Current Transformer Test
measures insulation, excitation current, turns ratio, winding polarity saturation and/or winding resistance. Current Transformers
See Also: Transformer Test, Transformer Testers, Current Transformer Test Set
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sbRIO-9265, Non-Enclosed, 4-Channel C Series Current Output Module
780921-01
Non-Enclosed, 4-Channel C Series Current Output Module - The sbRIO‑9265 is ideal for interfacing and controlling industrial current-driven actuators at high rates. The module has built-in open-loop detection, which generates an interrupt in software when an open loop is detected as well as zeroing outputs to ensure safety and avoid driving actuators at system power on. The sbRIO‑9265 requires an external power supply and includes a channel‑to‑earth ground double isolation barrier for safety and noise immunity. Non-enclosed modules are designed for OEM applications.
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High-Voltage Differential Probe, 70 MHz
N2891A
Use the N2891A 70-MHz high-voltage differential probe to make safe and accurate floating measurements with an oscilloscope. The N2891A differential probe allows conventional earth-grounded Keysight oscilloscopes to be used for floating signal measurements of up to ±7000 V of differential and common mode voltage.
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CC0550X, 50 MHz, 5 Arms Current Oscilloscope Probe
786846-01
The CC0550X, or Hioki CT6700, is a clamp-on current probe that offers a wide DC to 50 MHz bandwidth and 5 Arms of continuous input. It is ideal for capturing transient current signals from switching power supplies, inverters, and motor … controllers. The probe requires an external power supply.
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C Series Current Input Module
The C Series Current Input Module features programmable input ranges, variable connectivity options, and built-in noise rejection. You can also choose from options with built-in anti-aliasing filters or high-channel density to reduce the number of modules needed. The C Series Current Input Module supports safety features, certifications, input ranges, overvoltage ranges, and connectivity for applications such as power quality monitoring and metering, utility pole-mounted smart switches, utility pole-mounted smart grid reclosers, substation merging units, industrial machine measurements, health monitoring, predictive maintenance and prognostics, and phasor measurement units (PMUs). The C Series Current Input Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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NI-9247, 50 kS/s/ch, 50 Arms, 147 Apk, 24-Bit, 3-Channel C Series Current Input Module
783589-01
50 kS/s/ch, 50 Arms, 147 Apk, 24-Bit, 3-Channel C Series Current Input Module - The NI‑9247 is designed to support direct ring lug connectivity to the three-phase high-current measurements of 1 A and 5 A current transformers (CTs). It is optimized for power, energy, and industrial applications. The safety features, certifications, input ranges, overvoltage ranges, and connectivity are well suited for applications such as power quality monitoring and metering, utility pole-mounted smart switches, utility pole-mounted smart grid reclosers, substation merging units, industrial machine measurements, health monitoring, predictive maintenance and prognostics, and phasor measurement units (PMUs).
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Build-to-Print for Test Systems
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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sbRIO-9208, Non-Enclosed, 500 S/s, ±20 mA, 16-Channel C Series Current Input Module
780979-01
Non-Enclosed, 500 S/s, ±20 mA, 16-Channel C Series Current Input Module - The sbRIO‑9208 is designed with industrial systems in mind. It includes a high-resolution mode with 50/60 Hz rejection to remove low frequency noise. It has high-channel density to reduce the number of modules needed, which leaves slots open for other measurement types or for reducing the overall per channel cost of the system. The sbRIO‑9208 uses a standard D‑SUB connection for use with cables and connector blocks. Non-enclosed modules are designed for OEM applications.
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Test System for Detecting Exact PCB Short Circuit Locations
QT25
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Active Alignment Assembly & Test Platform
Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Brute High Current Probe
P4301-2R
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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CC05120X, 120 MHz, 5 Arms Current Oscilloscope Probe
786847-01
The CC05120X, or Hioki CT6701, is a clamp-on current probe that offers a wide DC to 120 MHz bandwidth and 5 Arms of continuous input. It is ideal for capturing transient current signals from switching power supplies, inverters, and motor controllers. The probe requires an external power supply.
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Test Fixture (SMD Components)
16034E
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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sbRIO-9253, Non-Enclosed, 50 kS/s/ch, 24-Bit, 8-Channel C Series Current Input Module
787433-01
Non-Enclosed, 50 kS/s/ch, 24-Bit, 8-Channel C Series Current Input Module - The sbRIO-9253 is an 8-channel analog input module for CompactRIO Single-Board Controller that provides a ±20 mA input range and 24 bits of resolution at a 50 kS/s sample rate. This module includes diagnostic functionalities to ensure nominal system operations with open-channel detection, power supply detection, and configurable thresholds. You can view the status of each channel and the power supply with eight LEDs. The sbRIO-9253 also features programmable hardware filters for your applications, such as specific Butterworth and comb filters that you can use to reduce the noise in your system.
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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NI HIL and Real-Time Test Software Suite
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Test Workflow Standard
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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NI-9266, 8-Channel C Series Current Output Module
785047-01
8-Channel C Series Current Output Module - The NI‑9266 is ideal for interfacing and controlling industrial current-driven actuators. The module has built-in open-loop detection, which generates an interrupt in software when an open loop is detected as well as zeroing outputs to ensure safety and avoid driving actuators at system power on. The NI‑9266 includes channel‑to‑earth ground isolation for safety and noise immunity.
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Physical Layer Test System
N19301B
The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Headlamp Test Platform
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
