Air Data Test
See Also: Air Data
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
16-CH 16-Bit 250 KS/s Simultaneous Sampling DAQ Cards
PXI-2022
Data Acquisition Module
ADLINK"s PXI-2022 is a simultaneous-sampling multi-function DAQ card to meet a wide range of application requirements for PXI bus computers. The device can simultaneously sample 16 AI channels with differential input configurations in order to achieve maximum noise elimination.
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Product
PXI Digital Test Instrument
PXIe-6943
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
16/32 -CH 16-Bit 250/500 KS/s Multi-Function DAQ Cards with Encoder Input
PCI-9222/9223
Data Acquisition Module
The ADLINK PCI-9222/PCI-9223 is a 16-bit, 16/32-CH, 250/500 KS/s high performance DAQ card with 8 different input ranges. It also features 2-CH 16-bit analog outputs capable of a 1 MS/s update rate, 2-CH encoder inputs, and programmable function I/O. The software-programmable function I/O supports a variety of applications, including TTL digital I/O, high-speed DIO, general-purpose timer/counter, pulse generation, and PWM output. Analog input, analog output, and function I/O at full speed simultaneously, and multiple cards can be synchronized through the SSI (System Synchronization Interface) bus if users need more channels than a single board can provide. Ideal for mixed-signal tests, laboratory research, and factory automation, PCI-9222/PCI-9223 is the best single-board solution on the market providing the best integration capability of multiple tasks with high performance and an affordable price.
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Product
15-CH Isolated Digital Output Module
ND-6056
Data Acquisition Module
ADLINK's NuDAM data acquisition modules make up a total acquisition network and control system. Up to 256 NuDAM modules an be romotely controlled on any RS-485 network from a host computer, via a single serial RS-232, allowing communication from as far as 4000 feet from the host. Based on the RS-485 multi-drop network system, each module has a unique address ID, whereby simple ASCII command & response protocols through the standard RS-485 interface can control all the NuDAM modules in the RS-485 network. The NuDAM modules provide direct communications with a wide variety of sensors, perform all signal conditioning, scaling, linearization and conversion, and can acquire measurements of temperature, pressure, flow, voltage, current, and multiple digital signal types.
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Product
Headlamp Test Platform
Test Platform
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
In-Circuit Test System Rentals
Test System
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Product
HDD-8261, 4 TB, 6-Drive, PXI Data Storage Module
784192-01
Data Storage
4 TB, 6-Drive, PXI Data Storage Module - The HDD‑8261 in-chassis PXI Express high-speed data storage module features an onboard PCI Express SATA controller. The module fits into a PXI Express chassis, and it occupies only three PXI slots. With the HDD‑8261, you can choose between hard-disk drives (HDDs) or solid-state drives (SSDs) for increased ruggedness. It is ideal for field testing or signal recording applications. You can use this module to not only stream high-speed data, but also to easily move data between multiple test setups or supplement the PXI system controller’s storage capacity.
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Product
NI's Wireless Connectivity Functional Test Solution
Functional Test
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
Test Fixture
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
HDD-8261, 4 TB, 6-Drive, PXI Data Storage Module
784191-01
Data Storage
4 TB, 6-Drive, PXI Data Storage Module - The HDD‑8261 in-chassis PXI Express high-speed data storage module features an onboard PCI Express SATA controller. The module fits into a PXI Express chassis, and it occupies only three PXI slots. With the HDD‑8261, you can choose between hard-disk drives (HDDs) or solid-state drives (SSDs) for increased ruggedness. It is ideal for field testing or signal recording applications. You can use this module to not only stream high-speed data, but also to easily move data between multiple test setups or supplement the PXI system controller’s storage capacity.
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Product
Batterie Inspektor
Battery Test Platform
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
Flight Control System Test Platform
Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Modular Functional Test Platform
LX-OTP2
Test Platform
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
Battery Management (BMS) Environmental Test System
Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Product
64-Channel 500kSa/s USB Modular Multifunction Data Acquisition
U2356A
Data Acquisition Module
The U2356A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2356A to simulate simultaneous analog input acquisition.
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Product
e Data Acquisition 32 ch. Module
CPCI-AD320-6U
Data Acquisition Module
The CPCI-AD320 module provides a 6U high performance data acquisition subsystem. There are 32 thirty-two 100/200 KSPS ADC’s for maximum performance. Or an opt low cost 16 channel version. The Local DSP can be usedto simply move data samples to the CPCI bus or can provide processing functions such as limit checking, FFT’s, digital filtering, etc. Software can be downloaded to the DSP via the CPCI interface.
