High Voltage Test
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Product
Functional Test System
TS-5040
Functional Test
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Product
EOL RF Functional Test
AS652
Test Platform
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Product
sbRIO-9221, Non-Enclosed, ±60 V, 800 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module
781116-01
Voltage Input Module
Non-Enclosed, ±60 V, 800 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module - The sbRIO‑9221 performs single-ended analog input. The wider voltage range makes this module well suited for industrial-level, automotive, or even smaller-cell battery measurements. There are two connector options for the sbRIO‑9221: a 36‑position spring‑terminal connector and a 37‑position DSUB connector. Non-enclosed modules are designed for OEM applications.
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Product
NI-9263, 100 kS/s/ch Simultaneous, ±10 V, 4-Channel C Series Voltage Output Module
779012-01
Voltage Output Module
100 kS/s/ch Simultaneous, ±10 V, 4-Channel C Series Voltage Output Module - The NI‑9263 is a simultaneously updating analog output module. It features overvoltage protection, short-circuit protection, low crosstalk, fast slew rate, high relative accuracy, and NIST‑traceable calibration. The NI‑9263 module includes a channel‑to‑earth ground double isolation barrier for safety and noise immunity.
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Product
Bottom Electrode SMD Test Fixture
16198A
Test Fixture
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Product
Standard 4.47 (127.00) - 12.00 (340.00) High Frequency Probe
K-50H-S
High Frequency Probe
Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 2.50Nominal Impedance (Ohms): 50Test Center (mil): 600Test Center (mm): 15.24Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 90Recommended Travel (mm): 2.29Overall Length (mil): 1,205Overall Length (mm): 30.61
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
sbRIO-9229 , Non-Enclosed, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780874-01
Voltage Input Module
Non-Enclosed, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO‑9229 performs differential analog input. The sbRIO‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Non-enclosed modules are designed for OEM applications.
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Product
Dielectric Test Fixture
16451B
Test Fixture
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Product
High Current Probes
High Current Probe
*Low internal resistance to minimize arching*PogoPlus bias ball design*High current optimized base material and plating*Higher temperature spring design*Specialized high current tip geometry
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Product
Automated Test Systems
Test System
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
Automatic Test System
Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
PCIe 5.0 Test Platform
PXP-500A
Test Platform
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Product
Memory Test Systems
T5503HS2
Test System
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
NI-9242, 250 Vrms L-N, 400 Vrms L-L, 50 kS/s/ch, 24-Bit, 3-Phase C Series Voltage Input Module
783107-01
Voltage Input Module
250 Vrms L-N, 400 Vrms L-L, 50 kS/s/ch, 24-Bit, 3-Phase C Series Voltage Input Module - The NI‑9242 performs single-ended analog input. The wide measurement range makes it ideal for high-voltage measurement applications such as phasor measurements, power metering, power quality monitoring, standard potential transformers, and motor test. You can also perform transient and harmonic analysis with high-speed simultaneous sampling. The NI‑9242 offers three channels, so you can connect single‑ or three‑phase measurement configurations such as WYE and delta.
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Product
ARINC-429 Module
M4K429RTx
Test Module
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
AC / DC Current Probe, 100 KHz, 100 A
1146B
High Current Probe
The Keysight 1146B AC / DC probe provides accurate display and measurement of currents up to 100 A DC or peak AC / DC to 100 kHz without breaking the circuit. The 1146B AC / DC probe has hall-effect sensor technology to measure AC and DC signals. It is compatible with any Keysight oscilloscope with 0.2 to 0.5 V / div sensitivity and 1 MΩ BNC input.
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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Product
High Power & Voltage Pack Testing System
FTF
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Drive simulations with standard Electric Vehicle tests: FUDS, SFUDS, GSFUDS, DST and ECE-15LDrive Cycle TestingIntegration with motor test benchesCycle testing of EV/HEV Battery Packs
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Product
Configurable Functional Test System
ATS-5000
Test System
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Test Fixture
Stopper kit includedYAVCANCON2 for fixture identification not included
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Product
High Voltage Measurement
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High Voltage Pulse Attenuator is used to attenuate high voltage pulse signals in a 50 system. It is consist of highly surge robust components with great voltage linearity. The device is symmetrical, Input and output can be exchanged.
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Product
High Voltage Testers
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HV Test, which is also known as Hipot Test – short form of high potential – is used to test the insulation quality of the auxiliary circuit of circuit breakers. The HV Test is useful in finding damaged insulation, stray conductive materials around the conductors, and problems due to terminal spacing and tolerance errors in cables.
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Product
DC-Powered, AC Voltage Monitor
VAD/VQD
Voltage Monitor
NAI’s VAD and VQD are DC-Powered, AC Voltage Monitors used to monitor voltage characteristics of single- or three-phase power lines. This allows normal operation of system loads when the power-line characteristics are within pre-determined limits. These voltage monitors are ideally suited for rugged defense and industrial applications.
