pressure sensors, with a special characterisation for maximum accuracy (for static channel < 2 feet at sea level). Pressure resolution of 0.2 Pa. is also achievable. The intuitive user interface with touchscreen display ensures that all the functions are controlled with a minimum of key presses . The ADTS can be used in avionics ATE systems (rack height only 2U) for automated pitot-static testing through RS232, USB, Ethernet or GPIB/IEEE488. An internal pump or external rack mounted pump unit can be supplied as an option.
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Air Data Calibration
Fluke calibration offers digital pressure monitors, air data calibrators and laboratory standards for air data pressure range calibrations. Each of these systems feature pressure ranges, measurement units and features specific to calibrate air data test sets and RVSM compliant air data instruments. Models include 2468 Ruska and ADCS-601 DHI primary level standards; 7750i Ruska air data controller/calibrator and RPM4-AD DHI reference pressure monitor.
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Air Data
Testing altitude and airspeed components in commercial and military air data applications are critical for the safety and performance of an aircraft. Mensor air data test set and indicators provide the high accuracy necessary for these applications. Air Data Test Sets control altitude /altitude rate and airspeed /airspeed rate, for testing altimeters and airspeed indicators or air data computers in a dynamic way that simulates actual flying conditions. Air data Indicators measure Altitude /Altitude Rate and Airspeed /Airspeed Rate for applications where conditions are externally controlled.
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915MHz Data Link Test Set
Kratos Defense & Security Solutions, Inc.
The 915MHz Data Link Test Set (DTS) is a portable, industry leading test instrument used for verification of Data Link Subsystem Replacement (DLS-r), Army Ground Station Unit (GSU), and other 915MHz Gulf Range Drone Control Systems (GRDCS) communications equipment in compliance with the GRDCS Data Link Format Specification.
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Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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NI HIL and Real-Time Test Software Suite
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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PXIe SSD Storage Unit
DM-4M.2-3U
The Big River™ DM-4M.2-3U PXI Express storage unit provides up to 3.8TB* of M.2 SSD storage capacity. With a PCIe x8 Gen3 host interface, the DM-4M.2 delivers high-speed data rates for sequential writes of 3.25GB/s** and sequential reads of 3.41GB/s** to PXI Express based systems. The single slot design of the DM-4M.2 increases the availability of valuable chassis space, allows for maximum storage flexibility. The DM-4M.2 complies with PCIe Gen3 protocol standards. The product is commonly used in the industrial control, test and measurement fields. The DM-4M.2 operates under Windows, Linux, Unix, Solaris and VxWorks.
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Test Workflow Standard
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Intelligent 16 Bit Data Acquisition
CPCI-AD16
The CPCI-AD16 module provides a 3U high performance data acquisition subsystem. The Local DSP can be used to simply move data samples to the CPCI bus or can provide processing functions such as limit checking, FFT’s, digitalfiltering, etc. Application software can be downloaded to the DSP via the CPCI interface. Instrumentation amplifiers provide over-voltage protection, gain and filtering on a per channel basis. Internal scan and trigger clocks are derived from either the CPCI bus clock or the local DSP clock. Dual 32 bit timers can programmed to pace the acquisition process. The CPCI-AD16 can also accept external scan and trigger signals from a front panel connector.
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16-Channel 500kSa/s USB Modular Multifunction Data Acquisition
U2353A
The U2353A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2353A to simulate simultaneous analog input acquisition.
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Isolated USB Digital I/O Modules (OEM Version Available)
USB-7230/7250
The USB-7230/7250 USB-based digital I/O modules feature high voltage on/off control and monitoring, and isolation voltage supported up to 2500VRMS. The USB-7230 provides 32-CH isolated digital I/O and 2-CH frequency/event counters. The USB-7250 provides 8-CH relay output (4 form C and 4 form A), 8-CH isolated DI, and 2-CH frequency/event counters. The USB-powered USB-7230/7250 features removable screw-down terminals for easy device connectivity, and the included multi-functional stand fully supports desktop, rail, or wall mounting.
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High Speed Data Acquisition Module
ADQ214
The ADQ 214 data acquisition card features dual channels, 14-bit resolution, 400 MSPS capture rate with 1.4 GHz analog input bandwidth, and a memory buff er of 64 MSample per channel. The combination of high speed, high resolution and wide bandwidth makes it ideal for broadband applications such as IF sampling of RF signals and high-speed data recording. PXI Express, USB interfaces.
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16-CH 12/16-Bit 100 kS/s Low-Cost Multi-Function DAQ Cards
PCI-9111 Series
ADLINK PCI-9111 series are 16-CH, 100 kS/s low cost multi-function DAQ card. The PCI-9111 series feature flexible configurations on analog inputs. A RC filter is implemented on each A/D input channel for user to attenuate or filter input signal. The PCI-9111 series provide analog inputs with 5 programmable input ranges for bipolar inputs. The PCI-9111 series also support automatic analog input scanning. PCI-9111DG provides 12-bit A/D resolution while PCI-9111HR provides 16-bit A/D resolution. The PCI-9111 series also feature 1-CH 12-bit analog output, 16-CH TTL digital inputs and 16-CH TTL digital outputs. ADLINK PCI-9111 series deliver cost-effective and reliable data acquisition capabilities, and is ideal for a broad variety of applications.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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4-CH 14/16-Bit Up to 2 MS/s Simultaneous-Sampling Multi-Function DAQ PCI Express Cards
DAQe-2000 Series
ADLINK DAQe-2000 series products are simultaneous-sampling multi-function PCI Express DAQ cards to meet a wide range of application requirements. The devices can simultaneously sample 4 AI channels with differential input configuration in order to achieve maximum noise elimination. They also provide 2-CH 12-bit analog outputs with waveform generation capability, which can be performed together with analog input functions. If more analog input or output channels are required, multiple cards can be synchronized through the SSI (system synchronization interface) bus. This makes the DAQe-2000 series ideal for the stimulus/response test.
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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8-CH Thermocouple Input Module
ND-6018
- Channels: 6 Differential & 2 Single-ended- Input Type: Thermocouple, mV, V and mA- Thermocouple Type: J, K, T, E, R, S, B, N,C- Voltage Range: ± 15 mV, ± 50 mV, ± 100 mV, ± 500 mV, ± 1 V, ± 2.5 V- Current Range: ± 20 mA- Isolation Voltage: 2500 VRMS
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In-Circuit Test System
TestStation LX
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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6TL22 Off-Line Testing Platform
H71002200
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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PXI Data Acquisition
DAQ
Installation and configuration is fast and easy with standard connectors, soft front panels and Keysight connection expert. In addition, software drivers support the most common programming environments such as Visual Studio®, C, C++, Visual Basic, MATLAB® and LabVIEW™.
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Military Communications Test
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
