Function Generators
produce repeating sawtooth, sine, square, or triangle waveforms.
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Standard 1.55 (44.00) - 3.20 (91.00) General Purpose Probe
HPA-50B
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 590Overall Length (mm): 14.99
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PCIe 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 2 Channels, High Voltage Outputs
M2P.6571-X4
The M2p.65xx series offers different versions of arbitrary waveform generators for PCI Express with a maximum output rate of 125 MS/s. These boards allow to generate freely definable waveforms on several channels synchronously. With one of the synchronization options the setup of synchronous multi channel systems is possible as well as the combination of arbitrary waveform generator with digitizers of the M2p product family. The 512 MSample on-board memory can be used as arbitrary waveform storage or as a FIFO buffer continuously stream data via the PCIe interface. Importantly, the high-resolution 16-bit DACs deliver four times the resolution than AWGs using older 14-bit technology.
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Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0B
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Functional Safety
More and more devices, machinery, plants and systems contain electrical, electronic and/or programmable electronic systems and components. Malfunctions – also in sub-systems and components – can lead to hazardous situations for people, machines and the environment. If these systems contribute to the safety of the product, it is necessary that they function correctly under all circumstances (including possible failures and malfunctions). One speaks of functional safety in this context.
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2-Channel Arbitrary Waveform Generator
3156C
Racal Instruments™ 3156C Dual Channel Arbitrary Waveform Generator outputs 16-bit waveforms from 2 channels at up to 225 MS/s. 12-bit digital patterns may be output at rates up to 200 Mbits/s.
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Function Generator
FG-109
*FG-109 is a function generator with a high resolution of 10MHz DDS.*Various output waveforms: Sine, Square, Triangle, Pulse, Anti-Pulse.*Variable DC offset control : ±10V(no load).*Store / Recall. 20 settings*Counter up to 60MHz high frequency.*AM with internal and external carry.*Sweep mode with Linear and Log slope.*FM wide modulation range up to 10 times.*The signal Attenuate can be -20dB or -40 dB.*USB terminal for computer operation.*LCD Display
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PXI Functional Test System
U8989A
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
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High 4.00 (113.00) - 6.70 (190.00) General Purpose Probe
P2550-8-8
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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Functional Testing
Functional testing is a pivotal element for strengthening the quality of developed software. Functional testing basically refers to the black box testing that evaluate a particular IT product with reference to the functional requirements indicated with its specification. Functional test analysis process involves the testing activities which measure the code of each component to assure quality.
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Functional Test Service
Testing House provides all Software and Hardware needed to implement a complete Functional Test.
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Alternate 6.00 (17.00) - 2.50 (71.00) General Purpose Probe
P2662AG-1R2S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Integration and Functional Testing
Exactest provide test analysts of the highest calibre only. Those who think "anyone can test software" are mistaken. Many key skills are required depending on the project and test phase being undertaken.
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SPP-25 Solar Panel Probe
SPP-25
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.0
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Multi Function Testers
Kyoritsu Electrical Instruments Works, Ltd.
Live circuit warning LED:Immediate illumination of a warning lamp if the circuit under test is live Auto Discharge:Allows fast and safe discharge of electrical energy stored in capacitive circuits following testing Integral overload protection on internal continuity and insulation test circuitry Autoranging 500V DC test voltage for insulation tests 200mA short circuit current on continuity ranges Loop and RCD Testing Wiring connection check LED''s:Immediate indication if wiring of circuit under test is correct Overheat Protection:Rapid detection of overheating of internal circuitry,display of warning signal to user and automatic halting of measurement Supply Voltage Indication:Can display supply voltage value in loop impedance mode Low Current Loop Impedance Test:Short duration low test current will prevent tripping of many passive RCDs
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12 GSa/s Arbitrary Waveform Generator
M8190A
From low-observable systems to high-density comms, testing is more realistic with precision arbitrary waveform generation. Now you can take reality to the extreme: A Keysight AWG is the source of greater fidelity, delivering high resolution and wide bandwidth simultaneously. This unique combination lets you create signal scenarios that push your design to the limit and bring new insight to your analysis. Get bits and bandwidth and enhance your reality.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Functional Fixtures
Joule''s strength is in the design and manufacture of functional test fixtures. Using 3D modeling software to create the fixtures allows us to actuate pneumatics, open and close overclamps, actuate side access units - all before a single part has been machined for the fixture.
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Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T135
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-2
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Generators
Linear Frequency-Modulated Signal Generator
The Software Signal generator allows to produce frequency modulated signals with linear sweep at the DAC output.
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Multi Function Checker
Energie Check Junior
Hot on the trail of energy guzzlers: the measuring device case offers the ideal equipment for projects in schools. The ideal set of equipment for projects in schools on the subject of saving energy, atmospheric environment, water consumption, lighting and energy requirements of electrical devices. The measuring devices are stored clearly laid-out in a special case and are always fully to hand.
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Ethernet/LXI generatorNETBOX 16 Bit Arbitrary Waveform Generator - up to 40 MS/s on 8 Channels
DN2.654-08
The generatorNETBOX DN2.65x arbitrary waveform generators (AWG) is a general purpose multi-channel AWG with outstanding dynamic performance. The series includes LXI units with either four, eight or 16 synchronous channels. The large onboard memory can be segmented to replay different waveform sequences.
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High 4.00 (113.00) - 6.70 (190.00) General Purpose Probe
P2550-0-8
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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UXG X-Series Agile Signal Generator, Modified Version
N5191A
et closer to reality: simulate increasingly complex signal environments for radar, EW & antenna-test Test sooner & increase confidence in EW systems by generating signal simulations when you need them: the UXG is a scalable threat simulator Use pulse descriptor words (PDWs) to generate long pulse trains & individually control pulse characteristics Quickly characterize antennas over a wide frequency range with fast frequency tuning Performance without requiring an export license
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PXIe-5413, 20 MHz Bandwidth, 2-Channel, 16-Bit PXI Waveform Generator
785114-01
PXIe, 20 MHz Bandwidth, 2-Channel, 16-Bit PXI Waveform Generator - The PXIe-5413 is a 20 MHz arbitrary waveform generator capable of generating user-defined, arbitrary waveforms and standard functions including sine, square, triangle, and ramp. This arbitrary waveform generator can generate signals from -12 V to +12 V and uses a fractional resampling method to precisely generate waveforms. The PXIe-5413 also features advanced synchronization.
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Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2F-1
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Ethernet/LXI generatorNETBOX 16 Bit Arbitrary Waveform Generator - up to 40 MS/s on 8 Channels
DN2.653-08
The generatorNETBOX DN2.65x arbitrary waveform generators (AWG) is a general purpose multi-channel AWG with outstanding dynamic performance. The series includes LXI units with either four, eight or 16 synchronous channels. The large onboard memory can be segmented to replay different waveform sequences.
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Alternate 1.00 (28.00) - 2.00 (57.00) General Purpose Probe
P2663G-1R2S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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Active Probe, 2 GHz
N2796A
The N2796A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±12 V), the probe can be used in a wide variety of applications.
