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Test Pattern
Test signals for the calibration and alignment of TV broadcast and reception equipment.
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600MHz To 6GHz Radiation Measurement System
RMS-0660
The MegiQ Radiation Measurement System (RMS) is a compact test system that performs 3-axis radiation pattern measurement in non-anechoic spaces.
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SFP Based Fiber Optic Test Solution
Eye-BERT Micro
The Eye-BERT Micro is a low cost, easy to use, all-in-one SFP based fiber optic test solution offering high performance bit error rate testing at a fraction of the cost while providing a rich set of features not found in other bit error rate testers. Features include: variable bit rate, user programmable patterns, and optical power and temperature monitoring (per SFP capability). Additionally, with a click of a button, the Eye-BERT Micro will automatically test an SFP module based on the information it reads from the module and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Bit Error Rate Testing
BERT
An invaluable tool for manufacturing, development engineers, and field service engineers*Generate multi-speed, multi-application, and custom test patterns*Verify and validate lowest level connectivity down to 10-12*Support up to 32 ports of testing
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Cable Testers
Passage test:Detects open wires, short circuits and faulty wiring. Pass / fail test using a given pattern cable. Finding intermittent connections.Save cable data for documentation purposes. Print wiring diagrams. Printing labels. Log and print error logs.Graphical representation of the wiring of cables, graphical comparison of two cables. Easy, intuitive, graphical tracking of individual wires of a cable.Quickly install quick-mount boards for a variety of connector types such as BNC, RJ45, Sub-D, flat-ribbon connectors, and many more.Easy connection to the PC via USB .Light Director System:LED-led assembly of connectors. Optional also with voice output. High degree of safety due to fault checking during assembly.
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Boundary Scan
TurboBSD
TurboBSD is SynTest high-performance Boundary Scan Designer. It is 100% compliant to the IEEE 1149.1 Boundary Scan Standard. TurboBSD performs Boundary Scan logic synthesis, creates BSDL (Boundary Scan Description Language) file, and generates Boundary Scan test patterns
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Testability Analysis
TurboCheck
TurboScan is an advanced full-scan and partial-scan test suite. It includes a Scan Synthesizer and an Automatic Test Pattern Generator (ATPG). TurboScan automatically repairs testability violations to make your design highly testable.
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LTE Emulation for End-to-End QOS Validation
IxLoad-Wireless XAir2
Keysight Network Applications and Security
Ixia’s XAir2 load module provides LTE user equipment (UE) emulation that enables a powerful IxLoad eNodeB Layer 1 to 7 test solution. With complex UE modeling, it offers realistic and easily-configured traffic models and call patterns. Using IxLoad’s real-world subscriber modeling, testers do not need to be protocol experts to develop test realism. From a single tool, users can perform capacity tests, detail a cell throughput, measure voice and video quality, model a wide variety of mobility scenarios.
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Day Camera Testing
CI Systems' CCD test stations are used to carry out all the necessary tests to verify and compare the quality of a CCD based camera. These stations are based on CI Systems' reflective collimators, Visible Radiation Sources, special targets and integrated software, to project standard patterns with known geometry and intensity to the Unit Under Test. As a result, these stations are turnkey solutions for the CCD camera testing needs.
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Circbord
8022
VECTOR Electronics and Technology, Inc.
Single sided board, circuit pattern one side only, holes not plated thru.Ideal for common busses, signal line running longer distances, for hard wire of test circuits or discrete components. Tracks run close to board edges.
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12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector
CA9806-12
The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.
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Silicon Test & Yield Analysis Solutions
Tessent®
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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Digital IO
PA64IX
The PA64IX represents a new level of performance and capabilities for PXI-based digital instrumentation. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 1024 bi-directional pins (16 boards). The PA64IX also supports dee pattern memory by offering 32 M of on-board vector memory with static per pin direction control and with test rates up to 33 MHz.
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LCM Panel Tester
27013
Chroma 27013 is a portable tester that supports high resolution and large scale LCM with the signals, power supply and test patterns required for LCD module test.
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DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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HDMI / 3G Reference Media Player
VQS-300
Versatile destop/rackmount unit, loaded with unique sophisticated set of static and dynamic test patterns - see more details in separate VQL for VQS Presentation Multi-format HDMI and 3G-SDI outputs, digital and analog AV outputs 2.5 ppm accurate system clock to meet full 3G-SDI broadcast specs Front side bay for detachable SATA HDD – up to 2 TB of content VQL - Library of unique sophisticated dynamic test patterns and sequences LIve clips and 3D Video Tests, 5.1 Surround Sound and LR Stereo Audio Tests All commonly used resolutions, aspect ratios, frame rates and interlace modes Easy expansion with any external USB storage device: BD/DVD, HDD, FD.
