Automatic Test Systems
execute test program sets automatically. Also known as: ATS
See Also: Automatic Test Equipment, ATE Integrators
-
-
Product
Automatic Test System
Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
-
Product
System Instruments
-
bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
-
Product
AUTOMATIC WINDING TEST SYSTEM
VE9036SU
-
6 CHANNEL Microprocessor based Automatic Test System for Automobile Coils, Magnetos, Alternator, Motor Winding. Can Test : Impulse Winding Tester (IW), AC/DC HiPot, Insulation Resistance (IR), Inductance (L), DC Resistance (DCR)
-
Product
Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
-
Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
-
Product
High Power Programmable DC Power Supply
IT6000D Series
-
IT6000D, single channel output programmable DC power supply, is applicable in laboratories and automatic test system to provide high-power and stable DC supply. The feature of auto ranging output enables a wide range of voltage and current combinations at full power, unprecedentedly flexible.
-
Product
Automatic Safety Test System
LS9955/56
-
The LS9955/LS9956 Automatic Safety Test System is according to GB4706.1, IEC/EN60335-1, UL60335, GB7000, IEC60598, GB4943, IEC60950 and GB9706.1. It used for luminaries, home application and motor tools safety test in production line or Lab R&D.
-
Product
Industry Standard in Noise Measurement
PN9000
-
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range(2 MHz to 140 GHz). Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a compact instrument.
-
Product
CPCI
-
Modules in compact PCI from Data Patterns are available for Data Acquisition and Control, Simulation, Communication Automatic test equipment, Rugged systems, Fail-safe systems, Computer controlled logic controls, Plant automation and similar requirements. Other I/O functions available from our IP and Mezzanine Module families can be directly integrated into our cPCI systems.Data Patterns has also pioneered cPCI derivatives such as 9U High Voltage systems, Multiple backplane support with Hot Standby Switchover capabilities. Continuous innovation enables MMI options such as CRT & LCD displays, Keyboards, Pointing devices, Finger print security devices and so on.
-
Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
-
Product
Regenerative AC Load
61800
-
Chroma Power Electronics Test Solutions not only apply in the industries of Information Technology, Communication, Aerospace and National Defense, but also in energy efficient products such as Hybrid Automobiles, LED luminance devices, solar and fuel cells that are developed aggressively under the pressure of natural resource constraints. Chroma has a wide variety of instrumentation including AC Power Sources, DC Power Supplies, DC Electronic Loads, AC Electronic Loads, Digital Power Meters, and Automatic Test Systems that are ideal for power input/output terminal tests and dynamic simulation.
-
Product
4/8 Channel Optimal Multiport Power Meter
UC8728
-
UC INSTRUMENTS UC8728 4/8 CHANNEL OPTICAL MULITIPORT POWER METER are PC control multiport passive components power meter test system and offer superior performance for the test of multichannel DWDM, WSS, ROADM, AWG & PLC components and modules, optical amplifiers, DWDM system and other general purpose of multiport fiber optical test and measurement applications. The system can be integrated with tunable laser source, optical attenuator & PDL controller provides a high performance passive components and modules automatic test system platform.
-
Product
Three-phase Fully Automatic Test System
TS41
-
Calmet Smart Calibration Devices
The Calmet TS41 test system consists of a three-phase reference meter of accuracy class 0.02% (or 0.04%) and an integrated three-phase current and voltage source up to 3x120A/600V. It makes possible automatic testing of electricity meters in meter test stations
-
Product
Flying Probe Tester
FA1817
-
Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
-
Product
RF Conducted Immunity Test System
RFCI61000-4-6
-
RFCI61000-4-6 RF Conducted Immunity Test System is an automatic test system which is for the conduction sensitivity testing, it is fully meets IEC61000-4-6.2006, ISO11452-4, GB/T17626.6-2008 and GTB152B-CS114 etc standards. RFCI61000-4-6 internal source and broadband power amplifier can be generated 3 voltage test levels: 1v, 3v and 10v, and has the function of the real detect output level. It has two operation software which is calibration software and test software. When measuring, the signal is in 1 KHZ sine wave amplitude modulation system (80%) to simulate the actual harassment, and can through the coupling/decoupling network (CDN or electromagnetic clamp) to make the harassment signal coupled to the device.
-
Product
Professional ATLAS WorkStation
PAWS Developer's Studio
-
We can provide and fully support PAWS (Professional ATLAS WorkStation), the leading ATLAS development system used by most of the US and European military ATLAS based ATS. The PAWS suite includes full development systems as well as runtime only versions for executing previously developed TPS on an installed base of workshop systems.PAWS Developer's Studio gives you the power to compile, modify, debug, document, and simulate the operation of ATLAS test programs in a modern Windows environment. It offers the visual development capabilities prevalent in the marketplace today specifically tailored for ATLAS TPS development. A full range of the most commonly used ATLAS subsets is supported. A PAWS Toolkit can modify the ATLAS subset to meet the particular ATE (Test Station) configuration. Its output is ready to be executed on the associated debugging PAWS run time system.
-
Product
Magneto-inductive Testing
MAGNATEST D-HZP
-
Foerster Instruments, Incorporated
The MAGNATEST D-HZP by FOERSTER is the ultimate magneto-inductive test instrument: the fully automatic system tests materials for their properties. It operates in single coil absolute mode, making a comparator coil unnecessary. The combination of high excitation currents and complex evaluation electronic equipment detects even very small structural discrepancies. The MAGNATEST D-HZP also provides comprehensive options for documenting test results, such as test piece statistics, histogram, and test data export, which are displayed clearly on the large color display.
-
Product
Electrical Safety Test Scanner
19200
-
Support Electrical Safety Test Scanning Support High / Low voltage circuit insulation (Switch module)Support 8 slots for plug-in (removable)Max. 9 slaves for multiple scanners (master/slave interface)Standard RS-232 and USB interface Optional GPIB interface CE Mark19200 can be installed in Chroma Electrical Equipment ATS model 8900
-
Product
AC / DC Electronic Loads – Benchtop Testing to Automated Test Systems
-
Chroma Systems Solutions, Inc.
Chroma is the global leader in Electronic Load manufacturing. Chroma’s AC Electronic Loads are designed for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources, and other power devices such as switches, circuit breakers, fuses and connectors. Chroma’s DC Electronic Loads are used for power testing in all markets including automatic test systems, LED, power supply testing, battery testing, and fuel cell testing. Chroma loads can do it all including full current down to 0.4VDC, CZ mode, user defined waveforms, timing measurements, and 3 current ranges per load. Chroma’s electronic loads come standard with either USB or RS232 ports for control and can be configured for GPIB (IEEE-488) control as well.
-
Product
Anti-Tamper Sub-Assemby (DC Immune CTs + Potential Transformer)
-
SHANGHAI POWOO INDUSTRY CO., LTD
ATS can provide double loop current sampling and power supply for measuring unit of static meter. When load voltage, static meter can in normal condition without single-channel current.
-
Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
-
Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
-
Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
-
Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Test System
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
-
Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
-
Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
-
Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
-
Product
HV Test System up to 20000 Volt
Test System
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
-
Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
-
Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
