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Combinational ATE
ICT, Functional test, and boundary scan test all in one piece ATE.
See Also: ATE, Functional ATE
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ATE
QT 200 NXG
Qmax Test Technologies Pvt. Ltd.
QT 200 Nxg a Highly sophisticated ATE, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software.
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Cost-Effective ATE System
PRO RACK ATE
Qmax Test Technologies Pvt. Ltd.
Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.
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ATE Core Configurations
ATE Core Configurations streamline the design, procurement, and deployment of automated test systems with highly integrated mechanical, power, and safety system infrastructure. These off-the-shelf systems reduce lead times and simplify standardization and global deployment. Lower your total cost of ownership for your test systems with ATE Core Configurations.
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Compact Semiconductor ATE
QST286
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST286 is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features makes it ideal for high throughput production testing of wide range of low pin count medium power ICs as listed below but not limited to Optocouplers, Isolators, LEDs, Photo diodes, Photo transistors, Photo sensors, Photo detectors , Analog Mux , Relays and more.
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ATE Development Services
Automated Testing Engineering and Automated Test Equipment (ATE) provide a faster, more efficient way to test your product. With the help of LabVIEW and Modular Instruments, our engineers create test and measurement systems for all areas of product design and manufacturing.Whether you are in early stage R&D prototype testing, and design validation, or providing a solution for quality control and life testing our engineers can work with you to design fully customized automated Test Systems using entirely off-the-shelf products to ensure you deliver quality product on time.
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ATE Solutions
Our custom, application-specific ATE Test Solutions offer a full test suite with Test Systems hardware, software, and support services.
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ATE
Below is a list of high speed scopes and BERTs that form an integrated extension to Advantest’s V93000 ATE tester. In addition to these instruments, Multilane offers turnkey solutions for ATE testing.
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Custom ATE Solutions
ATEC Matrix Corporation can be your one-stop provider of complete turn-key ATE Systems. With over 15 years in ATE Design, Development and implementation we have the expertise and experience to work with you efficiently to provide whatever level of solution your program requires.
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ATE Connecting Solutions
C.C.P. Contact Probes Co., LTD.
Customized pogo towers with high frequency capability.
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ATE For Data Communications Equipment
• Developed for DRS Codem Systems, Inc. to test the CTM-IP product line of the Multi-Interface Protocol Converter.• Manufacturing Test support for the CTM-IP chassis and Interface Modules. Functional test of signaling, protocol and software configurations for various communication interface configurations.• Regression Test support for Engineering Product Development. Configurable test sequencing allows engineer to select specific tests for execution, with the ability to exercise all combinations of data rates and interface configurations.
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ATE System Power Supplies
N8700 Series
The Keysight N8700 Series ATE system power supply delivers high current with low noise in a compact two unit package. Airflow moves front to back, so no additional space is required above or below the power supply in your automated test equipment (ATE) rack. This series of programmable power supplies sources up to 3300 or 5200 W. Get output voltages from 8 to 600 V and 5.5 to 400 A.
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Avionics ATE Power Subsystem
AMETEK Programmable Power, Inc.
*Provides eight channels of programmable DC power with output isolation function*Output disconnect function*Total control via Ethernet within power supply.*Mounted in custom in transportable shock-mount case.
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ATE Products
Microtest ATE portfolio presents special patented solutions to reduce the cost of test.Our innovative ATE offers high multi-site efficiency, zero footprint and lower power consumption.We’re able to drastically reduce the engineering phase time also for special solutions tailored on customers’ needs.
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Semiconductor ATE Systems
Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.
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Aerospace & Defense ATE Systems and Services
TE solution design, development, and integrationMeasurement / Test Process analysis and consultationEasy-to-use software interfaces for Engineers and UsersFactory automation for test processesAll major instrument brands available & supported
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Quickly Upgrade RF ATE Testers
MP5800 / MP5806
*MP5800 Quickly Provides 3380 / 3650 RF ATE Test Capabilities*MP5800 and 3380/3650 hardware and software are fully integrated*Provide complete and user-friendly RF / Digital debug tools*Provide a complete solution for IOT applications*Provide API for production automation software*Integrate Zimmer 3380/3650 to provide RF/Digital comprehensive ATE test solution
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ATE System Integration
Cyth Systems is a Systems Integration Company specializing in Automated Test (ATE), Embedded Controls, and Machine Vision. Our skilled and experienced team uses their natural talent for problem-solving to create solutions in a wide range of industries. We build our solutions starting with the National Instruments (NI) platforms including LabVIEW and PXI, and by adding best-in class sensors and components.
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ATE Test Probes
For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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ATE System Power Supplies
For more than 50 years, Keysight's automated test equipment (ATE) power supplies have changed the way engineers prove their designs, understand issues, and ensure product quality. Our programmable ATE system power supplies' compact design makes it easy to integrate them into any system. Keysight power supplies make it easy to update a test program with modern interfaces, LXI-core capability, and SCPI language. Accelerate test time with fast command processing and quick settling times.
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Solar ATE
MS 1534
The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.
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ATE Support
Partech´s talented ATE (Automatic Test Equipment) Support team can provide reliable in country support of ATE, ATE related hardware and fixtures and software.
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RF ATE
IFF-7300S Series IFF/Crypto/TACAN Automated Test System. IRIS 2000/IRS 1200 ATE Software Revision Service. RF Expansion Module (RFEM).
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ATE Parts
Comware Technical Services, Inc.
We have thousands of parts in stock including hard to find legacy system components. For the best pricing, service and quality look to Comware for replacing your GenRad, Teradyne , Agilent and TRI system parts and modules.
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Generic RF ATE Test
The Generic RF ATE is developed to test the Radar and Radar Subsystems. The ATE is primarily built using an instrumentation control, precision RF routing systems and rack mounted test instruments. Generic RF ATE system enables measurement of parameters of Radar equipment such as Local Oscillators, Waveform Generators, Up and Down Converters, Analog Receivers, Array Group Receiver Units, TR Modules. The ATE is configured to test the Radars upto 18GHz frequency range.
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Pin Electronics (PE)/ Pin Drivers ATE
Analog Devices integrated pin electronics (PE) support speeds up to 2.5Gbps at high accuracy and low power, all manufactured on ADI's proprietary fab processes, providing unmatched test solutions needed for cost-sensitive, test applications.
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ATE System
Digital Communication Technologies Ltd
We design and build automated test systems according to customer requirements. Hardware, writing drivers, test plans. We have multiple automated test systems installed in the Military, Aerospace, Power, Automotive and other industries throughout Israel. LanWindows, Labview, LabWindowsCvi, Teststand, ATEasy, C ++, C #, VB
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