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Vector Translation Platform
Solstice-TDS
New, casual, or advanced users can be productive right away with Solstice-TDS test engineering centric GUI. WaveMaker+ makes simple vector translation tasks simpler, and massive enterprise multi-group pattern conversion projects easy to coordinate and manage in a flow-based use model.
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Multi-format Video Generator
LT 4600A
The LT 4600A multi-format video generator is a compact, 1U half-rack size SDI video signal generator that supports the triple-rate SDI (3G-SDI/HD-SDI/SD-SDI) format. In addition to test pattern output including color bars and SDI check fields, the LT 4600A is equipped with numerous features such as ID characters, QVGA logo marks, safety area markers, audio embedding, genlock function for external reference input signals, and three analog black signal outputs.
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Micro Compression Tester
MCT Series
This is a strength evaluation tester for micro parts and micro particles generated in powder processing. It is capable of carrying out not only compression tests, but also loading and unloading tests, repeated tests, and various other load patterns, with excellent operability and functionality.
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Test Program Management
TP-M
TP-M utilizes TestInsight unique capability to read and analyze a whole test program from flow to every test pattern, timings, levels etc.
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Crocodile Clip Set
142-4
Large crocodile clips designed to hold fast while taking diagnostic measurements. This is the perfect complement to your testing arsenal - compatible with Electronic Specialties 142-1. These clips are CATIII 1000V safety rated and capable of measuring up to 10 amps. These are high quality clips and the Multi-Purpose tooth pattern provides plenty of holding power. These clips have a very wide jaw opening and are capable of clamping to your typical battery post. These are sold in a set of 2, one red and one black clip. Test with confidence.
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AMIDA 2020XP Tester
AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end
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VXI
VXI stands for VME eXtensions for Instrumentation. It is an open standard first developed by five leading Test and Measurement companies in 1987 to standardise a backplane capable of developing open, interchangeable instrument modules that could be used to build Automatic Test Equipment (ATE).Data Patterns designs and markets a wide range of VXI modules, some of which are listed below. Due to the use of the latest technologies, Data Patterns VXI modules offer the highest I/O density available in the industry today.Further enhancements of functional capabilities are achieved by the use of VXI IP carriers and VXI M Module carriers. This extends standard functions available from Data Patterns in these mezzanine architectures to the VXI platform.
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EIA Test Charts
EIA Test Charts by Applied Image - EIA Halftone Gray Scale Chart, EIA Video Resolution Pattern
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Memory Diagnostic Utility
MemTest86
MemTest86 is the original, free, stand alone memory testing software for x86 computers. MemTest86 boots from a USB flash drive or CD and tests the RAM in your computer for faults using a series of comprehensive algorithms and test patterns.
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Avionics Suite Tester
Based on order from the Navy, Data Patterns developed the complete Automated Test Equipment required for validating all the Line Replaceable Units (LRUs) utilized in the Seaking Helicopter. The upgrade was carried out at multiple Naval bases in India.
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Video Generator-Analyzer
VQTS-200
VQTS-200 is a self-contained solution, combining: 3G-SDI/HDMI/DVI player/recorder - based on AJA Kona LHi card Built-in RAID storage - uncompressed YUV signals in and out, up to 1080p60 Visual, instrumental and automated tests using VQL Test Patterns Library Sophisticated image quality VQMA3 software analyzer - complete quality report in 2 seconds Ideal tool for development labs, software developers and high volume manufacturers Easy-to-use tool, instantly revealing your video camera, codec, scaler, converter or other video device performance User-selectable reporting modes: machine-readable file with Pass/Fail marks detailed multi-page PDF document
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Antenna Measurement Software
Raymond RF's Antenna Measurement Software performs 2-D (polar/rectangular) and 3-D (spherical) antenna pattern measurements for passive antennas and active wireless mobile stations (cell phones). Insertion loss of passive devices is included as part of the calibration component. Data management and reporting of antenna properties such as half power beam-width, directivity, gain, radiation efficiency, total radiated power, and total isotropic sensitivity. AMS performs and reports all measurements required by the CTIA Over-the-Air Performance Test Plan.
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Dynamic Digital I/O (3U), 16 Ch., Per Pin Control, Up To 200 MHz W/256MB Memory & LVDS
GX5293
The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 digital input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.Dynamic Digital I/O (3U), 16 ch., per Pin Control, up to 200 MHz w/256MB Memory & LVDS
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Brahmos Checkout
Data Patterns designed and built the BrahMos Missile Checkout Equipment based on the requirements and support of DRDO and BrahMos. This unit validates the complete performance of the Missile through interfacing with it's umbilical and maintenance connections. The shelter mounted checkout equipment is utilized to test the articles on the field during it's life cycle, thus ensuring readiness for launch on demand.
